Updated on 2025/04/24

写真a

 
Itaru Kamiya
 
Organization
Graduate School of Engineering Department of Advanced Science and Technology Materials Science and Engineering Quantum Interface Laboratory Professor   
Degree
Doctor of Engineering ( 1989.10   The University of Tokyo )
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Contact information
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Research Areas

  • Nanotechnology/Materials / Crystal engineering

  • Nanotechnology/Materials / Thin film/surface and interfacial physical properties

  • Natural Science / Semiconductors, optical properties of condensed matter and atomic physics  / Solar Cells

  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electric and electronic materials

  • Nanotechnology/Materials / Nanostructural physics

  • Nanotechnology/Materials / Nanometer-scale chemistry

  • Nanotechnology/Materials / Nanomaterials

  • Nanotechnology/Materials / Nanobioscience

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Main research papers

  • Surface Science at Atmospheric Pressure - Reconstruction on (001) GaAs in Organometallic Chemical Vapor Deposition

    I. Kamiya, D. E. Aspnes, H. Tanaka, L. T. Florez, J. P. Harbison, and R. Bhat,

    Phys. Rev. Lett.   68 ( 5 )   627 - 630   1992.2.3

    Reflectance Difference Spectroscopy of (001) GaAs Surfaces in Ultrahigh Vacuum

    I. Kamiya, D. E. Aspnes, L. T. Florez, and J. P. Harbison,

    Phys. Rev. B   46 ( 24 )   15894 - 15904   1992.6.19

    Temperature dependence of electronic energy transfer in PbS quantum dot films

    Wei Lü, Itaru Kamiya, Masao Ichida, Hiroaki Ando,

    Appl. Phys. Lett.   95 ( 8 )   083102   2009.8.24

    Upconversion of infrared photons to visible luminescence using InAs based quantum structures

    David M. Tex and Itaru Kamiya

    Phys. Rev. B   83 ( 8 )   081309   2011.2.17

    Strain engineering of quantum dots for long wavelength emission: Photoluminescence from self-assembled InAs quantum dots grown on GaAs(001) at wavelengths over 1.55 mm

    Kenichi Shimomura and Itaru Kamiya,

    Appl. Phys. Lett.   106 ( 8 )   082103   2015.2.23

Research History

  • Nanzan University   Adjunct Lecturer

    2017.4

  • Aichi University   Adjunct Lecturer

    2017.4

  • Tokyo Institute of Technology   Graduate School   Adjunct Lecturer

    2010.4

  • Toyota Technological Institute   Professor

    2004.10

  • Tokyo University of Agriculture and Technology   Graduate School of Engineering   Adjunct Professor

    2001.4 - 2004.9

  • RIKEN   Frontier Research System   Adjunct Scientist

    2000.4 - 2007.9

  • Mitsubishi Chemical Corporation   Snr. Res. Scientist, General Manager

    1999.1 - 2004.9

  • The University of Tokyo   RCAST   Research Fellow

    1995.4 - 2001.3

  • JST Quantum Transition Project   Research Fellow

    1995.4 - 1998.12

  • JRDC/Imperial College   Research Fellow

    1992.9 - 1995.3

  • Univ. Illinois Urbana-Champaign - Bellcore   Dept. of Physics   Research Physicist

    1990.9 - 1992.9

  • RIKEN   Research Scientist

    1989.10 - 1990.8

  • AT&T Bell Laboratories   Resident Visitor

    1987.1 - 1987.5

  • (併任)

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Education

  • The University of Tokyo   Graduate School of Engineering   Applied Physics

    1984.4 - 1989.9

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    Country: Japan

  • The University of Tokyo

    1984.4 - 1986.3

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    Country: Japan

  • The University of Tokyo   School of Engineering   Department of Applied Physics

    1979.4 - 1984.3

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    Country: Japan

Professional Memberships

  • 日本物理学会

  • 応用物理学会

  • アメリカ物理学会

  • The Physical Society of Japan

  • Japan Society of Applied Physics

  • American Physical Society

  • Materials Research Society

  • American Vacuum Society

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Committee Memberships

  • International Conference on Molecular Beam Epitaxy   Program Committee  

    2024.1 - 2025.3   

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    Committee type:Academic society

  • AsiaNANO   プログラム委員会委員  

    2010.4 - 2010.11   

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    Committee type:Academic society

  • 文部科学省科学技術政策研究所   科学技術動向研究センター専門調査員  

    2005.2   

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    Committee type:Government

  • 化学工学会   バイオナノテクノロジー委員  

    2004 - 2005.3   

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    Committee type:Academic society

    化学工学会

  • The Society of Chemical Engineers, Japan   Bionanotechnology Committee  

    2004   

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    Committee type:Academic society

    The Society of Chemical Engineers, Japan

  • International Union for Vacuum Science, Technique, and Applications, International Summer School   Program Committee  

    2003 - 2005   

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    Committee type:Academic society

  • Japan-America Frontiers of Engineering Symposium   Organizing Committee  

    2002.7 - 2002.12   

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    Committee type:Academic society

  • 日本経団連産業技術委員会   重点化戦略部会ナノテクノロジーWG  

    2001.10 - 2002.8   

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    Committee type:Other

  • 応用物理学会   JJAPI編集委員  

    1999.4 - 2001.6   

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    Committee type:Academic society

    応用物理学会

  • Japan Society of Applied Physics   Editor, JJAPI  

    1999 - 2001   

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    Committee type:Academic society

    Japan Society of Applied Physics

  • International Summer School, Institute of Physics, Czech Republic   International Advisory Committee  

    1995   

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    Committee type:Academic society

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Research theme

  • Exploration of oxide light emitter

    神谷 格, 岩田 直高

    2020

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    An attempt to realize short wavelength emission from oxide thin films.

    Outcome:

    2023
    Organizing the lab/equipment for improving the films.

    2022
    Short wavelength light emission from oxide films indicated.

  • Identification of the genration mechanisms of long wavelegnth-emitting defects in GaAs and their control

    神谷 格

    2017

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    Outcome:

    2023
    While the fundamental investigation has been concluded by FY 2022, the knowledge accumulated is being applied for controlling defects particularly in growth of lattice mismatched materials.

    2022
    Exploration of novel devices are begin performed based on the information about defects in GaAs we have elucidated.

  • Passivation-capping of III-V semiconductor quantum structures by oxides

    神谷 格, Ronel Christian Intal ROCA, 岩田 直高

    2017

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    Outcome:

    2023
    By comparing passivation capping by ZnO and AlOx, it was found that the crytallinity of the formed film and the self-cleaning process of the precursors play an important role in determining the properties of the surface quantum dots.

    2022
    By passivating surface InAs quantum dots, enhanced PL intensity with reduced wavelength peak was obtained.

  • Preparation of functional thin films and their properties

    神谷 格

    2017

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    Outcome:

    2023
    Strain-free passivation capping of surface quantum dots by ALD metal oxide thin films was successfully demonstrated, and its device applications are under investigation.

    2022
    Atomic layer deposition (ALD) of metal oxide thin films are being investigated.

  • Epitaxial crystal growth and its mechanisms

    神谷 格, Ronel Christian Intal ROCA

    2017

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    Outcome:

    2023
    Controlled growth of 2D and 3D quantum structures by SML stack growth has been successfully demonstrated, and its device applications are under investigation.

    2022
    The transition of 2D-3D in submonolayer (SML) stack growth has been studied and the critical conditions were identified and the mechanisms were studied.

  • Fundamental studies of semiconductor interfaces

    神谷 格, Ronel Christian Intal ROCA

    2017

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    Outcome:

    2023
    By comparing different precursor materials, the basic guidelines for passivating InAs surface quantum dots were proposed.

    2022
    The recipes and the mechanisms of passivating InAs surface quantum dots were studied.

  • Photon upconversion using InAs quantum structures

    神谷 格, Ronel Christian Intal ROCA

    2017

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    Outcome:

    2023
    Shown that quantum discs can be prepared by using SML stacking.

    2022
    Preparation of quantum discs that are considered to be a strong candidate for photon upconversion is being investigated.

  • Development of InGaAs-based quantum structures by SML growth

    神谷 格, Ronel Christian Intal ROCA

    2017

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    MBE growth of InGaAs quantum structures using submonolayer (SML) stacking is studied thereby precisely controlling the structure and electronic properties of the quantum structures.
    Further, the potential of applying such structures to spintronics is investigated.

    Outcome:

    2023
    Control of spin was shown by illuminating these 2D and 3D structures by circular polarized excitation light.

    2022
    The transition of 2D-3D in submonolayer growth has been studied and the critical conditions were identified and the mechanisms were studied.

  • Preparation and properties of solar cells

    神谷 格

    2017 - 2021

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    Outcome:

    2022
    No progress.

  • Si-metal interface studies for solar cell applications

    神谷 格

    2017 - 2021

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    Outcome:

    2022
    No progress.

  • Colloidal crystal growth and its mechanisms

    神谷 格

    2017 - 2021

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    Outcome:

    2022
    No progress.

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Papers

  • Passivation capping of InAs surface quantum dots by TMA/Al2O3: PL enhancement and blueshift suppression Reviewed

    Hanif Mohammadi, Ronel Christin Intal ROKA, Yuwei Zhang, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata, Itaru Kamiya

    Journal of Applied Physics   133   185303 - 185303   2023.5

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    Authorship:Last author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:Americal Institute of Physics  

    DOI: doi.org/10.1063/5.0140035

  • Atomic layer deposition of diethylzinc/zinc oxide on InAs surface quantum dots: Self-clean-up and passivation processes Reviewed

    Hanif Mohammadi*, Ronel Christian Intal ROCA, Yuwei Zhang*, Hyunju Lee*, Yoshio Ohshita, Naotaka Iwata, Itaru Kamiya

    Applied Surface Science   612   155790   2022.11

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    Authorship:Last author   Publishing type:Research paper (scientific journal)   Publisher:Elsevier  

  • Direct observation of strain in InAs quantum dots and cap layer during molecular beam epitaxial growth using in situ X-ray diffraction Reviewed

    Kenichi Shimomura, Hidetoshi Suzuki, Takuo Sasaki, Masamitu Takahasi, Yoshio Ohshita, Itaru Kamiya

    JOURNAL OF APPLIED PHYSICS   118 ( 18 )   185303   2015.11 (   ISSN:0021-8979   eISSN:1089-7550 )

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    Authorship:Last author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER INST PHYSICS  

    Direct measurements on the growth of InAs quantum dots (QDs) and various cap layers during molecular beam epitaxy are performed by in situ X-ray diffraction (XRD). The evolution of strain induced both in the QDs and cap layers during capping is discussed based on the XRD intensity transients obtained at various lattice constants. Transients with different features are observed from those obtained during InGaAs and GaAs capping. The difference observed is attributed to In-Ga intermixing between the QDs and the cap layer under limited supply of In. Photoluminescence (PL) wavelength can be tuned by controlling the intermixing, which affects both the strain induced in the QDs and the barrier heights. The PL wavelength also varies with the cap layer thickness. A large redshift occurs by reducing the cap thickness. The in situ XRD observation reveals that this is a result of reduced strain. We demonstrate how such information about strain can be applied for designing and preparing novel device structures. (C) 2015 AIP Publishing LLC.

    DOI: 10.1063/1.4935456

  • Femtosecond upconverted photocurrent spectroscopy of InAs quantum nanostructures Reviewed

    Yasuhiro Yamada, David M. Tex, Itaru Kamiya, Yoshihiko Kanemitsu

    APPLIED PHYSICS LETTERS   107 ( 1 )   2015.7 (   ISSN:0003-6951   eISSN:1077-3118 )

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER INST PHYSICS  

    The carrier upconversion dynamics in InAs quantum nanostructures are studied for intermediate-band solar-cell applications via ultrafast photoluminescence and photocurrent (PC) spectroscopy based on femtosecond excitation correlation (FEC) techniques. Strong upconverted PC-FEC signals are observed under resonant excitation of quantum well islands (QWIs), which are a few monolayer-thick InAs quantum nanostructures. The PC-FEC signal typically decays within a few hundred picoseconds at room temperature, which corresponds to the carrier lifetime in QWIs. The photoexcited electron and hole lifetimes in InAs QWIs are evaluated as functions of temperature and laser fluence. Our results provide solid evidence for electron-hole-hole Auger process, dominating the carrier upconversion in InAs QWIs at room temperature. (C) 2015 AIP Publishing LLC.

    DOI: 10.1063/1.4926569

  • Strain engineering of quantum dots for long wavelength emission: Photoluminescence from self-assembled InAs quantum dots grown on GaAs(001) at wavelengths over 1.55 mu m Reviewed

    K. Shimomura, I. Kamiya

    APPLIED PHYSICS LETTERS   106 ( 8 )   2015.2 (   ISSN:0003-6951   eISSN:1077-3118 )

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    Authorship:Last author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER INST PHYSICS  

    Photoluminescence (PL) at wavelengths over 1.55 mu m from self-assembled InAs quantum dots (QDs) grown on GaAs(001) is observed at room temperature (RT) and 4K using a bilayer structure with thin cap. The PL peak has been known to redshift with decreasing cap layer thickness, although accompanying intensity decrease and peak broadening. With our strain-controlled bilayer structure, the PL intensity can be comparable to the ordinary QDs while realizing peak emission wavelength of 1.61 mu m at 4K and 1.73 mu m at RT. The key issue lies in the control of strain not only in the QDs but also in the cap layer. By combining with underlying seed QD layer, we realize strain-driven bandgap engineering through control of strain in the QD and cap layers. (C) 2015 AIP Publishing LLC.

    DOI: 10.1063/1.4913443

  • Microscopic photoluminescence and photocurrent imaging spectroscopy of InAs nanostructures: Identification of photocarrier generation sites for intermediate-band solar cells Reviewed

    David M. Tex, Toshiyuki Ihara, Itaru Kamiya, Yoshihiko Kanemitsu

    PHYSICAL REVIEW B   89 ( 12 )   2014.3 (   ISSN:1098-0121   eISSN:1550-235X )

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER PHYSICAL SOC  

    We performed microscopic imaging of photoluminescence (PL) and photocurrent (PC) on InAs nanostructures including disklike structures (nanodisks) and quantum dots (QDs). The correlation between PL and PC images indicates that the major fraction of upconverted carriers originates from nanodisks. By analyzing the excitation spectra, we find evidence that nanodisks and QDs need to be spatially separated to enhance PC generation via upconversion. The efficient simultaneous use of both QDs and nanodisks is an alternative approach to intermediate-band solar cells, where low-energy photons are upconverted in the QDs and high-energy photons are efficiently upconverted in the nanodisks, resulting in enhanced carrier generation yields. With spatially resolved upconverted PL, we show that PC generation in nanodisks is due to ejection of both electrons and holes.

    DOI: 10.1103/PhysRevB.89.125301

  • Control of hot-carrier relaxation for realizing ideal quantum-dot intermediate-band solar cells Reviewed

    David M. Tex, Itaru Kamiya, Yoshihiko Kanemitsu

    SCIENTIFIC REPORTS   4   2014.2 (   ISSN:2045-2322 )

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:NATURE PUBLISHING GROUP  

    For intermediate-band solar cells, the broad absorption spectrum of quantum dots (QDs) offers a favorable conversion efficiency, and photocurrent generation via efficient two-step two-photon-absorption (TS-TPA) in QDs is essential for realizing high-performance solar cells. In the last decade, many works were dedicated to improve the TS-TPA efficiency by modifying the QD itself, however, the obtained results are far from the requirements for practical applications. To reveal the mechanisms behind the low TS-TPA efficiency in QDs, we report here on two- and three-beam photocurrent measurements of InAs quantum structures embedded in AlGaAs. Comparison of two-and three-beam photocurrent spectra obtained by subbandgap excitation reveals that the QD TS-TPA efficiency is improved significantly by suppressing the relaxation of hot TS-TPA carriers to unoccupied shallow InAs quantum structure states.

    DOI: 10.1038/srep04125

  • Identification of trap states for two-step two-photon-absorption processes in InAs quantum structures for intermediate-band solar cells Reviewed

    David M. Tex, Itaru Kamiya, Yoshihiko Kanemitsu

    2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC)   3618 - 3621   2014

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:IEEE  

    Intermediate bands bear trap and recombination centers for carriers generated in other energy levels. Assessment of recombination centers is important for achieving efficient carrier generation. We measure the photocurrent (PC) originating from InAs quantum structures embedded in an undoped (Al)GaAs matrix due to excitation with multiple tunable beams. With an infrared light excitation the influence of trapping or recombination on the quantum dot PC generation efficiency via two-step two-photon-absorption processes is evaluated.

    DOI: 10.1109/PVSC.2014.6924889

  • Efficient upconverted photocurrent through an Auger process in disklike InAs quantum structures for intermediate-band solar cells Reviewed

    David M. Tex, Itaru Kamiya, Yoshihiko Kanemitsu

    PHYSICAL REVIEW B   87 ( 24 )   2013.6 (   ISSN:1098-0121 )

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER PHYSICAL SOC  

    The mechanisms of upconverted photocurrent in InAs quantum structures embedded in AlxGa1-x As were studied with simultaneous measurements of photoluminescence and photocurrent spectra. Efficient upconversion was verified in samples with and without quantum dots. The dominant upconversion process from low temperatures to room temperature was found to occur through an Auger process in disklike InAs quantum structures. The results suggest the importance of shallow energy levels, which enable upconversion and efficient carrier extraction through multiparticle interactions. The disklike structure was concluded to be a suitable intermediate-band structure in terms of the energy conversion efficiency.

    DOI: 10.1103/PhysRevB.87.245305

  • Electronically cross-linked PbS quantum dot networks using polymers as surface ligands Reviewed International coauthorship

    Wei Lü, Yue Yang, Akira Yamakata, Itaru Kamiya

    Nano   8 ( 2 )   2013.4 (   ISSN:1793-2920 )

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    Bilayer structures of colloidal PbS quantum dots (QDs) with different sizes are fabricated by two methods: chemical bond anchoring and electrostatic adsorption. Unlike the sample prepared by chemical bond anchoring, we find that the electronic connection between different layers is suppressed in the samples prepared by electrostatic adsorption with charged polyelectrolytes. To clarify the electronic coupling between the QDs and the polyelectrolytes, QDs directly stabilized by charged polyelectrolytes were synthesized. Transmission electron microscopy investigation shows that cross-linked QD networks are formed. Time-resolved photoluminescence measurements indicate that the carrier lifetimes of QDs in networks were greatly reduced. The photoluminescence peak energy increases with a third root of the excitation power. All these observations can be consistently explained considering spatially separated photoexcited carriers in a type-II band alignment. The abnormal behaviors of electrostatic adsorption sample are discussed based on these results. © 2013 World Scientific Publishing Company.

    DOI: 10.1142/S1793292013500136

  • Shallow defect states in GaAs responsible for GaAs bandgap upconversion induced by electron beam during MBE growth Reviewed

    David M. Tex, Itaru Kamiya

    Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics   30 ( 2 )   2012 (   ISSN:2166-2754 )

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    Authorship:Last author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AVS Science and Technology Society  

    Upconversion through excitation of bulk GaAs is investigated by change in crystal growth conditions with electron beam (e-beam). The upconverted photoluminescence intensity is enhanced several times by striking the source fluxes with e-beam during molecular beam epitaxy (MBE) growth. Experimental evidence for a shallow intermediate state being responsible for this upconversion is presented. It is suggested that the intermediate state may be formed by shallow exciton trap states induced by As anti-site defects, which can be increased with e-beam during MBE growth. © 2012 American Vacuum Society.

    DOI: 10.1116/1.3679547

  • Upconversion of infrared photons to visible luminescence using InAs-based quantum structures Reviewed

    David M. Tex, Itaru Kamiya

    PHYSICAL REVIEW B   83 ( 8 )   2011.2 (   ISSN:1098-0121 )

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    We report on the upconversion of infrared photons to visible using a quantum structure based on an InAs wetting layer (WL) embedded in AlGaAs grown by molecular beam epitaxy. The grown structures are characterized by photoluminescence, and it is found that the upconversion center is a real intermediate state induced by the WL. The temperature dependence suggests that the intermediate state is of an exciton nature, which is supported by the result of an eight-band k . p calculation.

    DOI: 10.1103/PhysRevB.83.081309

  • Self-assembled colloidal PbS quantum dots on GaAs substrates Reviewed

    Wei Lü, Fumihiko Yamada, Itaru Kamiya

    Journal of Physics: Conference Series   244   2010.1 (   ISSN:1742-6588 )

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    Authorship:Last author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:IOP PUBLISHING LTD  

    We report the fabrication and analysis of self-assembled monolayer and bilayer films of colloidal PbS quantum dots (QDs) on GaAs (001) substrates. 1,6-hexanedithiol is used as link molecule between QDs and GaAs substrates. Atomic force microscopy (AFM) and photoluminescence (PL) measurements confirm the formation of PbS QD film on GaAs. For the monolayer PbS QD film, the temperature-dependent PL shows a feature typical of close-packed film. For the bilayer PbS QD film fabricated from two different mean-sized PbS QDs, we find that the stacking sequence of QDs with different size affects the quantum yield and emission wavelength of the film. © 2010 IOP Publishing Ltd.

    DOI: 10.1088/1742-6596/245/1/012069

  • Temperature dependence of electronic energy transfer in PbS quantum dot films Reviewed

    Wei Lue, Itaru Kamiya, Masao Ichida, Hiroaki Ando

    APPLIED PHYSICS LETTERS   95 ( 8 )   083102   2009.8 (   ISSN:0003-6951 )

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AMER INST PHYSICS  

    Colloidal PbS quantum dots dispersed as close-packed film and in polystyrene (PS) matrix are prepared and photoluminescence (PL) spectra are measured in the temperature range of 5-300 K. The integrated PL intensity of the close-packed film increases as the temperature is raised from 5 to 120 K, and then decreases to 300 K, while that of the PS film decreases monotonously. This abnormal behavior of the close-packed film can be explained by a thermally activated electronic energy transfer model, which is supported by time resolved PL measurements.

    DOI: 10.1063/1.3213349

  • Density and size control of self-assembled InAs quantum dots: Preparation of very low-density dots by post-annealing Reviewed

    I. Kamiya, Ichiro Tanaka, O. Ohtsuki, H. Sakaki

    Physica E: Low-Dimensional Systems and Nanostructures   13 ( 2-4 )   1172 - 1175   2002 (   ISSN:1386-9477 )

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)  

    A systematic study has been performed on the morphology of self-assembled InAs quantum dots (QDs) grown by molecular beam epitaxy on (0 0 1) GaAs surfaces using atomic force microscopy while varying the growth conditions. It is shown that the size and density of these QDs can be controlled by the precise adjustment of growth temperatures and the amount of deposited InAs and also by post-growth annealing. One can now form QDs that are between 20 and 60 nm in diameter and between low 108 and mid 1011 cm-2 in density. Very low-density QDs prepared by post-annealing are particularly suitable for single QD studies. © 2002 Elsevier Science B.V. All rights reserved.

    DOI: 10.1016/S1386-9477(02)00329-6

  • Observation of CdSe colloidal nano-dot films by scanning probe microscopy Reviewed

    Ichiro Tanaka, Eri Kawasaki, O. Ohtsuki, S. Saita, I. Kamiya

    Materials Research Society Symposium - Proceedings   642   2001.12 (   ISSN:0272-9172 )

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    We observed the surface topography of CdSe colloidal nano-dot film by cyclic contact mode atomic force microscopy. The observed structure changes with cantilever oscillation amplitude, and non-uniform images with long-range corrugations are obtained with relatively large oscillation amplitude while fine structures are revealed with smaller oscillation amplitude. When the amplitude is larger and the surface is weakly 'tapped', the topography of the soft organic matrix of the film dominates, and when the tapping force is increased, the hard CdSe dots begin to reveal.

  • Control of size and density of self-assembled InAs dots on (0 0 1)GaAs and the dot size dependent capping process Reviewed

    I. Kamiya, Ichiro Tanaka, H. Sakaki

    Journal of Crystal Growth   201   1146 - 1149   1999 (   ISSN:0022-0248 )

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    Authorship:Lead author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:Elsevier Science B.V.  

    Control on size and density of self-assembled InAs quantum dots (QDs) grown by molecular beam epitaxy on (0 0 1)GaAs has been performed. By properly adjusting the substrate temperature and the amount of InAs deposition, it is possible to prepare QDs that are approximately 15 nm- approximately 50 nm in diameter, and low 108 to mid 1011/cm2 in density. Giant QDs that are typically 50-100 nm in diameter are also formed upon excess InAs deposition, and can act as nanoelectrodes. The capping process of these various QDs by GaAs is size dependent, and with a 5 nm thick cap, the previously reported volcano-like structure are seen only when the giant QDs are present.

    DOI: 10.1016/S0022-0248(99)00005-6

  • Optical characterization of surfaces during epitaxial growth using RDS and GIXS Invited Reviewed International coauthorship

    I. Kamiya, L. Mantese, D. E. Aspnes, D. W. Kisker, P. H. Fuoss, G. B. Stephenson, S. Brennan

    Journal of Crystal Growth   163 ( 1-2 )   67 - 77   1996 (   ISSN:0022-0248 )

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:Elsevier  

    Structures of (001)GaAs surfaces during organometallic vapor phase epitaxy (OMVPE) have been studied by simultaneous measurements using reflectance difference spectroscopy (RDS) and grazing incidence X-ray scattering (GIXS). The data obtained by the two techniques are strongly correlated. We find that RDS, although not a diffraction probe, can distinguish most surface reconstructions of (001)GaAs. The information obtained by these two probes is complementary, so by combining RDS and GIXS data obtained from surfaces under static and dynamic conditions we can gain detailed information about atomic arrangements and growth mechanisms. Under static conditions, we find that RD spectra under OMVPE conditions are similar to those previously observed in ultrahigh vacuum (UHV). By simultaneously monitoring the surface reconstructions using GIXS and RDS, we have established that RDS accurately reflects the local structural configurations but is not uniquely sensitive to changes in long range order or subtle differences in symmetry. Growth oscillations were also measured simultaneously by RDS and GIXS under various conditions. The observed oscillation periods agree with each other, but the details are condition dependent, thus providing important clues concerning the surface processes involved. For example, the one-to-one correlation observed between RDS and GIXS oscillations suggests that the RDS oscillations are related to island formation.

    DOI: 10.1016/0022-0248(95)01051-3

  • COMPARISON OF REFLECTANCE DIFFERENCE SPECTROSCOPY AND SURFACE PHOTOABSORPTION USED FOR THE INVESTIGATION OF ANISOTROPIC SURFACES Reviewed International coauthorship

    K HINGERL, DE ASPNES, KAMIYA, I

    SURFACE SCIENCE   287   686 - 692   1993.5 (   ISSN:0039-6028 )

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    Authorship:Last author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:ELSEVIER SCIENCE BV  

    Reflectance difference spectroscopy (RDS) and surface photoabsorption (SPA) are two optical characterization techniques that are now in common use for monitoring and controlling epitaxial growth. Here we establish the connection of SPA data to the surface dielectric response, using an anisotropic three phase model (substrate, anisotropic overlayer, ambient). In contrast to the generally accepted picture, our calculations show, that the contribution to the SPA signal from the dielectric component normal to the surface is negligible, and that the major contribution arises from the projection of the dielectric tensor on the line formed by the intersection of the surface and the plane of incidence. It follows, that the difference between SPA data taken with the plane of incidence along the different principal axis is related to, and in fact can be calculated from, RDS spectra. By comparing published data to our database of RD spectra, we are able to find the surface reconstruction present during flow modulated organo metallic chemical vapour epitaxial growth of GaAs epilayers.

    DOI: 10.1016/0039-6028(93)91054-S

  • Arsenic dimers and multilayers on (001)GaAs surfaces in atmospheric pressure organometallic chemical vapor deposition Reviewed International coauthorship

    Itaru Kamiya, H. Tanaka, D. E. Aspnes, L. T. Florez, E. Colas, J. P. Harbison, R. Bhat

    Applied Physics Letters   60   1238 - 1240   1992.12 (   ISSN:0003-6951 )

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    Arsenic dimers and multilayers are shown to exist on (001)GaAs surfaces under atmospheric pressure (AP) organometallic chemical vapor deposition (OMCVD) conditions. We obtained reflectance-difference spectra from surfaces in AP H2that are equivalent to those obtained from the (2×4) and disordered-c(4×4) reconstructions prepared in ultrahigh vacuum by molecular beam epitaxy. Implications for models of OMCVD growth.

    DOI: 10.1063/1.107417

  • Reflectance Difference Specroscopy of (001) GaAs Surfaces in Ultrahigh Vacuum Reviewed

    Itaru Kamiya, Itaru Kamiya, D. E. Aspnes, L. T. Florez, J. P. Harbison

    Physical Review B   46 ( 24 )   15894 - 15904   1992.1 (   ISSN:0163-1829 )

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    Reflectance-difference spectroscopy (RDS) is employed to study in situ the (4×2), (1×6), (4×6), (3×1), (2×4)-, (2×4)-, (2×4)-, c(4×4), and d(4×4) reconstructions of (001) GaAs surfaces prepared in ultrahigh vacuum (UHV) by molecular-beam epitaxy and simultaneously characterized by reflection high-energy electron diffraction (RHEED). Reproducibility of the data is excellent. With the aid of previous theoretical calculations, we interpret characteristic spectral features at 1.9, 2.6, and 4.2 eV in terms of electronic excitations involving surface dimers of Ga, As, and As, respectively. Because RD couples to local electronic structure rather than to long-range order, RD spectra not only determine surface reconstructions but also provide details not accessible by RHEED, such as the existence of As dimers in the (1×6), (4×6), and (3×1) reconstructions and of the fractional coverage within a given reconstruction. Our data show that the (3×1), (1×6), and (4×6) reconstructions are at least partly determined by kinetics, since they can only be obtained by following specific heating or cooling procedures under very low As4 flux. More generally, it is possible to employ this optical technique to determine surface atomic and electronic structure. Because RD spectra can be obtained with the surface in any transparent ambient, the database that we have established here provides a new approach for elucidating surface reconstructions of (001) GaAs and hence the dynamics of surface reactions in non-UHV environments. © 1992 The American Physical Society.

    DOI: 10.1103/PhysRevB.46.15894

  • Real time in situ observation of (001)GaAs in OMCVD by reflectance difference spectroscopy Reviewed International coauthorship

    Itaru Kamiya, D. E. Aspnes, H. Tanaka, L. T. Florez, E. Colas, J. P. Harbison, R. Bhat

    Applied Surface Science   60-61 ( C )   534 - 543   1992 (   ISSN:0169-4332 )

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    We report the first direct observation of reconstructions of semiconductor surfaces in atmospheric pressure (AP) environments. We use reflectance difference spectroscopy (RDS), a surface-sensitive optical probe, to bridge the gap between ultrahigh vacuum (UHV) and AP, and show that the primary surface reconstructions that occur on (001)GaAs surfaces in UHV also occur in the AP environments used with organometallic chemical vapor deposition (OMCVD). Our results justify the applicability of the results of UHV surface science to understanding surfaces under non-UHV environments. Our results also show that during OMCVD growth conditions the surface is terminated with multilayers of As, contrary to generally accepted models. We also apply our newly developed approach, multi-transient spectroscopy (MTS), to the study of atomic layer epitaxy (ALE). Using MTS, we observe surface spectra within a time resolution of 100 ms during actual ALE growth cycles, thus allowing the dynamics of surface reactions to be investigated. © 1992.

    DOI: 10.1016/0169-4332(92)90472-A

  • Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor deposition Reviewed

    Itaru Kamiya, D. E. Aspnes, H. Tanaka, L. T. Florez, J. P. Harbison, R. Bhat

    Physical Review Letters   68 ( 5 )   627 - 630   1992 (   ISSN:0031-9007 )

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    We report the first observation of reconstructions on semiconductor surfaces in atmospheric pressure (AP) environments. Using reflectance-difference spectroscopy we show that the primary reconstructions that occur on (001) GaAs in ultrahigh vacuum (UHV) also occur under AP, H2, He, and N2. These results demonstrate that dimer formation is not restrited to surfaces in UHV and justify the use of UHV studies to determine (001) GaAs chemistry during AP organometaliic chemical vapor deposition (OMCVD). Reconstructions observed during OMCVD growth are inconsistent with previous models and provide new insights concerning growth. © 1992 The American Physical Society.

    DOI: 10.1103/PhysRevLett.68.627

  • Realizing efficient and stable hybrid perovskite solar cells via passivation with Mn2+ ion-doped CsPbCl3 inorganic metal halide perovskite quantum dots Reviewed

    Seok-Hyun Jeong, Dongjin Choi, Sujin Cho, Jae-Keun Hwang, Jiyeon Nam, Sang-Won Lee, Wonkyu Lee, Dowon Pyun, Donghwan Kim, Yoonmook Kang, Yoshio Ohshita, Itaru Kamiya, Atsushi Ogura, Hyunju Lee Hae-Seok Lee

    Materials Today Energy   48   101786 - 101786   2024.12

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    DOI: 10.1016/j.mtener.2024.101786

  • Unraveling the Impact of Trimethylaluminum in the Nondestructive Passivation of InAs Surface Quantum Dots

    Hanif Mohammadi, Ronel C. Roca, Yuwei Zhang, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata and Itaru Kamiya

    SSRN   4948298   4948298 - 4948298   2024.10

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    DOI: 10.2139/ssrn.4948298

  • Novel Passivation Method of InAs Surface Quantum Dots: Near Nondestructive Diethylzinc Atomic Layer Deposition

    Hanif Mohammadi, Ronel C. Roca, Yuwei Zhang, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata and Itaru Kamiya

    SSRN   4948296   49449482968296   2024.10

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    DOI: 10.2139/ssrn.4948296

  • Electrical and structural properties of ArF excimer laser activation of Mg-doped GaN small area mesa device Reviewed

    Maria Emma Villamin, Ronel Christian Roca, Itaru Kamiya, and Naotaka Iwata

    Optical Engineering   63 ( 9 )   096101 - 096101   2024.9 (   ISSN:0091-3286 )

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    DOI: 10.1117/1.OE.63.9.096101

  • Optical spin injection and detection in submonolayer InAs/GaAs nanostructures by circularly-polarized photoluminescence Reviewed

    Ronel C. Roca, and Itaru Kamiya

    Journal of Nanophotonics   18 ( 3 )   036001 - 036001   2024.7 (   ISSN:1934-2608 )

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    DOI: https://doi.org/10.1117/1.JNP.18.036001

  • Optical spin injection and detection in submonolayer InAs/GaAs nanostructures Reviewed

    Ronel Christian I. Roca and Itaru Kamiya

    Proc. of SPIE   12874   1 - 4   2024.1

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  • ArF excimer laser activation of Mg-doped GaN small area mesa devic Reviewed

    Maria Emma C. Villamin, Ronel Christian I. Roca, Itaru Kamiya and Naotaka Iwata

    Proc. of SPIE   12886   1 - 4   2024.1

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  • Passivation capping of InAs surface quantum dots by TMA/Al2O3: PL enhancement and blueshift suppression Reviewed

    Hanif Mohammadi, Ronel C. Roca, Yuwei Zhang, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata, Itaru Kamiya

    Journal of Applied Physics   2023.5

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    DOI: 10.1063/5.0140035

  • Atomic layer deposition of diethylzinc/zinc oxide on InAs surface quantum dots: Self-clean-up and passivation processes Reviewed

    Hanif Mohammadi, Ronel C. Roca, Yuwei Zhang, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata, Itaru Kamiya

    Applied Surface Science   2023.3

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    DOI: 10.1016/j.apsusc.2022.155790

  • Anomalous photoluminescence of InAs surface quantum dots: intensity enhancement and strain control by underlying quantum dots Reviewed

    H Mohammadi, R C Roca, I Kamiya

    Nanotechnology   2022.10

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    DOI: 10.1088/1361-6528/ac7ece

  • Anomalous photoluminescence of InAs surface quantum dots: intensity enhancement and strain control by underlying quantum dots Reviewed

    Hanif Mohammadi*, Ronel Christian Intal ROCA, Itaru Kamiya

    Nanotechnology   33   415204   2022.7

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  • Effect of the number of stacks on the 2D to 3D transition of stacked submonolayer (SML) InAs nanostructures Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    J. Crryst. Growth   593   126770   2022.6

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  • Structural investigation of the 2D to 3D transition in stacked submonolayer InAs nanostructures Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    AIP Advances   11   075011   2021.7

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  • Structural investigation of the 2D to 3D transition in stacked submonolayer InAs nanostructures Reviewed

    R. C. Roca, I. Kamiya

    AIP Advances   11 ( 7 )   2021.7 (   ISSN:2158-3226 )

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    A direct comparison of the structures of 2D and 3D types of capped stacked submonolayer (SML) InAs nanostructures is evaluated by transmission electron microscopy (TEM). Results of the TEM observation of SML samples with three stacks of InAs unambiguously show a stark contrast between the structures of 2D and 3D SML nanostructures, where the 2D SML nanostructures exhibit a planar structure with thickness that is consistent with the deposited stack height, whereas the 3D SML nanostructures exhibit several-nm-high structures that exceed the height of the deposited stack. In addition, structural evolution at the 2D to 3D transition in uncapped SML nanostructures is investigated by atomic force microscopy (AFM). The AFM results clearly reveal that the 2D to 3D transition occurred during the deposition of the third (and last) InAs SML stack in the present samples, where the density of 3D structures increases in orders of magnitude with the deposited amount of InAs on the order of a tenth of a monolayer at the onset. This effectively bridges the gap between the 2D and 3D nanostructures elucidating the abrupt nature of the transition.

    DOI: 10.1063/5.0052722

  • Photoluminescence tuning of stacked submonolayer (SML) InAs nanostructures across the 2D to 3D transition Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    Applied Physics Letters   118   183104   2021.5

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  • Photoluminescence tuning of stacked submonolayer (SML) InAs nanostructures across the 2D to 3D transition Reviewed

    R. C. Roca, I. Kamiya

    Applied Physics Letters   118 ( 18 )   2021.5 (   ISSN:0003-6951 )

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    We report the precise and broadband tuning of the photoluminescence (PL) from a stacked submonolayer (SML) InAs nanostructure across the 2D to 3D transition. We have recently reported the growth of stacked SML InAs nanostructures by molecular beam epitaxy, which leads to the formation of two distinct types of SML nanostructures: 2D islands and 3D structures. In contrast to the well-investigated transition in Stranski-Krastanov (SK) growth of InAs nanostructures, the transition in SML growth is still largely unexplored. Here, the properties of three- and four-stack SML InAs nanostructures are investigated by PL measurements and are interpreted in the context of the transition. At the transition, a characteristic change in the PL is observed, while the controllability of the PL is maintained across the transition. Furthermore, control of the transition itself is possible by changing the SML stack configuration. A brief comparison with the SK transition is also discussed.

    DOI: 10.1063/5.0047287

  • Correlation between the structure and luminescence of InAs submonolayer stacked nanostructures Reviewed

    Ronel Christian Roca, Itaru Kamiya

    Japanese Journal of Applied Physics   60 ( {SB} )   2021.5 (   ISSN:1347-4065 )

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    The correlation between the structure, measured by atomic force microscopy (AFM), and luminescence, measured by photoluminescence (PL), of InAs submonolayer stacked (SMLS) nanostructures near the 2D to 3D transition is investigated. Topographic measurements using AFM reveal a significant change in the structure of uncapped InAs SMLS samples occurs under certain conditions. This structural change is attributed to the transition from 2D to 3D growth. Optical measurements by PL of corresponding capped SMLS samples showed a significant change in the luminescence properties, in the form of significant redshift and linewidth broadening, also occurs at the same conditions where the structural change occurred. Therefore, the data in the present work establishes a strong correlation between the structural and luminescence properties of InAs SMLS nanostructures. Furthermore, the results demonstrate that two forms of InAs SMLS, stacked 2D islands and 3D structures, possess distinct properties in terms of both structure and luminescence.

    DOI: 10.35848/1347-4065/abd70a

  • Submonolayer stacking growth of In(Ga)As nanostructures for optoelectronic applications: An alternative for Stranski-Krastanov growth Reviewed

    Itaru Kamiya, Ronel Christian Roca

    Japanese Journal of Applied Physics   60 ( {SB} )   2021.5 (   ISSN:1347-4065 )

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    An overview on the submonolayer stacking (SMLS) growth, by molecular beam epitaxy, is given for the growth of InAs-based quantum dots (QDs) and quantum well islands (QWIs) on GaAs in comparison with Stranski-Krastanov (SK) growth. While the size, shape, and density control of QDs by the substrate temperature or source fluxes has already been demonstrated by SK, SMLS provides novel possibilities due to its higher degree of freedom to control. By SMLS, QDs can be grown with higher size/shape control, and QWIs with varied thickness in disk-like shapes. These structures can be free from a wetting layer, being isolated from each other "floating"in the matrix. More importantly, the induced strain field is tunable, allowing us the opportunity to perform simultaneous strain and bandgap engineering. Our recent results in the tuning of photoluminescence wavelength and the transition from two-dimensional to three-dimensional structures together with atomic force microscopy are shown.

    DOI: 10.35848/1347-4065/abef5f

  • Submonolayer stacking growth of In(Ga)As nanostructures for optoelectronic applications: an alternative for Stranski-Krastanov growth Reviewed

    Itaru Kamiya, Ronel Christian Intal ROCA

    Japanese Journal of Applied Physics   60   SB0804   2021.4

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  • Change in Topography of InAs Submonolayer Nanostructures at the 2D to 3D Transition Reviewed

    Ronel Christian Roca, Itaru Kamiya

    Physica Status Solidi (B) Basic Research   258 ( 2 )   2021.2 (   ISSN:1521-3951 )

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    A strong topographical evidence of the 2D to 3D transition in InAs/GaAs nanostructures assembled by the submonolayer (SML) growth mode using molecular beam epitaxy (MBE) is reported. Whereas the 2D to 3D transition in InAs nanostructures assembled by the Stranski–Krastanov (SK) growth mode is well established with a critical thickness of around 1.7 monolayer (ML), the analogous phenomenon in SML-grown nanostructures is not yet well understood. Herein, atomic force microscopy (AFM) is utilized to investigate the topographical changes associated with the 2D to 3D transition in SML nanostructures, and it is unambiguously shown that for a given number of stacks and GaAs matrix (spacer) layer thickness, there exists a critical thickness in the amount of deposited InAs per cycle, beyond which the nucleation of 3D nanostructures abruptly begins. It is also shown that the critical thickness decreases with increasing number of stacks as well as with decreasing GaAs matrix layer thickness. Moreover, the present work shows that InAs/GaAs SML nanostructures exist in two distinct forms: 2D wetting layer (WL)-like islands and 3D quantum dot (QD)-like structures.

    DOI: 10.1002/pssb.202000349

  • Correlation between the structure and luminescence of InAs submonolayer stacked nanostructures Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    Japanese Journal of Applied Physics   60   SBBH06   2021.1

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  • Change in Topography of InAs Submonolayer Nanostructures at the 2D to 3D Transition Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    Physica Status Solidi B   258   2000349   2020.12

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  • Photoluminescence of pre-growth treatment induced below-bandgap states in GaAs Reviewed

    Ronel Christian Roca, Kosei Fukui, Hiroto Mizuno, Mikihito Suzuki, Itaru Kamiya

    Japanese Journal of Applied Physics   59 ( {SG} )   2020.4 (   ISSN:1347-4065 )

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    Below-bandgap states induced by pre-epitaxial growth treatments in semi-insulating (s.i.) GaAs has previously been investigated by photoluminescence (PL). Various electronic states giving rise to near-infrared PL peaks are generated through processes such as annealing or buffer growth that are standard for epitaxial growth of InAlGaAs structures on (001) GaAs substrates. These states often overlap with those from InGaAs structures, not only complicating the interpretation but also altering the electronic properties of the devices. The present study extends the investigation to the case of doped n-and p-Type (001) GaAs substrates. These substrates are widely utilized in various optoelectronic applications, and therefore information on below bandgap states are important to distinguish the desired electronic states from the pre-growth treatment-induced defect states. It was found that the behavior of n-and p-Type substrates subjected to pre-growth treatment are different from that of s.i. GaAs.

    DOI: 10.35848/1347-4065/ab6e08

  • Photoluminescence of pre-growth treatment induced below-bandgap states in GaAs Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    Japanese Journal of Applied Physics   59   SGGK07   2020.2 (   ISSN:1347-4065 )

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  • Below‐Bandgap Photoluminescence from GaAs Reviewed

    Ronel Christian Roca, Kosei Fukui, Hiroto Mizuno, Mikihito Suzuki, Itaru Kamiya

    physica status solidi (b)   2020.2 (   ISSN:0370-1972 )

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    <jats:sec><jats:label /><jats:p>The below‐bandgap photoluminescence (PL) from semi‐insulating (s.i.) GaAs is investigated. It is found that various electronic states that give rise to near‐infrared (NIR) PL peaks are generated through processes that are standard for epitaxial growth of InAlGaAs structures on (001) GaAs substrates. Moreover, the PL signals from these states overlap with those from InAs quantum dots, wetting layers, and InGaAs structures, complicating the design of devices for telecommunications or intermediate band solar cells. The spatial positions of the various defects are also investigated by below‐gap excitation and back‐illuminated PL measurements. The possible identities of the defects are also presented. The present results provide guidelines for distinguishing the desired electronic states from thermal treatment‐induced defect states.</jats:p></jats:sec>

    DOI: 10.1002/pssb.201900391

  • Below-Bandgap Photoluminescence from GaAs Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    Physica Status Solidi B   257   1900391   2019.12 (   ISSN:1521-3951 )

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  • Below-bandgap photoluminescence from GaAs substrates induced by pre-MBE-growth treatments Reviewed

    Ronel Christian Intal ROCA, Itaru Kamiya

    AIP Advances   9   075208   2019.7 (   ISSN:2158-3226 )

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  • Below-bandgap photoluminescence from GaAs substrates induced by pre-MBE-growth treatments Reviewed

    Ronel Christian Roca, Kosei Fukui, Hiroto Mizuno, Mikihito Suzuki, Itaru Kamiya

    AIP Advances   9 ( 7 )   2019.7 (   ISSN:2158-3226 )

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    We report the observation of below-GaAs-bandgap photoluminescence (PL) emission from semi-insulating GaAs substrates subjected to thermal annealing during the standard pre-MBE-growth processes. The below-GaAs-bandgap luminescence from defects were investigated using a combination of PL techniques including below-gap-excitation (BGE) and backside illuminated (BI) PL. Using BGE and BI PL, defects deep within the substrates were probed, and their spatial positions along the sample were analyzed. A PL peak at 1000 nm was observed after pre-bake annealing at 300°C, and further peaks at 905, 940 and 1150 nm were found after oxide desorption annealing at 600°C. These are attributed to the Ga-vacancy related defect, Ga-vacancy-complex defect, As-vacancy defect, and InGaAs states, respectively. This is the first report of the formation of such optically-active defects after annealing of GaAs at moderate temperature ranges (≤600°C), providing guidelines to distinguish desired electronic states for device applications from those that arise from defects which often confuse, and also degrade the device performances.

    DOI: 10.1063/1.5102088

  • Band profiling of p-Si/ITO interface by Kelvin probe force microscopy under light controlled conditions Reviewed

    Fumihiko Yamada, Takefumi Kamioka**, Yoshio Ohshita, Itaru Kamiya

    Proceedings of 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC7)   3315 - 3318   2018.11 (   ISSN:0160-8371 )

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  • Band profiling of p-Si/ITO interface by Kelvin probe force microscopy under light controlled conditions Reviewed

    Fumihiko Yamada, Takefumi Kamioka, Yoshio Ohshita, Itaru Kamiya

    2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC   3315 - 3318   2018.11

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    Kelvin probe force microscopy (KFM) measurements have been performed on cleaved p-Si/ITO (indium tin oxide) interfaces under light controlled conditions. The contact potential difference (CPD) measured by KFM are converted into work function, and hence the band alignment of the interfaces are obtained. We observe that the average work function differences between the p-Si and ITO layers are reduced from that in dark when illuminated.We tentatively attribute this result to the increase in the photogenerated hole density upon illumination, smoothing and widening the band bending in the ITO layer as well.

    DOI: 10.1109/PVSC.2018.8547380

  • Laser-induced local activation of Mg-doped GaN with a high lateral resolution for high power vertical devices Reviewed

    Noriko Kurose **, Kota Matsumoto*, 山田 郁彦, テウク モハマド ロフィ, Itaru Kamiya, Naotaka Iwata, Yoshinobu Aoyagi **

    AIP Advances   8 ( 015329 )   1 - 5   2018.1 (   ISSN:2158-3226 )

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  • Laser-induced local activation of Mg-doped GaN with a high lateral resolution for high power vertical devices Reviewed

    Noriko Kurose, Kota Matsumoto, Fumihiko Yamada, Teuku Muhammad Roffi, Itaru Kamiya, Naotaka Iwata, Yoshinobu Aoyagi

    AIP Advances   8 ( 1 )   015329 - 015329   2018.1 (   ISSN:2158-3226 )

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    A method for laser-induced local p-type activation of an as-grown Mg-doped GaN sample with a high lateral resolution is developed for realizing high power vertical devices for the first time. As-grown Mg-doped GaN is converted to p-type GaN in a confined local area. The transition from an insulating to a p-type area is realized to take place within about 1-2 μm fine resolution. The results show that the technique can be applied in fabricating the devices such as vertical field effect transistors, vertical bipolar transistors and vertical Schottkey diode so on with a current confinement region using a p-type carrier-blocking layer formed by this technique.

    DOI: 10.1063/1.5009970

  • Up-converted photoluminescence in InAs/GaAs heterostructures Reviewed

    Yuwei Zhang, Itaru Kamiya

    JOURNAL OF CRYSTAL GROWTH   477   54 - 58   2017.11 (   ISSN:0022-0248   eISSN:1873-5002 )

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    Up-converted photoluminescence (UPL) in InAs/GaAs heterostructures has been investigated. Relaxation process imposes a great challenge for efficient UPL. It is found that efficient UPL can be detected by the luminescence from InAs/GaAs multi quantum well (MQW), and that the intensity could be enhanced by further improving crystalline quality of GaAs barrier. In addition, choosing proper energy states as intermediate states is another important issue to enhance UPL. We describe how the overall UPL efficiency can be controlled by the epitaxial growth and selection of intermediate states. (C) 2017 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.jcrysgro.2017.05.004

  • Graphitic carbon nitride modified {001}-faceted TiO2 nanosheet photoanodes for efficient quantum dot sensitized solar cells Reviewed

    Qiqian Gao, Lianfeng Duan, Xueyu Zhang, Itaru Kamiya, Wei Lu

    SUPERLATTICES AND MICROSTRUCTURES   109   860 - 868   2017.9 (   ISSN:0749-6036 )

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    In the present work, {001}-faceted TiO2 nanosheets were prepared via a one-step hydrothermal method and used as backbone scaffold of photoanodes of solar cells. The graphitic carbon nitride (g-C3N4) was obtained by simple solid-state heat treatment and applied to modify the (001)-faceted TiO2 nanosheet photoanodes. Compared with the photoanodes prepared from pure (001)-faceted TiO2 nanosheets, the power conversion efficiency (PCE) of g-C3N4 modified (001)-faceted TiO2 nanosheet photoanodes was enhanced due to the suitable band-alignment between g-C3N4 and Ti-02. With 20% loading of g-C3N4 in the photoanode, a maximum PCE of 4.23% with an open circuit voltage of 0.58 V, a short circuit current density of 15.5 mA/cm2, and a fill factor (FF) of 0.48 was achieved, giving 24.7% enhancement in the cell efficiency. Various characterizations were performed to understand the role of g-C3N4 on the device performance, and the mechanisms that account for the improvement are suggested. (C) 2017 Elsevier Ltd. All rights reserved.

    DOI: 10.1016/j.spmi.2017.06.010

  • Effect of substrate orientation on strain relaxation mechanisms of InGaAs layer grown on vicinal GaAs substrates measured by in situ X-ray diffraction Reviewed

    Hidetoshi Suzuki, Takuo Sasaki, Masamitu Takahasi, Yoshio Ohshita, Nobuaki Kojima, Itaru Kamiya, Atsuhiko Fukuyama, Tetsuo Ikari, Masafumi Yamaguchi

    JAPANESE JOURNAL OF APPLIED PHYSICS   56 ( 8 )   08MA06.1‐08MA06.4   2017.8 (   ISSN:0021-4922   eISSN:1347-4065 )

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    The effect of substrate orientation on strain relaxation mechanisms of an InGaAs layer grown on vicinal GaAs substrates was investigated by in situ X-ray diffraction (XRD). The crystallographic tilt and indium segregation in the InGaAs layer were altered depending on the miscut direction and angle. In the case of the substrate tilted 6 degrees toward the [110] direction, one type of misfit dislocations was formed preferentially rather than other types, especially in the rapid relaxation phase. While in the case of the substrate tilted 6 degrees toward the [1 (1) over bar0] direction, no anisotropies during relaxation were observed. The present finding indicates that the appropriate use of vicinal substrates may lead to a novel method of improving the crystal quality of heterolayers. (C) 2017 The Japan Society of Applied Physics

    DOI: 10.7567/JJAP.56.08MA06

  • Effect of substrate orientation on strain relaxation mechanisms of InGaAs layer grown on vicinal GaAs substrates measured by in situ X-ray diffraction Reviewed

    鈴木秀俊 **, Takuo Sasaki **, 高橋正光 **, Yoshio Ohshita, 小島 信晃, Itaru Kamiya, 福山敦彦 **, 碇哲雄 **, Masafumi Yamaguchi

    Japanese Journal of Applied Physics   56   08MA06   2017.7

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  • The g-C3N4 modified {001}-faceted TiO2 nanosheet anodes for efficient quantum dot sensitized solar cells Reviewed

    Qiqian Gao **, Lianfeng Duan **, Xueyu Zhang **, Itaru Kamiya, Wei Lu **

    Superlattices and Microstructures   109   860 - 868   2017.6

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  • The g-C3N4 modified {001}-faceted TiO2 nanosheet anodes for efficient quantum dot sensitized solar cells Reviewed

    Qiqian Gao*, Lianfeng Duan*, Xueyu Zhang*, Yue Yang*, Itaru Kamiya, Wei Lü*

    Superlattices and Microstructures   109   860 - 868   2017.6

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  • Up-converted photoluminescence in InAs/GaAs heterostructures Reviewed

    ユウエイ チャン, Itaru Kamiya

    Journal of Crystal Growth   477   54 - 58   2017.5

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  • Up-converted photoluminescence in InAs/GaAs heterostructures Reviewed

    Yuwei Zhang, Itaru Kamiya

    Journal of Crystal Growth   477   54 - 58   2017.4

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  • Photon upconversion using InAs-based quantum structures and the control of intermediate states Reviewed

    Itaru Kamiya, David M. Tex, Yuwei Zhang, Yoshihiko Kanemitsu

    PHYSICS, SIMULATION, AND PHOTONIC ENGINEERING OF PHOTOVOLTAIC DEVICES VI   10099   2017 (   ISSN:0277-786X )

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    DOI: 10.1117/12.2255021

  • Realization of Conductive AlN Epitaxial Layer on Si Substrate using Spontaneously Formed Nano-Size Via-Holes for Vertical AlGaN High Power FET Reviewed

    Noriko Kurose **, Kota Ozeki **, Tsutomu Araki **, Naotaka Iwata, Itaru Kamiya, Yoshinobu Aoyagi **

    The 43rd International Symposium on Compound Semiconductors (ISCS), Toyama Japan   ThD2 - 4   2016.6

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  • Dynamics of Photogenerated Charge Carriers on Ni- and Ta-Doped SrTiO3 Photocatalysts Studied by Time-Resolved Absorption and Emission Spectroscopy Reviewed

    Akira Yamakata, Masayuki Kawaguchi, Ryosuke Murachi, Masahiro Okawa, Itaru Kamiya

    JOURNAL OF PHYSICAL CHEMISTRY C   120 ( 15 )   7997 - 8004   2016.4 (   ISSN:1932-7447 )

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    The behavior of photogenerated charge carriers on SrTiO3 photocatalysts doped with transition metals (such as Ni and Ta) was examined by time-resolved visible to mid-IR absorption and emission spectroscopy. When SrTiO3 was co-doped with Ni and Ta, the catalyst absorbed visible light and exhibited photocatalytic activity undervisible light irradiation. However, activity under UV light was decreased significantly compared to that before doping. The results of time-resolved measurements showed that monodoping of Ni or Ta accelerated the recombination but co-doping Ni with Ta increased the lifetime of charge carriers compared to those without doping. Furthermore, electrons excited by a visible laser pulse had longer lifetimes compared to those excited by a UV laser pulse. Time-resolved photoluminescence measurements suggested that doped Ni cations act as recombination centers, giving a luminescence peak at similar to 8000 cm(-1) due to the downward d-d transition at Ni2+. However, the lifetime of the emission was much shorter than that of free or shallowly trapped electrons. These results suggest that recombination at the Ni cations is not the dominant process. In addition, the reactivity of photogenerated electrons was decreased dramatically by doping; electrons did not react with exposed O-2, although holes maintained reactivity with MeOH. These results confirm that the decrease in the steady-state activity of doped SrTiO3 under UV light irradiation is responsible for the decrease in reactivity of photogenerated electrons.

    DOI: 10.1021/acs.jpcc.6b01494

  • Dynamics of Photogenerated Charge Carriers on Ni- and Ta-Doped SrTiO3 Photocatalysts Studied by Time-Resolved Absorption and Emission Spectroscopy Reviewed

    山方 啓, Masayuki Kawaguchi*, Ryosuke Murachi*, Masahiro Okawa*, Itaru Kamiya

    The Journal of Physical Chemistry C   120   7997 - 8004   2016.3

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  • Realization of Conductive AIN Epitaxial Layer on Si Substrate using Spontaneously Formed Nano-Size Via-Holes for Vertical AlGaN High Power FET

    Noriko Kurose, Kota Ozeki, Tsutomu Araki, Naotaka Iwata, Itaru Kamiya, Yoshinobu Aoyagi

    2016 COMPOUND SEMICONDUCTOR WEEK (CSW) INCLUDES 28TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE & RELATED MATERIALS (IPRM) & 43RD INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (ISCS)   2016 ( CSW )   1   2016

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    DOI: 10.1109/ICIPRM.2016.7528759

  • Realization of Conductive AIN Epitaxial Layer on Si Substrate using Spontaneously Formed Nano-Size Via-Holes for Vertical AlGaN High Power FET Reviewed

    Noriko Kurose, Kota Ozeki, Tsutomu Araki, Naotaka Iwata, Itaru Kamiya, Yoshinobu Aoyagi

    2016 COMPOUND SEMICONDUCTOR WEEK (CSW) INCLUDES 28TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE & RELATED MATERIALS (IPRM) & 43RD INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (ISCS)   2016

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  • The reduction of Cu2+ and crystal growth processes during colloidal synthesis of Cu2ZnSnS4 nanoparticles Reviewed

    Kazuki Morishita, Hiroyuki Suto, Itaru Kamiya

    2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015   2015.12

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    © 2015 IEEE. The reduction Cu2+ and the crystal growth processes during colloidal synthesis of Cu2ZnSnS4 nanoparticles are investigated. We observe that ions Cu2+, Zn2+, Sn2+, and S2- from the precursors initially form amorphous-like nanoparticles, maintaining charge balance. To form the ideal kesterite crystal structure, Cu atoms need to be reduced from Cu2+ in the precursor stage into Cu+. The reduction of Cu2+ into Cu+ take place as crystal growth of the nanoparticles occur, and coalescence of nanoparticles seems limited. We deduce that it is essential to control the reduction and crystal growth for obtaining stoichiometric Cu2ZnSnS4 crystals, which is important for realizing high quality absorber layers for solar cells. The mechanisms and the implications are discussed.

    DOI: 10.1109/PVSC.2015.7356364

  • Direct observation of strain in InAs quantum dots and cap layer during molecular beam epitaxial growth using in situ X-ray diffraction Reviewed

    下村憲一 量子界面物性*, 鈴木秀俊 宮崎大学*, Takuo Sasaki 日本原子力研究開発機構*, 高橋正光 日本原子力研究開発機構*, Yoshio Ohshita, Itaru Kamiya

    Journal of Applied Physics   118   185303   2015.11

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  • Direct observation of strain in InAs quantum dots and cap layer during molecular beam epitaxial growth using in situ X-ray diffraction Reviewed

    Kenichi Shimomura*, Hidetoshi Suzuki*, Takuo Sasaki*, Masamitu Takahasi*, Yoshio Ohshita, Itaru Kamiya

    Journal of Applied Physics   118   185303   2015.11

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  • Femtosecond upconverted photocurrent spectroscopy of InAs quantum nanostructures Reviewed

    Yasuhiro Yamada 京大化研*, David M. Tex 京大化研*, Itaru Kamiya, Yoshihiko Kanemitsu 京大化研*

    Applied Physics Letters   107   013905   2015.7

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  • Enhancement of the performance of GaP solar cells by embedded In(N)P quantum dots Reviewed

    Yanjin Kuang, Ke Sun, Supanee Sukrittanon, Ko Takabayashi, Itaru Kamiya, Nathan S. Lewis, Charles W. Tu

    NANO ENERGY   15   782 - 788   2015.7 (   ISSN:2211-2855   eISSN:2211-3282 )

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    Improving the utilization of solar spectra of wide bandgap semiconductors that can potentially provide enough free energy is one of the promising strategies for realizing efficient and spontaneous integrated conversion of solar energy to chemical fuels. We demonstrate herein that nitrogen doped InP quantum dots (QDs) embedded in wide bandgap GaP could improve the solar energy conversion performance. Photoelectrochemical experiments in contact with a nonaqueous, reversible redox couple indicated that the QD-embedded devices exhibited improved performance relative to devices without QDs, with short-circuit current densities increasing from 0.16 mA cm(-2) for GaP-only devices to 0.23 and 0.29 mA cm(-2) for InP and InNP QD-embedded devices, respectively. Additionally, the open-circuit voltages increased from 0.95 V for GaP-only devices to 1.11 and 1.14 V for InP and InNP QD-embedded devices, respectively, and the external quantum yield of the devices was also enhanced by the embedded QDs. The improvement is attributed to the absorption of sub-bandgap photons by the In(N)P QDs. (C) 2015 Elsevier Ltd. All tights reserved.

    DOI: 10.1016/j.nanoen.2015.06.003

  • Enhancement of the performance of GaP Solar cells by embedded In(N)P quantum dots Reviewed

    Yanjin Kuang UCSD*, Ke Sun UCSD*, Supanee Sukrittanon UCSD*, 高林紘 量子界面物性*, Itaru Kamiya, Nathan S. Lewis UCSD*, Charles W. Tu UCSD*

    Nano Energy   15   782   2015.6

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  • The reduction of Cu2+ and crystal growth processes during colloidal synthesis of Cu2ZnSnS4 nanoparticles Reviewed

    森下一喜 量子界面物性*, 須藤裕之 量子界面物性*, Itaru Kamiya

    Proceedings of Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd   07456364   2015.6 ( ISBN:978-1-4799-7944-8 )

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  • Strain engineering of quantum dots for long wavelength emission: Photoluminescence from self-assembled InAs quantum dots grown on GaAs(001) at wavelengths over 1.55 μm Reviewed

    Kenichi Shimomura 量子界面物性*, Itaru Kamiya

    Applied Physics Letters   106   082103   2015.2

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  • The reduction of Cu2+ and crystal growth processes during colloidal synthesis of Cu2ZnSnS4 nanoparticles Reviewed

    森下一喜 量子界面物性*, 須藤裕之 量子界面物性*, Itaru Kamiya

    Proceedings of Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd   07456364   2015 ( ISBN:978-1-4799-7944-8 )

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  • Formation of conductive spontaneous via holes in AlN buffer layer on n+Si substrate by filling the vias with n-AlGaN by metal organic chemical vapor deposition and application to vertical deep ultraviolet photo-sensor Reviewed

    Noriko Kurose Ritsumeikan University*, Naotaka Iwata, Itaru Kamiya, Yoshinobu Aoyagi Ritsumeikan University*

    AIP Advances   4   123007   2014.12

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  • Formation of conductive spontaneous via holes in AlN buffer layer on n(+)Si substrate by filling the vias with n-AlGaN by metal organic chemical vapor deposition and application to vertical deep ultraviolet photo-sensor

    N. Kurose, N. Iwata, I. Kamiya, Y. Aoyagi

    AIP ADVANCES   4 ( 12 )   2014.12 (   ISSN:2158-3226 )

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    We have grown conductive aluminum nitride (AlN) layers using the spontaneous via holes formation technique on an n(+)-Si substrate for vertical-type device fabrication. The size and density of the via holes are controlled through the crystal growth conditions used for the layer, and this enables the conductance of the layer to be controlled. Using this technique, we demonstrate the fabrication of a vertical-type deep ultraviolet (DUV) photo-sensor. This technique opens up the possibility of fabrication of monolithically integrated on-chip DUV sensors and DUV light-emitting devices (LEDs), including amplifiers, controllers and other necessary functional circuits, on a Si substrate. (C) 2014 Author(s).

    DOI: 10.1063/1.4905135

  • Local workfunction mapping of interface on heterojunction Si solar cell using KFM Reviewed

    山田 郁彦, 神岡 武文, 立花 福久, 中村京太郎*, Yoshio Ohshita, Itaru Kamiya

    The 6th World Conference on Photovoltaic Energy Conversion   2014.11

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  • Dilute nitride InNP quantum dots: Growth and photoluminescence mechanism Reviewed

    Y. J. Kuang UCSD*, K.Takabayashi 量子界面物性*, S. Sukrittanon UCSD*, J. L. Pan UCSD*, Itaru Kamiya, C. W. Tu UCSD*

    Applied Physics Letters   105   173112   2014.10

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  • Dilute nitride InNP quantum dots: Growth and photoluminescence mechanism

    Y. J. Kuang, K. Takabayashi, S. Sukrittanon, J. L. Pan, I. Kamiya, C. W. Tu

    APPLIED PHYSICS LETTERS   105 ( 17 )   2014.10 (   ISSN:0003-6951   eISSN:1077-3118 )

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    Self-assembled dilute nitride InNP quantum dots (QDs) in GaP matrix grown under the Stranski-Krastanov mode by gas-source molecular beam epitaxy are studied. The N-related localized states inside the InNP QDs provide a spatially direct recombination channel, in contrast to the spatially indirect channel through the strained In(N) P QDs/GaP interface states. The N incorporation into InP QDs therefore causes a blueshift and double-peak features in photoluminescence, which are not observed in other dilute nitride materials. (C) 2014 AIP Publishing LLC.

    DOI: 10.1063/1.4900960

  • Temperature and light-intensity dependence of upconverted photocurrent generation in shallow InAs quantum structures Reviewed

    David M. Tex, Toshiyuki Ihara, Itaru Kamiya, Yoshihiko Kanemitsu

    JAPANESE JOURNAL OF APPLIED PHYSICS   53 ( 5 )   2014.5 (   ISSN:0021-4922   eISSN:1347-4065 )

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    Efficient upconverted photocurrent (PC) generation was verified for excitation of shallow InAs quantum well island (QWI) structures embedded in AlGaAs. Despite the weak absorption of a single layer with height of a few monolayer, about 0.04% increased external quantum efficiency for conversion of narrow monochromatic near-infrared light to PC was achieved. The excitation power dependence of the PC spectra indicates that state filling in the InAs layer occurs, and this must be considered for exact analysis of the upconversion mechanisms. When PC through GaAs is used for normalization, nearly identical power exponents were obtained for PC via upconversion in QWIs at low and high temperatures. This indicates that the same QWI states are responsible for the efficient PC generation from cryogenic up to room temperatures. (C) 2014 The Japan Society of Applied Physics

    DOI: 10.7567/JJAP.53.05FV01

  • Temperature and light-intensity dependence of upconverted photocurrent generation in shallow InAs quantum structures Reviewed

    David M. Tex Kyoto Univ*, Toshiyuki Ihara Kyoto Univ*, Itaru Kamiya, Yoshihiko Kanemitsu Kyoto Univ*

    Japanese Journal of Applied Physics   53   05FV01   2014.4

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  • Microscopic photoluminescence and photocurrent imaging spectroscopy of InAs nanostructures: Identification of photocarrier generation sites for intermediate band solar cells Reviewed

    David M. Tex 京都大学*, 井原章之 京都大学*, Itaru Kamiya, 金光義彦 京都大学*

    Physical Review B   89 ( 12 )   125301   2014.3

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  • Control of hot-carrier relaxation for realizing ideal quantum-dot intermediate-band solar cells Reviewed

    David M. Tex 京都大学*, Itaru Kamiya, Yoshihiko Kanemitsu 京都大学*

    Scientific Reports   4   4125   2014.2

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  • Erratum: Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy (Journal of Crystal Growth (2011) 323 (13-16))

    T. Sasaki, H. Suzuki, A. Sai, M. Takahasi, S. Fujikawa, I. Kamiya, Y. Ohshita, M. Yamaguchi

    Journal of Crystal Growth   387   124   2014.2 (   ISSN:0022-0248 )

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    DOI: 10.1016/j.jcrysgro.2013.10.010

  • Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy (vol 323, pg 13, 2011)

    T. Sasaki, H. Suzuki, A. Sai, M. Takahasi, S. Fujikawa, I. Kamiya, Y. Ohshita, M. Yamaguchi

    JOURNAL OF CRYSTAL GROWTH   387   124 - 124   2014.2 (   ISSN:0022-0248   eISSN:1873-5002 )

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    DOI: 10.1016/j.jcrysgro.2013.10.01.0

  • nm-scaled workfunction mapping of the interfaces of silicon heterojunction (SHJ) solar cell using Kelvin probe force microscopy Reviewed

    Fumihiko Yamada, Takefumi Kamioka, Tomihisa Tachibana, Kyotaro Nakamura, Yoshio Ohshita, Itaru Kamiya

    2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC)   3040 - 3042   2014

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    We performed workfunction mapping of the cleaved interface of silicon heterojunction (SHJ) solar cell. While it has been widely accepted that the efficiency of solar cells depends on their electric contacts at various interfaces, no direct information on the electronic properties had been obtained on nm-scale. In this work, we employed Kelvin probe force microscopy (KFM) and simultaneously measured the workfunction and morphology of the cleaved interfaces on nm-scale for the first time. We show the measured workfunction differences between the surface layers on the cleaved SHJ solar cell, and discuss how such information can be used to improve the quality of the devices.

    DOI: 10.1109/PVSC.2014.6925576

  • As flux dependence on RHEED transients during InAs quantum dot growth Reviewed

    K. Shimomura, T. Shirasaka, D. M. Tex, I. Kamiya

    JOURNAL OF CRYSTAL GROWTH   378   41 - 43   2013.9 (   ISSN:0022-0248 )

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    We study the role of As during InAs quantum dots (QDs) growth by molecular beam epitaxy using reflection high-energy electron diffraction (RHEED). We observe that the RHEED intensity transient onset and the transition to the saturation region occur at less InAs thickness under higher As-4 flux. From the RHEED transients, we find that the diffusion time does not depend on the As-4 flux while the diffusion barrier does. The diffusion length of In adatoms can be reduced by increasing the diffusion barrier using higher As-4 flux, allowing us to grow InAs QDs at higher densities. (c) 2013 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.jcrysgro.2012.12.147

  • Efficient upconverted photocurrent through an Auger process in disklike InAs quantum structures for intermediate-band solar cells Reviewed

    David M. Tex 京都大学*, Itaru Kamiya, Yoshihiko Kanemitsu 京都大学*

    Physical Review B   87 ( 24 )   245305   2013.6

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  • Erratum: X-ray reciprocal space mapping of dislocation-mediated strain relaxation during InGaAs/GaAs(001) epitaxial growth (Journal of Applied Physics (2011) 110 (113502))

    Takuo Sasaki, Hidetoshi Suzuki, Masamitu Takahasi, Yoshio Ohshita, Itaru Kamiya, Masafumi Yamaguchi

    Journal of Applied Physics   113 ( 19 )   2013.5 (   ISSN:0021-8979 )

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    DOI: 10.1063/1.4804236

  • Electronically cross-linked PbS quantum dot networks using polymers as surface ligands Reviewed

    Wei Lu*, Yue Yang*, 山方 啓, Itaru Kamiya

    NANO   8 ( 2 )   1350013   2013.4

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  • Subsurface measurement of nanostructures on GaAs by electrostatic force microscopy Reviewed

    山田 郁彦, Itaru Kamiya

    Applied Surface Science   271   131   2013.4

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  • Subsurface measurement of nanostructures on GaAs by electrostatic force microscopy Reviewed

    Fumihiko Yamada, Itaru Kamiya

    APPLIED SURFACE SCIENCE   271   131 - 135   2013.4 (   ISSN:0169-4332 )

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    The size of surface buried oxide nanostructures are measured by electrostatic force microscopy (EFM). In contrast to atomic force microscopy that cannot probe subsurface structures and thickness, we show that EFM data include information about the thickness of individual nanostructures, consequently allowing us to determine the thickness of buried nanostructures on semiconductor substrates. We further show that this measurement can be performed simultaneously with AFM using EFM modulation spectroscopy. (C) 2013 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.apsusc.2013.01.146

  • As flux dependence on RHEED transients during InAs quantum dot growth Reviewed

    下村憲一 量子界面物性*, 白坂健生 量子界面物性*, D. M. Tex 量子界面物性*, Itaru Kamiya

    J. Cryst. Growth   2013.1

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  • InAs Quantum Well Islands – A Novel Structure For Photon Up-conversion From the Near IR To the Visible Reviewed

    Itaru Kamiya, David M. Tex 京都大学*, 下村憲一 量子界面物性*, 山田 郁彦, 高林絋 量子界面物性*, 金光義彦 京都大学*

    Proceedings of the 39th IEEE Photovoltaics Specialists Conference   3040 - 3044   2013

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  • InAs Quantum Well Islands - a Novel Structure For Photon Up-conversion From the Near IR To the Visible

    Itaru Kamiya, David M. Tex, Kenichi Shimomura, Fumihiko Yamada, Ko Takabayashi, Yoshihiko Kanemitsu

    2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)   3040 - 3044   2013 (   ISSN:0160-8371 )

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    A novel quantum structure that could be applied for next generation solar cells through photon up-conversion is proposed. The structure which we term quantum well island (QWI) is an In As based structure that is a few monolayer thick, confining the carriers quantum mechanically, and extended tens to a hundred nm laterally thereby weakly confining the carriers enhancing multi-exciton interactions. By embedding In As QWIs in Al GaAs barrier layers, near infrared photons can be up-converted into visible, which has not been realized by quantum dots. We show the preparation and control of QWIs by molecular beam epitaxy, and the examples of such photon upconversion together with the proposed mechanisms. We also discuss how the conversion efficiency can be improved and the application to photocurrent conversion.

    DOI: 10.1109/PVSC.2013.6745102

  • RHEED transients during InAs quantum dot growth by MBE Reviewed

    Kenichi Shimomura*, Takeo Shirasaka*, David M. Tex*, 山田 郁彦, Itaru Kamiya

    J. Vac. Sci. Technol. B   30   02B128   2012.3

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  • Observation of In-Plane Asymmetric Strain Relaxation during Crystal Growth and Growth Interruption in InGaAs/GaAs(001) Reviewed

    Takuo Sasaki, Kenichi Shimomura*, Hidetoshi Suzuki*, Masamitu Takahasi*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    Japanese Journal of Applied Physics   51 ( 2 )   02BP01   2012.2

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  • Shallow defect states in GaAs responsible for GaAs bandgap upconversion induced by electron beam during MBE growth Reviewed

    David M. Tex 量子界面物性*, Itaru Kamiya

    Journal of Vacuum Science and Technology B   30 ( 2 )   02B120   2012.2

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  • Observation of In-Plane Asymmetric Strain Relaxation during Crystal Growth and Growth Interruption in InGaAs/GaAs(001)

    Takuo Sasaki, Kenichi Shimomura, Hidetoshi Suzuki, Masamitu Takahasi, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    JAPANESE JOURNAL OF APPLIED PHYSICS   51 ( 2 )   2012.2 (   ISSN:0021-4922 )

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    In-plane asymmetric strain relaxation in lattice-mismatched InGaAs/GaAs(001) heteroepitaxy is studied by in situ three-dimensional X-ray reciprocal space mapping. Repeating crystal growth and growth interruptions during measurements allows us to investigate whether the strain relaxation is limited at a certain thickness or saturated. We find that the degree of relaxation during growth interruption depends on both the film thickness and the in-plane directions. Significant lattice relaxation is observed in rapid relaxation regimes during interruption. This is a clear indication that relaxation is kinetically limited. In addition, relaxation along the [110] direction can saturate more readily than that along the [110] direction. We discuss this result in terms of the interaction between orthogonally aligned dislocations. (C) 2012 The Japan Society of Applied Physics

    DOI: 10.1143/JJAP.51.02BP01

  • Observation of In-Plane Asymmetric Strain Relaxation during Crystal Growth and Growth Interruption in InGaAs/GaAs(001)

    Takuo Sasaki, Kenichi Shimomura, Hidetoshi Suzuki, Masamitu Takahasi, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    JAPANESE JOURNAL OF APPLIED PHYSICS   51 ( 2 )   02BP01 - 02BP01-3   2012.2 (   ISSN:0021-4922 )

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    In-plane asymmetric strain relaxation in lattice-mismatched InGaAs/GaAs(001) heteroepitaxy is studied by in situ three-dimensional X-ray reciprocal space mapping. Repeating crystal growth and growth interruptions during measurements allows us to investigate whether the strain relaxation is limited at a certain thickness or saturated. We find that the degree of relaxation during growth interruption depends on both the film thickness and the in-plane directions. Significant lattice relaxation is observed in rapid relaxation regimes during interruption. This is a clear indication that relaxation is kinetically limited. In addition, relaxation along the [110] direction can saturate more readily than that along the [110] direction. We discuss this result in terms of the interaction between orthogonally aligned dislocations. (C) 2012 The Japan Society of Applied Physics

    DOI: 10.1143/JJAP.51.02BP01

  • Real-Time Structural Analysis of Compositionally Graded InGaAs/GaAs(001) Layers Reviewed

    Takuo Sasaki, Hidetoshi Suzuki, Makoto Inagaki, Kazuma Ikeda, Kenichi Shimomura, Masamitu Takahasi, Miwa Kozu, Wen Hu, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    IEEE JOURNAL OF PHOTOVOLTAICS   2 ( 1 )   35 - 40   2012.1 (   ISSN:2156-3381 )

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    Compositionally step-graded InGaAs/GaAs(0 0 1) buffers with overshooting (OS) layers were evaluated by several characterization techniques for higher efficiency metamorphic III-V multijunction solar cells. By high-resolution X-ray diffraction, we found that fully relaxed or tensile strained top layers can be obtained by choosing appropriate OS layer thickness. Moreover, from real-time structural analysis using in situ X-ray reciprocal space mapping (in situ RSM), it was proved that the top layer is almost strained to the OS layers, and it is independent of the thicknesses of the OS layers. Dislocations in the vicinity of the OS layers were observed by transmission electron microscopy, and the validity of results of in situ RSM was confirmed from the viewpoint of misfit dislocation behavior. Finally, by photoluminescence measurements, we showed that tensile strained top layers may be suitable for the improvement of minority-carrier lifetime.

    DOI: 10.1109/JPHOTOV.2011.2174198

  • The influence of interlayer molecules in luminescence of self-assembled PbS quantum dot film Reviewed

    Wei Lu 量子界面物性*, Itaru Kamiya

    Journal of Nanoscience and Nanotechology   12 ( 1 )   410 - 415   2012.1

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  • The Influence of Interlayer Molecules in Luminescence of Self-Assembled Bilayer PbS Quantum Dot Films Reviewed

    Wei Lu, Itaru Kamiya

    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY   12 ( 1 )   410 - 415   2012.1 (   ISSN:1533-4880   eISSN:1533-4899 )

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    We synthesized organic solvent-soluble and water-soluble PbS quantum dots (QDs) with different sizes. The organic solvent-soluble PbS QDs dispersed in tetrachloroethylene were used to prepare bilayers structures of QDs bound by dithiol linkers on GaAs. The water-soluble PbS QDs were used to prepare bilayer structures of QDs on quartz based on alternating adsorption of polyelectrolyte. For bilayer films on GaAs, it was found that the stacking sequence of QDs affects the quantum yield and emission wavelength of the larger QDs. However, for bilayer films with different stacking sequences on quartz, the larger QDs show similar PL intensities and emission wavelength independent of the sequence. The probable mechanism for this difference observed is discussed in terms of charge transfer between QDs.

    DOI: 10.1166/jnn.2012.5361

  • RHEED transients during InAs quantum dot growth by MBE Reviewed

    K. Shimomura, T. Shirasaka, D. M. Tex, F. Yamada, I. Kamiya

    Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics   30 ( 2 )   2012 (   ISSN:2166-2754 )

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    The growth mechanisms of InAs self-assembled quantum dots (QDs) on GaAs(001) by molecular beam epitaxy are studied by reflection high-energy electron diffraction (RHEED) transients along the two major axes, [110] and [110]. The authors observe anisotropy in the intensity transients and that there are two stages in QD formation, which emerge as different slopes in the RHEED transients. The authors attribute the anisotropy of the RHEED transients to the shape of QDs based on analysis using atomic force microscopy. The difference in the QD formation processes at each slope is investigated together with photoluminescence measurements. The authors observe that the QD density increases during the first slope whereas the QD density remains constant and the QD size increases during the second slope. © 2012 American Vacuum Society.

    DOI: 10.1116/1.3694019

  • X-ray reciprocal space mapping of dislocation-mediated strain relaxation during InGaAs/GaAs(001) epitaxial growth Reviewed

    Takuo Sasaki, Hidetoshi Suzuki*, Masamitu Takahashi*, Yoshio Ohshita, Itaru Kamiya, Masafumi Yamaguchi

    Journal of Applied Physics   110 ( 11 )   113502   2011.12

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  • X-ray reciprocal space mapping of dislocation-mediated strain relaxation during InGaAs/GaAs(001) epitaxial growth

    Takuo Sasaki, Hidetoshi Suzuki, Masamitu Takahasi, Yoshio Ohshita, Itaru Kamiya, Masafumi Yamaguchi

    JOURNAL OF APPLIED PHYSICS   110 ( 11 )   2011.12 (   ISSN:0021-8979   eISSN:1089-7550 )

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    Dislocation-mediated strain relaxation during lattice-mismatched InGaAs/GaAs(001) heteroepitaxy was studied through in situ x-ray reciprocal space mapping (in situ RSM). At the synchrotron radiation facility SPring-8, a hybrid system of molecular beam epitaxy and x-ray diffractometry with a two-dimensional detector enabled us to perform in situ RSM at high-speed and high-resolution. Using this experimental setup, four results in terms of film properties were simultaneously extracted as functions of film thickness. These were the lattice constants, the diffraction broadenings along in-plane and out-of-plane directions, and the diffuse scattering. Based on correlations among these results, the strain relaxation processes were classified into four thickness ranges with different dislocation behavior. In addition, the existence of transition regimes between the thickness ranges was identified. Finally, the dominant dislocation behavior corresponding to each of the four thickness ranges and transition regimes was noted. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3664832]

    DOI: 10.1063/1.3664832

  • Structures and electronics of buried and unburied semiconductor interfaces Reviewed

    Itaru Kamiya

    IOP Conference Series: Materials Science and Engineering   24   2011.11 (   ISSN:1757-8981 )

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    The structure of interfaces plays an important role in determining the electronic properties of semiconductor nanostructures. Here, such examples are shown and discussed using semiconductor nanostructures prepared by molecular beam epitaxy and colloidal synthesis. © Published under licence by IOP Publishing Ltd.

    DOI: 10.1088/1757-899X/24/1/012006

  • Structure and electronics of buried and unburied semiconductor interfaces Reviewed

    Itaru Kamiya

    IOP Conference Series: Materials Science and Engineering   24   012066   2011.9

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  • Electron Transport Properties of Si Nanosheets: Transition from Direct Tunneling to Fowler-Nordheim Tunneling Reviewed

    Takashi Ikuno*, Hirotaka Okamoto*, Yusuke Sugiyama*, Hideyuki Nakano*, 山田 郁彦, Itaru Kamiya

    Appl. Phys. Lett.   99   023107   2011.7

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  • Electron transport properties of Si nanosheets: Transition from direct tunneling to Fowler-Nordheim tunneling Reviewed

    Takashi Ikuno, Hirotaka Okamoto, Yusuke Sugiyama, Hideyuki Nakano, Fumihiko Yamada, Itaru Kamiya

    APPLIED PHYSICS LETTERS   99 ( 2 )   2011.7 (   ISSN:0003-6951 )

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    We have characterized the electron transport properties of n-decylamine-functionalized Si nanosheets (NSs) using atomic force microscopy with a conductive cantilever under vacuum conditions at room temperature. Electrons are transported from the cantilever to the substrate through Si NSs. The Si NSs exhibit nonresonant tunneling; the transport mechanisms are based on direct tunneling at low bias voltages and Fowler-Nordheim tunneling at high bias voltages. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3610486]

    DOI: 10.1063/1.3610486

  • Influence of High-Energy Electron Beam on Source Fluxes during Molecular Beam Epitaxy Growth on Photoluminescence Upconversion from the GaAs Band Gap Reviewed

    David M. Tex, Itaru Kamiya

    APPLIED PHYSICS EXPRESS   4 ( 6 )   65501 - 065501-3   2011.6 (   ISSN:1882-0778 )

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    We investigated the influence of an unfocused electron beam (e-beam) passing in front of a sample during molecular beam epitaxy (MBE) growth of GaAs on the upconverted photoluminescence efficiency and found a strong influence on the intermediate states. A clear difference in the Stokes and anti-Stokes photoluminescence (PL) is observed. Time-resolved PL correlation spectroscopy results allow us to suggest that an unfocused e-beam increases the density of a specific GaAs bulk state also found in samples grown without an e-beam. (C) 2011 The Japan Society of Applied Physics

    DOI: 10.1143/APEX.4.065501

  • Influence of In and As fluxes on growth of self-assembled InAs quantum dots on GaAs(001) Reviewed

    Itaru Kamiya, Takeo shirasaka*, Kenichi Shimomura*, David M. Tex*

    Journal of Crystal Growth   323   219 - 222   2011.5

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  • Influence of high-energy electron beam on source fluxes during molecular beam epitaxy growth on photoluminescence upconversion from the GaAs bandgap Reviewed

    David M. Tex 量子界面物性*, Itaru Kamiya

    Applied Physics Express   4   065501   2011.5

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  • Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy Reviewed

    Takuo Sasaki, Hidetoshi Suzuki*, Akihisa Sai*, Masamitu Takahasi*, Seiji Fujikawa*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    Journal of Crystal Growth   323 ( 1 )   13 - 16   2011.5 (   ISSN:0022-0248 )

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  • Influence of In and As fluxes on growth of self-assembled InAs quantum dots on GaAs(001) Reviewed

    Itaru Kamiya, Takeo Shirasaka, Kenichi Shimomura, David M. Tex

    JOURNAL OF CRYSTAL GROWTH   323 ( 1 )   219 - 222   2011.5 (   ISSN:0022-0248 )

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    The growth of self-assembled (SA) quantum dots (QDs) on GaAs(0 0 1) by molecular beam epitaxy (MBE) is studied as a function of the In and As fluxes. Under growth rates below 0.05 ML/s, we find that the density of QDs increases not only with increasing In flux but also with As flux. The formation mechanisms are discussed based on the results obtained by atomic force microscopy (AFM), and that As flux alters the surface diffusion, leading to the control of QD nucleus density. (C) 2011 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.jcrysgro.2011.01.034

  • Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy

    Takuo Sasaki, Hidetoshi Suzuki, Akihisa Sai, Masamitu Takahasi, Seiji Fujikawa, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    JOURNAL OF CRYSTAL GROWTH   323 ( 1 )   13 - 16   2011.5 (   ISSN:0022-0248   eISSN:1873-5002 )

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    Growth temperature dependence of strain relaxation during In0.12Ga0.88As/GaAs(0 0 1) molecular beam epitaxy was studied by in situ X-ray reciprocal space mapping. Evolution of the residual strain and crystal quality for the InGaAs film was obtained as a function of film thickness at growth temperatures of 420, 445 and 477 degrees C. In the early stages of strain relaxation, it was found that evolution of the residual strain and crystal quality was dependent on the growth temperature. In order to discuss this observation quantitatively, the strain relaxation model was proposed based on the Dodson-Tsao kinetic model, and its validity was demonstrated by good agreement with the experimental residual strain. Additionally, rate coefficients reflecting dislocation motions during strain relaxation were obtained as a function of growth temperature and strain relaxation was discussed in terms of the thermally active dislocation motion. (C) 2010 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.jcrysgro.2010.10.005

  • Upconversion of infrared photons to visible luminescence using InAs-based quantum structures Reviewed

    David M. Tex*, Itaru Kamiya

    Physical Review B   83   081309(R)   2011.2

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  • Self-assembled colloidal PbS quantum dots on GaAs substrates Reviewed

    呂 威, 山田 郁彦, Itaru Kamiya

    J. Phys.   245   012069   2010.9

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  • Resonant tunneling of electrons through single self-assembled quantum dot studied by conductive probe atomic force microscopy Reviewed

    Ichiro Tanaka*, Y. Tada*, S. Nakatani*, K. Uno Department of Materials ScienceChemistry, Wakayama University*, Itaru Kamiya, Hiroyuki Sakaki

    Physica E   42 ( 10 )   2606 - 2609   2010.9

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  • Surface state control of III-V semiconductors using molecular modification Reviewed

    Fumihiko Yamada, Takeo Shirasaka, Kosei Fukui, Itaru Kamiya

    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES   42 ( 10 )   2841 - 2845   2010.9 (   ISSN:1386-9477   eISSN:1873-1759 )

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    An attempt to control surface electronics of III-V semiconductor using wet chemical processes has been performed. Here, we report results on the use of self-assembled monolayers (SAMs) of organic molecules on (001) GaAs surface. Octadecanethiol (ODT) and benzenethiol (BT) have been the choice in the present study.
    GaAs wafers were modified by thiol molecules on the flat surface after the native oxide layers are removed by chemical etching under optimized conditions. The change in the electronic properties was measured in terms of transport properties via the SAM layer by conductive probe atomic force microscopy. The current-voltage characteristics thus obtained show that ODT functions as a tunnel barrier while BT is conductive due to the presence of pi-electrons. As a result, we can control the electronic states of GaAs-molecule interface for realizing novel device structures by the selection of functional molecules. (C) 2010 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.physe.2010.01.018

  • Resonant tunneling of electrons through single self-assembled In As quantum dot studied by conductive atomic force microscopy

    Ichiro Tanaka, Y. Tada, S. Nakatani, K. Uno, I. Kamiya, H. Sakaki

    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES   42 ( 10 )   2606 - 2609   2010.9 (   ISSN:1386-9477 )

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    Resonant tunneling of electrons through a quantum level in single self-assembled InAs quantum dot (QD) embedded in thin AlAs barriers has been studied. The embedded InAs QDs are sandwiched by 1.7-nm-thick AlAs barriers, and surface InAs QDs, which are deposited on 8.3 nm-thick GaAs cap layer, are used as nano-scale electrodes. Since the surface InAs QD should be vertically aligned with a buried one, a current flowing via the buried QD can be measured with a conductive tip of an atomic force microscope (AFM) brought in contact with the surface QD-electrode. Negative differential resistance attributed to electron resonant tunneling through a quantized energy level in the buried QD is observed in the current-voltage characteristics at room temperature. The effect of Fermi level pinning around nano-scale QD-electrode on resonance voltage and the dependence of resonance voltage on the size of QD-electrodes are investigated, and it has been demonstrated that the distribution of the resonance voltages reflects the size variation of the embedded QDs. (C) 2009 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.physe.2009.10.010

  • Control of surface morphology and electronic properties of III-V semiconductors using molecular modification Reviewed

    山田 郁彦, Shuichi Arakawa, Itaru Kamiya

    Journal of Vacuum Science & Technology B   28 ( 4 )   C5F28   2010.7

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  • Fabrication and coupling investigation of films of PbS quantum dots Reviewed

    呂 威, 山田 郁彦, Itaru Kamiya

    Microelectronics and Nanometer Structures   28 ( 4 )   C5E8 - C5E12   2010.7

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  • Real-time observation of anisotropic strain relaxation by three-dimensional reciprocal space mapping during InGaAs/GaAs (001) growth Reviewed

    Hidetoshi Suzuki, Takuo Sasaki, Akihisa Sai, Yoshio Ohshita, Itaru Kamiya, Masafumi Yamaguchi, Masamitu Takahasi, Seiji Fujikawa

    APPLIED PHYSICS LETTERS   97 ( 4 )   041906   2010.7 (   ISSN:0003-6951 )

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    Real-time three-dimensional reciprocal space mapping (3D-RSM) measurement during In(0.12)Ga(0.88)As/GaAs(001) molecular beam epitaxial growth has been performed to investigate anisotropy in relaxation processes along [110] and [(1) over bar 10] directions caused by alpha and beta misfit dislocations (MDs). Anisotropies, strain relaxation, and crystal quality in both directions were simultaneously evaluated via the position and broadness of 022 diffraction in 3D-RSM. In the small-thickness region, strain relaxation caused by alpha-MDs is higher than that caused by beta-MDs, and therefore crystal quality along [110] is worse than that along [(1) over bar 10]. Rapid relaxation along both [110] and [(1) over bar 10] directions occurs at almost the same thickness. After rapid relaxation, anisotropy in strain relaxation gradually decreases, whereas crystal quality along [(1) over bar 10] direction, presumably due to beta-MDs, becomes better that along [110] direction and the ratio does not decay with thickness. (C) 2010 American Institute of Physics. [doi:10.1063/1.3458695]

    DOI: 10.1063/1.3458695

  • Surface state control of III–V semiconductors using molecular modification Reviewed

    山田 郁彦, Takeo Shirasaka Toyota Technological Institute*, Kosei Fukui Toyota Technological Institute*, Itaru Kamiya

    Physica E   42 ( 10 )   2841   2010.1

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  • Resonant tunneling of electrons through single self-assembled InAs quantum dot studied by conductive atomic force microscopy Reviewed

    Ichiro Tanaka Wakayama Univ.*, Y. Tada Wakayama Univ.*, S. Nakatani Wakayama Univ.*, K. Uno Wakayama Univ.*, Itaru Kamiya, I. Kamiya*, Hiroyuki Sakaki, H. Sakaki*

    Physica E   42   2606   2010

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  • Control of surface morphology and electronic properties of III-V semiconductors using molecular modification Reviewed

    Fumihiko Yamada, Shuichi Arakawa, Itaru Kamiya

    Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics   28 ( 4 )   C5 - F32   2010 (   ISSN:2166-2754 )

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    GaAs surface was modified by self-assembled monolayer of organic molecules through wet chemical processes, which include etching and coating. Octadecanethiol (ODT) and benzenethiol (BT) were the choice as modifiers. Etched surface of the GaAs, whose quality greatly affects the morphology and properties of the resulting modified GaAs, was investigated by x-ray photoelectron spectroscopy combined with atomic force microscopy (AFM). Nanometer-scale particlelike structures of Ga2O3 appeared on the surface after etching by etchant with low acid concentration. The particle size was controllable by the acid concentration and etching time. Almost the entire surface of the GaAs substrate was successfully covered with thiol molecules when GaAs etched by the etchant with high acid concentration was used. The conduction of the ODT-coated GaAs measured with conductive prove AFM using Rh coated cantilevers was below the detection limit of the current amplifier. However, current-voltage characteristics of BT-coated GaAs showed electron rectification proving electron transport via the π-orbital. The molecular modification of the semiconductors by wet chemical processes may afford a promising route to control the surface states of organic molecule-semiconductor interface for novel device structures. © 2010 American Vacuum Society.

    DOI: 10.1116/1.3447228

  • Fabrication and coupling investigation of films of PbS quantum dots Reviewed

    Wei Lü, Fumihiko Yamada, Itaru Kamiya

    Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics   28 ( 4 )   C5 - E12   2010 (   ISSN:2166-2754 )

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    The authors report the self-assembly and characterization of monolayer PbS quantum dots (QDs) on GaAs substrates and the effect of thermal annealing on close-packed PbS QD films. The QD monolayer film was prepared using a 1,6-hexanedithiol self-assembled monolayer to link PbS QDs to GaAs substrates. Atomic force microscopy measurement confirmed the formation of PbS QD monolayer on GaAs. The temperature dependence of photoluminescence (PL) intensity of PbS QDs shows a feature typical for close-packed PbS QD films. For investigation of the influence of thermal annealing, three close-packed films of colloidal PbS QDs were prepared by drop coating and treated at different annealing temperatures. By controlling the annealing temperature, the PL intensity of close-packed films at room temperature can be improved. The room temperature PL intensity can be adjusted to be higher than that at 10 K. These results provide insights for future applications of colloidal QDs and the improvement of their performances. © 2010 American Vacuum Society.

    DOI: 10.1116/1.3456172

  • In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms

    Takuo Sasaki, Hidetoshi Suzuki, Akihisa Sai, Jong-Han Lee, Masamitu Takahasi, Seiji Fujikawa, Koji Arafune, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    APPLIED PHYSICS EXPRESS   2 ( 8 )   85501 - 085501-3   2009.8 (   ISSN:1882-0778 )

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    In situ real-time X-ray diffraction measurements during In(0.12)Ga(0.88)As/GaAs(001) epitaxial growth are performed for the first time to understand the strain relaxation mechanisms in a lattice-m is matched system. The high resolution reciprocal space maps of 004 diffraction obtained at interval of 6.2 nm thickness enable transient behavior of residual strain and crystal quality to be observed simultaneously as a function of InGaAs film thickness. From the evolution of these data, five thickness ranges with different relaxation processes and these transition points are determined quantitatively, and the dominant dislocation behavior in each phase is deduced. (C) 2009 The Japan Society of Applied Physics

    DOI: 10.1143/APEX.2.085501

  • In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms

    Takuo Sasaki, Hidetoshi Suzuki, Akihisa Sai, Jong-Han Lee, Masamitu Takahasi, Seiji Fujikawa, Koji Arafune, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    APPLIED PHYSICS EXPRESS   2 ( 8 )   085501   2009.8 (   ISSN:1882-0778 )

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    In situ real-time X-ray diffraction measurements during In(0.12)Ga(0.88)As/GaAs(001) epitaxial growth are performed for the first time to understand the strain relaxation mechanisms in a lattice-m is matched system. The high resolution reciprocal space maps of 004 diffraction obtained at interval of 6.2 nm thickness enable transient behavior of residual strain and crystal quality to be observed simultaneously as a function of InGaAs film thickness. From the evolution of these data, five thickness ranges with different relaxation processes and these transition points are determined quantitatively, and the dominant dislocation behavior in each phase is deduced. (C) 2009 The Japan Society of Applied Physics

    DOI: 10.1143/APEX.2.085501

  • Nanohole 3D-size tailoring through polystyrene bead combustion during thin film deposition Reviewed

    Xiaofeng Peng, Itaru Kamiya

    APPLIED SURFACE SCIENCE   255 ( 8 )   4384 - 4388   2009.2 (   ISSN:0169-4332 )

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    A novel approach is presented for nanohole 3D-size tailoring. The process starts with a monolayer of polystyrene (PS) beads spun coat on silicon wafer as a template. The holes can be directly prepared through combustion of PS beads by oxygen plasma during metal or oxide thin film deposition. The incoming particles are prevented from adhering on PS beads by H(2)O and CO(2) generated from the combustion of the PS beads. The hole depth generally depends on the film thickness. The hole diameter can be tailored by the PS bead size, film deposition rate, and also the combustion speed of the PS beads. In this work, a series of holes with depth of 4-24 nm and diameter of 10-36 nm has been successfully prepared. The hole wall materials can be selected from metals such as Au or Pt and oxides such as SiO(2) or Al(2)O(3). These templates could be suitable for the preparation and characterization of novel nanodevices based on single quantum dots or single molecules, and could be extended to the studies of a wide range of coating materials and substrates with controlled hole depth and diameters. (C) 2008 Elsevier B. V. All rights reserved.

    DOI: 10.1016/j.apsusc.2008.10.128

  • Resonant tunneling of electrons through single self-assembled InAs quantum dot studied by conductive atomic force microscopy. Reviewed

    I.Tanaka*, Y.Tada*, S.Nakatani*, K.Uno Department of Materials Science and Chemistry, Wakayama University*, Itaru Kamiya, Hiroyuki Sakaki

    Abstracts for The 14th International Conference on Modulated Semiconductor Structures(MSS14), Th-mP66   2009

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  • Resonant tunneling of electrons through single self-assembled InAs quantum dot studied by conductive atomic force microscopy Reviewed

    Ichiro Tanaka*, Y.Tada*, S.Nakatani*, K.Uno Department of Materials ScienceChemistry, Wakayama University*, Itaru Kamiya, Hiroyuki Sakaki

    Physica E   2009

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    DOI: doi:10.1016/j.physe.2009.10.010

  • Temperature dependence of electronic energy transfer in PbS quantum dot films Reviewed

    呂 威, Itaru Kamiya, Masao Ichida Konan Univ.*, Hiroaki Ando Konan Univ.*

    Applied Physics Letters   95   83102   2009

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  • In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growthfor Understanding Strain Relaxation Mechanisms Reviewed

    Takuo Sasaki, Hidetoshi Suzuki*, Akihisa Sai 修士2*, ジョンハン リー, Masamitu Takahasi JAEA*, Seiji Fujikawa JAEA*, Koji Arafune 兵庫県立大学*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    Applied Physics Express   2 ( 8 )   085501   2009

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  • Two methods to prepare nanorings/nanoholes for the fabrication of vertical nanotransistors Reviewed

    Xiaofeng Peng, Itaru Kamiya

    NANOTECHNOLOGY   19 ( 31 )   2008.8 (   ISSN:0957-4484 )

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    A self-assembled monolayer of polystyrene (PS) beads is formed on a silicon wafer by spin-coating. After drying at 80 degrees C, a thin film of metal/oxide is deposited. During the deposition, the PS beads are detached due to forces such as the inner stress induced by plasma sputtering deposition, mechanical vibration, and centrifugal shearing induced by substrate rotation, resulting in nanoring/nanohole formation. Further experiments demonstrate that the PS detachment can be controlled by scanning probe microscopy (SPM) tip manipulation. We believe this is a promising set of processes for fabricating nanodevice structures such as those of vertical nanotransistors, which provides high flexibility for nanocrystal characterizations and application for single-electron devices.

    DOI: 10.1088/0957-4484/19/31/315303

  • Nanohole 3D-size tailoring through polystyrene bead combustion during thin film deposition Reviewed

    Xiaofeng Peng*, Itaru Kamiya

    Applied Surface Science   255   4384 - 4388   2008

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  • Two methods to prepare nanorings/nanoholes - for fabrication of vertical nanotransistors Reviewed

    Xiaofeng Peng*, Itaru Kamiya

    Nanotechnology   19   315303   2008

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  • Resonant tunneling of electrons through single self-assembled InAs quantum dot at room temperature studied with conductive AFM tip Reviewed

    Ichiro Tanaka, Y. Tada, S. Nakatani, K. Uno, M. Azuma, K. Umemura, I. Kamiya, H. Sakaki

    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 9   5 ( 9 )   2938 - 2940   2008 (   ISSN:1862-6351 )

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    Resonant tunneling of electrons through a quantum level in a self-assembled InAs quantum dot (QD) has been measured by conductive atomic force microscopy (AFM) at room temperature. InAs QDs are embedded in a 3.4 nm thick AlAs layer, and capped with 8.3 nm-thick GaAs layer on which surface InAs QDs are deposited as nano-scale electrodes. Bringing the conductive AFM tip on the surface InAs QD which ahould be vertically aligned with a buried QD, a bias voltage is applied to the samle, and a current flowing via the bruied QD is measeured. Negative differntial resistance attributed to electron resonant tunnelling through a quantized energy lelvel in the buried QD is observed in the current-voltage characteristics. The voltage loss by nano-scale electrode and the dependence of resonance voltage on the size of the surface QD-electrodes are discussed. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

    DOI: 10.1002/pssc.200779302

  • Real-time observation of nucleation and evolution of InAs quantum dots on GaAs(001) during MBE Reviewed

    Itaru Kamiya, Kohtaro Matsuura, Tsuyoshi Higashinakagawa

    Materials Research Society Symposium Proceedings   959   90 - 94   2007.12 (   ISSN:0272-9172 )

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    Real-time observation of self-assembled (SA) InAs quantum dot (QD) growth on GaAs(001) by MBE has been performed. Through transient measurements on reflection high energy electron diffraction (RHEED) specular beam, we obtain information about nucleation and evolution of the QDs in situ, in contrast to most previous reports that required growth interruption. Based on the observation, we have been able to distinguish processes that are dependent and independent of growth rate. In addition, the results reveal that surface migration of In/As atoms and their incorporation into QDs, with the aid of the wetting layer, can be observed. We also provide a quantitative discussion on these processes. © 2007 Materials Research Society.

  • Resonant Tunneling of Electrons through Single Self-Assembled InAs Quantum Dot at Room Temperature Studied with Conductive AFM Tip. Reviewed

    Ichiro TANAKA*, Y. Tada*, S. Nakatani*, K. Uno*, M. Azuma*, K. Umemura 和歌山大学*, Itaru Kamiya, Hiroyuki Sakaki

    physica status solidi (c)   2007

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  • In situ observation of nucleation and evolution of self-assembled InAs quantum dots on GaAs(001) during MBE Reviewed

    Itaru Kamiya, K. Matsuura 2006年卒*, T. Higashinakagawa 2006年卒*

    Material Research Society Symposium Proceedings   959   M17 - 111   2006

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  • Ligand control of semiconductor nanocrystals for efficient carrier injection Reviewed

    Tomohide Murase, Harumi Asami, Itaru Kamiya

    Materials Research Society Symposium Proceedings   847   451 - 455   2005.12 (   ISSN:0272-9172 )

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    Inorganic/organic hybrid material of CdSe/ZnS core/shell nanocrystals (NCs) covered with organic ligands was prepared with ligand exchange reaction in order to facilitate carrier injection into NCs through the organic ligands. The organic ligands used in this study, 2-naphtalenethiol and bathophenanthroline, were selected as model compounds according to adjustment of highest occupied molecular orbital and lowest unoccupied molecular orbital of the ligand to valence band maximum and conduction band minimum of the CdSe NCs, respectively. The prepared hybrid NCs easily disperse in polar organic solvents such as CHCl3 and show photoluminescence only from the CdSe/ZnS core/shell NCs. Current-voltage characteristics of the ligand exchanged NCs thin films sandwiched between electrodes were investigated. It was shown that conductivity of the film was improved by the introduction of carrier injecting ligands in comparison to the ligand unexchanged trioctylphosphine oxide-capped CdSe/ZnS NC thin film. © 2005 Materials Research Society.

  • Resonant tunneling of electrons through a single self-assembled InAs quantum dot probed via a novel overlayed quantum dot electrode Reviewed

    Kamiya, I, Tanaka, I, Y Tada, M Azuma, K Uno, H Sakaki

    JOURNAL OF CRYSTAL GROWTH   278 ( 1-4 )   98 - 102   2005.5 (   ISSN:0022-0248 )

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    The resonant tunneling process of electrons through a single self-assembled InAs quantum dot (QD) has been studied by conductive-tip atomic force microscopy. The unique structure employed here consists of two layers of InAs QDs, which are separated by 5-nm-thick undoped GaAs layer. The conductive tip is placed in contact with the surface InAs QD which functions as a nano-sized electrode to measure the flow of electrons from the n(+)-GaAs substrate via a buried QD. A conductance structure attributed to resonant electron tunneling through the quantized level of QD is observed in the current-voltage characteristics. The resonant voltage is larger than the usual flat band voltage, indicative of a considerable voltage loss caused by the Fermi level pinning around the nano-sized electrode. &COPY; 2005 Elsevier B.V. All rights reserved.

    DOI: 10.1016/j.jcrysgro.2004.12.117

  • 半導体量子構造の化学的作製 Reviewed

    神谷 格

    未来材料   6 ( 1 )   12 - 18   2005

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  • Improved height measurement of single CdSe colloidal quantum dots by CNT tip AFM Reviewed

    I. Tanaka Wakayama University*, K. Kajimoto Wakayama University*, K. Uno Wakayama University*, O. Ohtsuki Wakayama University*, T. Murase Mitsubishi Chemical STRC*, H. Asami Mitsubishi Chemical STRC*, M. Hara RIKEN*, Itaru Kamiya

    Japanese Journal of Applied Physics.Part 2   44 ( 7 )   L249   2005

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  • Resonant tunneling of electrons through a single self-assembled InAs quantum dot probed via a novel overlayed quantum dot electrode Reviewed

    Itaru Kamiya, I. Tanaka Wakayama Univ*, Y. Tada Wakayama Univ*, M. Azuma Wakayama Univ*, K. Uno Wakayama Univ*, Hiroyuki Sakaki

    Journal of Crystal Growth   275   98 - 102   2005

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  • The effect of SO2 and H2O on the SCR-C3H6 of NO over a transition metals supported mesh-type alumite catalyst

    Y Guo, M Sakurai, H Kameyama, Kamiya, I, A Matsuyama, Y Kudoh

    JOURNAL OF CHEMICAL ENGINEERING OF JAPAN   37 ( 7 )   895 - 904   2004.7 (   ISSN:0021-9592 )

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    A mesh-type Cu-Mn-CeOxAl2O3/Al alumite catalyst was employed to investigate the selective reduction of NO with C3H6 in the presence of SO2 and H2O. The effect of SO2 on the de-NOx activity closely depended on SO2 concentration and temperature. At a low temperature (673 K), SO2 of 50 ppm greatly improved the NO, reduction, but a further increase in SO2 concentration (up to 500 ppm) caused a rapid catalyst deactivation. As temperature increased to 723 K, the catalyst deactivation caused by 500 ppm SO2 disappeared, and further the presence of SO2 also produced a remarkable promotion in the de-NOx activity. The effect of SO2 was observed to be an irreversible course associated with irreversible chemical phase transition. The presence of SO2 was considered to inhibit the over-oxidation of the organic-intermediates by oxygen, and to make the organic-intermediates more available for the NOx reduction. However, a high concentration of SO2 inhibited not only this over-oxidation but also propene activation, and led to catalyst deactivation. The inhibition of SO2 in the propene activation, mainly attributed to the over-adsorption of SO2, could be weakened as temperature increases. Although the presence of water vapor depressed the de-NOx activity, this change was almost reversible. In comparison with the separate presence of SO2, the coexistence of H2O and SO2 More dramatically improved the NOx reduction. It was considered possible that the coexisting H2O diluted SO2 to lessen the inhibition effect of SO2 on activating propene.

    DOI: 10.1252/jcej.37.895

  • Ligand Control of Semiconductor Nanocrystals for Efficient Carrier Injection Reviewed

    T. Murase Mitsubishi Chemical STRC*, H. Asami Mitsubishi Chemical STRC*, Itaru Kamiya

    Material Research Society Symposium Proceedings   847   EE13251 - 5   2004

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  • Surface state analysis of photobrightening in CdSe nanocrystal thin films Reviewed

    H Asami, Y Abe, T Ohtsu, Kamiya, I, M Hara

    JOURNAL OF PHYSICAL CHEMISTRY B   107 ( 46 )   12566 - 12568   2003.11 (   ISSN:1520-6106 )

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    We report the changes in surface state of tri-n-octylphosphine oxide (TOPO) capped CdSe nacocrystals by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). In the photobrightening state, where photoluminescence (PL) intensity increased during the illumination, surface ligand rearrangement such as the TOPO-Se compelx and TOPO dimers; are formed, which might be deeply correlated with the PL enhancement. It was also observed that surface oxidation and decomposition of TOPO, which is followed by the desorption, occurred in photodarkening state.

    DOI: 10.1021/jp035484a

  • Current-voltage characteristics of single CdSe colloidal nanodots measured by conductive-tip atomic force microscopy Reviewed

    Ichiro Tanaka, Eri Kawasaki, O. Ohtsuki, K. Uno, M. Hara, H. Asami, T. Murase, I. Kamiya

    Materials Research Society Symposium - Proceedings   737   227 - 231   2003.7 (   ISSN:0272-9172 )

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    We have investigated current-voltage characteristics of individual CdSe colloidal nanodots by conductive-tip atomic force microscopy (AFM). The colloidal nanodots were spun-coat and scattered on a self-assembled monolayer of thiophene molecules formed on Au (111) surfaces for single dot measurements. A thin SiO2layer was deposited on the sample surface in order to prevent the dots being moved by the tip during measurement. We imaged the topography of isolated single dots by AFM operated in contact mode, and measured current-voltage characteristics with the conductive tip positioned on single dots; large conductivity changes which suggest resonant tunneling through a quantized energy level in the dot was observed even at room temperature.

  • Conductive-tip atomic force microscopy of CdSe colloidal nanodots

    Tanaka, I, E Kawasaki, O Ohtsuki, K Uno, M Hara, H Asami, Kamiya, I

    SURFACE SCIENCE   532   801 - 805   2003.6 (   ISSN:0039-6028   eISSN:1879-2758 )

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    Electronic properties of individual Use colloidal nanodots have been investigated by conductive-tip atomic force microscopy (AFM). Submonolayer-thick films of the colloidal nanodots were fabricated on a self-assembled monolayer of alkanethiol molecules formed on Au(111) surfaces for single dot measurements. First, we simultaneously imaged the topography and conductivity of isolated single dots by AFM operating in contact mode with a conductive tip under appropriate bias voltages. In the current image, it is found that the dot regions have higher electric resistances due to tunneling resistance through the Use dots. We found a 10-nm scale,electric inhomogeneity around the dots, which may correspond to the previously reported etch-pits of Au(111) surfaces formed during the deposition of the alkanethiol molecules. Then, current-voltage characteristics were measured with the conductive tip positioned on the single dots; large changes in the conductivity which suggest resonant tunneling through the quantized energy level in the dot were observed even at room temperature. (C) 2003 Elsevier Science B.V. All rights reserved.

    DOI: 10.1016/S0039-6028(03)00088-8

  • Photobrightening and photodarkening in CdSe nanocrystal/polymer thin films Reviewed

    H Asami, Kamiya, I, M Hara

    ASIANANO 2002, PROCEEDINGS   267 - 270   2003

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    The change in the photoluminescence intensity of CdSe nanocrystal/polymer thin films with duration of illumination is investigated. The choice of polymer has an influence on photobrightening and photodarkening. In particular, photodarkening in CdSe nanocrystal/poly(vinyl carbazole) thin film occurs immediately upon illumination, in contrast to the slow changes observed with polystyrene and poly (2-vinylpridine). We discuss the mechanisms of this phenomenon in comparison with interaction between surface of CdSe nanocrystals and polymer side chain.

  • Multi-wavelength intermittent photoluminescence of single CdSe quantum dots

    Yuichi Yamasaki, Harumi Asami, Takashi Isoshima, Itaru Kamiya, Masahiko Hara

    SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS   4 ( 6 )   519 - 522   2003 (   ISSN:1468-6996   eISSN:1878-5514 )

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    A single chromophore detection using video-microscopy is one of the latest methodologies to reveal unique characteristics, which could not be obtained from ensemble measurements. Among many kinds of subjects, dynamic optical properties observed in colloidal semiconductor nanoparticles are attractive and important not only for the basis of photo-physics but also for application studies, e.g. biological labeling, electronic devices. In this study, fluorescence video-microscopy was performed on cadmium selenide (CdSe) quantum dots (QDs) spin-coated on a glass substrate. From single CdSe QDs detection, emissions at wavelengths separated over 60 nm were observed for the first time. This spectral feature was attributed to the existence of double-emissive relaxation processes in CdSe QDs. Photoluminescence intermittency was also observed both from relaxation processes. Fluorescence video-microscopy, which was advanced in biology, can be applicable for the real-time monitoring of dynamic properties in semiconductor photo-physics. (C) 2004 Elsevier Ltd. All rights reserved.

    DOI: 10.1016/j.stam.2003.12.008

  • Current images of CdSe colloidal nanodots observed by conductive-tip atomic force microscopy

    Ichiro Tanaka, Eri Kawasaki, O. Ohtsuki, M. Hara, H. Asami, I. Kamiya

    Materials Research Society Symposium - Proceedings   692   467 - 471   2002.1 (   ISSN:0272-9172 )

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    We have fabricated submonolayer-thick films of CdSe colloidal nanodots in order to investigate electronic properties of individual nanodots by conductive-tip atomic force microscopy (AFM). Topographic and current images of isolated single CdSe colloidal dots on single crystalline Au (111) surface which was covered with dodecanethiol self-assembled monolayer were obtained by AFM operating in contact mode with a conductive tip under appropriate bias voltages. In the current image, it is found that the dot regions have higher electric resistances due to tunneling resistance through the CdSe dots. We also found 10 nm-scale electric inhomogeneity around the dots, which may corresponds to the previously reported etch-pits of Au (111) surfaces formed during the deposition of the dodecanethiol molecules.

  • Resonant tunneling through a single self-assembled InAs quantum dot in a micro-RTD structure Reviewed

    I. Kamiya, Ichiro Tanaka, K. Tanaka, F. Yamada, Y. Shinozuka, H. Sakaki

    Physica E: Low-Dimensional Systems and Nanostructures   13 ( 2-4 )   131 - 133   2002 (   ISSN:1386-9477 )

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    By forming a micron-scale Schottky diode on a GaAs/n+-GaAs wafer with low density (∼ 4 × 108 cm-2) self-assembled InAs quantum dots (QDs) embedded in the top GaAs layer, we have studied resonant tunneling transport of electrons via single QDs. As the diode defined by electron-beam lithography and chemical etching has a size of about 1 μm2 and the edges of each diode are depleted, the number of active InAs QD contained in each microdiode can be reduced to less than unity in average. Current-voltage measurements were performed using conductive probe atomic force microscope, and current peaks caused by electrons resonantly tunneling through quantum levels of single QDs have been observed at temperatures as high as ∼ 130 K. © 2002 Elsevier Science B.V. All rights reserved.

    DOI: 10.1016/S1386-9477(01)00503-3

  • Photobrightening and photodarkening in CdSe nanocrystal/polymer thin films Reviewed

    Harumi Asami, Itaru Kamiya, Masahiko Hara

    International Journal of Nanoscience, Vol 1, Nos 5 and 6   1 ( 5-6 )   641 - 644   2002

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    The change in the photoluminescence intensity of CdSe nanocrystal./polymer thin films with duration of illumination is investigated. The choice of polymer has an influence on photobrightening and photodarkening. In particular, photodarkening in CdSe nanocrystal/poly(vinyl carbazole) thin film occurs immediately upon illumination, in contrast to the slow changes observed with polystyrene and poly(2-vinylpridine). We discuss the mechanisms of this phenomenon in comparison with interaction between surface of CdSe nanocrystals and polymer side chain.

    DOI: 10.1142/S0219581X02000814

  • Spatially controlled CdSe nanocrystal distribution in phase separated polymer blend films

    H. Asami, S. Saita, I. Kamiya, K. Yoshie

    Materials Research Society Symposium - Proceedings   636   2001.1 (   ISSN:0272-9172 )

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    We report the fabrication and characterization of the self-assembled structure of tri-n-octylphosphine oxide (TOPO)-capped CdSe nanocrystals in binary polymer phase separated films of polystyrene (PS), poly(methyl methacrylate) (PMMA) and poly(2-vinylpyridine) (P2VP). These structures are formed via demixing of CdSe nanocrystals and binary polymer during spin coating. The nanocrystals preferentially segregate to the PS-rich phase in phase separated PS/PMMA and to the P2VP-rich phase in phase separated PS/P2VP, as shown by optical microscopy and photoluminescence images. For CdSe/PS/PMMA, we attribute the driving force for CdSe segregating to the PS-rich domain to the stronger attractive interaction of TOPO on PS with respect to PMMA due to polarity, and in the case of CdSe/PS/P2VP, segregating to the P2VP-rich domain to the interaction such as coordinate bonds being formed between pyridine groups and surface Cd atoms.

  • Observation of CdSe colloidal nano-dot films by scanning probe microscopy

    Ichiro Tanaka, Eri Kawasaki, O. Ohtsuki, S. Saita, I. Kamiya

    Materials Research Society Symposium - Proceedings   642   2001.1 (   ISSN:0272-9172 )

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    We observed the surface topography of CdSe colloidal nano-dot film by cyclic contact mode atomic force microscopy. The observed structure changes with cantilever oscillation amplitude, and non-uniform images with long-range corrugations are obtained with relatively large oscillation amplitude while fine structures are revealed with smaller oscillation amplitude. When the amplitude is larger and the surface is weakly &#039;tapped&#039;, the topography of the soft organic matrix of the film dominates, and when the tapping force is increased, the hard CdSe dots begin to reveal.

  • Missing "sheets" in the reciprocal space representation of the disordered surface with one-dimensional domain boundaries

    E. S. Tok, J. Zhang, I. Kamiya, M. H. Xie, J. H. Neave, B. A. Joyce

    Surface Review and Letters   8 ( 5 )   509 - 511   2001 (   ISSN:0218-625X )

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    One-dimensional disorder in a reconstructed surface can give rise to sheetlike structures in reciprocal space. For disorder caused by one-dimensional domain boundaries such as those that occur on the GaAs{100}(2 × 4) surface, sheetlike structures are only present at fractional order diffraction features. The absence of these sheets at integral diffraction features is explained using kinematic theory of diffraction and "selection rules" for these sheetlike structures are established. Applications of these rules are demonstrated using optical transmission diffraction.

    DOI: 10.1016/S0218-625X(01)00130-0

  • Local capacitance measurements on InAs dot-covered GaAs surfaces by scanning capacitance microscopy Reviewed

    H Yamamoto, T Takahashi, Kamiya, I

    APPLIED PHYSICS LETTERS   77 ( 13 )   1994 - 1996   2000.9 (   ISSN:0003-6951 )

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    Capacitance images responsible for surface depletion were observed on an InAs dot-covered GaAs surface by scanning capacitance microscopy. We performed local capacitance versus bias voltage measurements on quantum dots (QDs) and a wetting layer (WL) as well as conductance versus bias voltage (G-V) measurements. Both results indicate that the surface depletion is more suppressed beneath the QDs than under the WL. In addition, the conventional thermionic equation theory fitted to the measured G-V curves shows that the interface barrier height between the GaAs and the InAs QD increases as the QD size is reduced. We ascribe this result to the influence of the surrounding WL, whose surface Fermi level is strongly pinned at the midgap of the n-GaAs. (C) 2000 American Institute of Physics. [S0003- 6951(00)02239-7].

    DOI: 10.1063/1.1312257

  • Surface potential measurement of self-assembled InAs dots by scanning Maxwell stress microscopy

    Ichiro Tanaka, I. Kamiya, H. Sakaki, M. Fujimoto

    Physica E: Low-Dimensional Systems and Nanostructures   7 ( 3 )   373 - 376   2000 (   ISSN:1386-9477 )

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    We have imaged surface potential of InAs self-assembled quantum dots on GaAs (0 0 1) surface by scanning Maxwell stress microscopy. Simultaneously obtained constant tip-sample capacitance image and surface potential image were compared with atomic force microscope (AFM) image, and was found that the surface potential on large dots of about 100-nm diameter is approximately 610 mV which is 30-40 mV lower than that on regular size dots. This result well coincides with previously reported Schottky barrier heights which were estimated from current versus voltage measurements with the same type of samples using conductive probe AFM.

    DOI: 10.1016/S1386-9477(99)00344-6

  • Electrostatic force characterization on InAs dot-covered n-type (001) GaAs surfaces by contact-mode atomic force microscopy with a conductive tip Reviewed

    T Takahashi, T Kawamukai, Kamiya, I

    APPLIED PHYSICS LETTERS   75 ( 4 )   510 - 512   1999.7 (   ISSN:0003-6951 )

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    We performed atomic force microscopy in contact mode while applying an ac bias voltage between a conductive tip and a sample to characterize near surface band structures of InAs-covered n-type (001) GaAs, where self-assembled dot structures were formed. Electrostatic force of less than 10 pN was detectable, and clear electrostatic force images and topographic images were simultaneously obtained with lateral resolution higher than 20 nm. The electrostatic force images from single and double frequency components reveal that the gap width between the tip and the conductive region under the dot-covered area of the sample is smaller and is less modulated by the bias voltage than under the wetting layer. The results indicate that surface depletion is more suppressed beneath the dots. (C) 1999 American Institute of Physics. [S0003-6951(99)00930-4].

    DOI: 10.1063/1.124432

  • Photoinduced current properties of InAs-covered GaAs studied by scanning tunneling microscopy

    H Yamamoto, Kamiya, I, T Takahashi

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   38 ( 6B )   3871 - 3874   1999.6 (   ISSN:0021-4922 )

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    We performed simultaneous imaging of photoinduced current and topography on an InAs-covered GaAs surface by scanning tunneling microscopy (STM) under modulated laser irradiation to investigate the difference in the electronic properties between quantum dots and a wetting layer. We also performed time-resolved tunneling current measurements to clarify the origin of the photoinduced effects on its surface. We observed a spiky transient current, resulting from photocarrier separation by a built-in field in the surface depletion layer. Images of the photoinduced current mainly originating from the surface depletion were obtained at a chopping frequency of 900 Hz, and both the photoinduced current images, and the current transients observed at this frequency reveal that the surface depletion is more suppressed under the dots than under the wetting layer.

    DOI: 10.1143/JJAP.38.3871

  • Imaging and probing electronic properties of self-assembled InAs quantum dots by atomic force microscopy with conductive tip

    Tanaka, I, Kamiya, I, H Sakaki, N Qureshi, SJ Allen, PM Petroff

    APPLIED PHYSICS LETTERS   74 ( 6 )   844 - 846   1999.2 (   ISSN:0003-6951 )

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    Atomic force microscopy with a conductive probe has been used to study both the topography and the electronic properties of 10-nm-scale self-assembled InAs quantum dots (QDs) grown by molecular beam epitaxy on n-type GaAs. The current flowing through the conductive probe normal to the sample surface is measured for imaging local conductance, while the deflection of cantilever is optically detected for disclosing geometrical structure. The conductance on InAs QDs is found to be much larger than that on the wetting layer, allowing imaging of QDs through measurements of local current. We attribute this change in conductance to the local modification of surface band bending associated with surface states on InAs QD surface. Mechanisms of electron transport through QDs are discussed based on current-voltage characteristics measured on QDs of various sizes. (C) 1999 American Institute of Physics. [S0003-6951(99)03206-4].

    DOI: 10.1063/1.123402

  • Characterization of InAs dots on n-GaAs by AFM with a conductive tip Reviewed

    T. Takahashi, T. Kawamukai, I. Kamiya

    Surface and Interface Analysis   27 ( 5 )   547 - 549   1999 (   ISSN:0142-2421 )

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    We performed atomic force microscopy (AFM) on an InAs-covered GaAs surface on which InAs dot structures are formed surrounded by a wetting layer. In order to characterize its surface band structures, we applied an a.c. bias voltage (f = 25 kHz) between a conductive AFM tip and a sample. By means of a lock-in detection technique, clear electrostatic force images as well as topographic images were obtained with high resolution. The electrostatic force images of the different frequency components (f and 2f) reveal that the gap width between the tip and the conductive region of the sample is modulated very little by the bias voltage in the dot-covered area, whereas the gap width is obviously modulated in the wetting layer area. These results indicate that the surface depletion is more suppressed in the dot-covered area than in the wetting layer area.

    DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<547::AID-SIA481>3.0.CO;2-Q

  • Local surface band modulation with MBE-grown InAs quantum dots measured by atomic force microscopy with conductive tip

    Ichiro Tanaka, I. Kamiya, H. Sakaki

    Journal of Crystal Growth   201   1194 - 1197   1999 (   ISSN:0022-0248 )

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    Electronic properties of self-assembled InAs quantum dots (QDs) grown by molecular beam epitaxy have been investigated by atomic force microscopy (AFM) with conductive tip. The conductive AFM tip is brought to contact with QDs of various sizes, which are oxidized due to the sample transfer through the air, and current versus voltage (I-V) characteristics are measured under forward bias condition. The obtained I-V curves indicate that the Schottky barrier is lower on large QDs of 70-90 nm diameter compared to that on small QDs of 30-40 nm diameter, i.e. the surface band structure is locally modified by the QDs. This modification is considered to be due to the positive surface charges on the InAs QDs which compensate for the negative surface states of the surrounding wetting layer.

    DOI: 10.1016/S0022-0248(99)00029-9

  • Terahertz excitation, transport and spectroscopy of an AFM-defined quantum dot

    N Qureshi, SJ Allen, Kamiya, I, Y Nakamura, H Sakaki

    TERAHERTZ SPECTROSCOPY AND APPLICATIONS   3617   133 - 136   1999 (   ISSN:0277-786X )

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    We have investigated the terahertz photoresponse of a single semiconductor quantum dot, electrostatically defined by a sharp conducting Atomic Force Microscope (AFM) tip in contact with a resonant tunneling diode structure. The quantum dot is excited by radiation from a Free Electron Laser in experiments both at room temperature and at cryogenic temperatures. Pronounced resonant tunneling features and classical rectification at frequencies from 0.3 to 3THz are observed in the I-V curves of these devices. These results demonstrate a novel approach to achieving terahertz excitation and studying transport in quantum dots.

  • Optical properties of near surface-InAs quantum dots and their formation processes Reviewed

    Kamiya, I, Tanaka, I, H Sakaki

    PHYSICA E   2 ( 1-4 )   637 - 642   1998.7 (   ISSN:1386-9477 )

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    The morphological evolution of thin layers of InAs deposited on (0 0 1)GaAs has been investigated by photoluminescence (PL) and atomic force microscopy (AFM). We observe PL features that correspond to the transformation of the InAs wetting layer and 2D islands into quantum dots (QDs), which is supported by the AFM study. Variation in the PL spectra is also observed as a function of the thickness of the GaAs layer deposited on top of the InAs layer. Luminescence intensity from both the QDs and the wetting layer (WL) picks up at a thickness of about 10-20 monolayers. As the thickness is increased, uprise in PL intensity for both QDs and WL together with a narrowing in the WL peak is observed. (C) 1998 Elsevier Science B.V. All rights reserved.

    DOI: 10.1016/S1386-9477(98)00130-1

  • Terahertz excitation of AFM-defined room temperature quantum dots

    N Qureshi, JS Scott, SJ Allen, M Reddy, MJW Rodwell, Y Nakamura, Tanaka, I, T Noda, Kamiya, I, H Sakaki

    PHYSICA E   2 ( 1-4 )   701 - 703   1998.7 (   ISSN:1386-9477 )

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    The terahertz photoresponse of a single semiconductor quantum dot is measured at room temperature. Pronounced resonant tunneling and a rectified response at frequencies from 0.6 to 3 THz are observed in the I-V curve of the submicron device. We use this to demonstrate a novel approach to the study of quantum dots, in which a submicron resonant tunneling device is electrostatically defined using a conducting atomic force microscope (AFM) tip. In addition, the conducting AFM tip electrically contacts the device and serves as an antenna to couple far-infrared radiation into the dot. (C) 1998 Elsevier Science B.V. All rights reserved.

    DOI: 10.1016/S1386-9477(98)00143-X

  • Tunneling spectroscopic study of InAs-coveredGaAs under laser irradiation

    Takuji Takahashi, Masahiro Yoshita, Itaru Kamiya, Hiroyuki Sakaki

    Applied Physics A: Materials Science and Processing   66 ( 1 )   S1055 - S1058   1998 (   ISSN:0947-8396 )

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    We have studied electronic states near the surface of InAs-covered GaAs(001) by tunneling spectroscopic measurements. Differential conductance was measured on samples with an InAs wetting layer or InAs dot structures on n-type GaAs by a scanning tunneling microscope operated in air under laser irradiation. The modulation effect of laser irradiation on the tunneling properties reveals that for the sample with the InAs wetting layer on n-GaAs, surface electronic properties - such as band bending and surface Fermi level - are very similar to those of a bare n-GaAs sample. In contrast, additional deposition of InAs over the wetting layer, which forms InAs dots, leads to a drastic change in electronic properties near the surface. © 1998 Springer-Verlag.

    DOI: 10.1007/s003390051296

  • UHV-AFM Study of MBE-grown 10 nm-scale ridge quantum wires Reviewed

    Shyun Koshiba, Ichiro Tanaka, Yusui Nakamura, Itaru Kamiya, Takao Someya, Tze Ngo, Hiroyuki Sakaki

    175-176   803-807   1997.6

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    DOI: 10.1016/S0022-0248(96)01204-3

  • Real-time optical diagnostics for epitaxial growth Invited Reviewed International coauthorship

    David E. Aspnes, I. Kamiya

    Proceedings of SPIE - The International Society for Optical Engineering   2730   306 - 322   1996.1 (   ISSN:0277-786X )

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    Various optical techniques have been developed over the last few years for real-time analysis of surfaces and near-surface regions of semiconductor epitaxy. These techniques are providing insights into microscopic mechanisms of epitaxy and opportunities for sample-driven closed- loop feedback control of the epitaxial growth process. Both aspects are expected to become increasingly important as device complexity increases and tolerances become more stringent. Examples are provided and opportunities discussed.

  • A RHEED study of the growth of InAs on InAs(111)A Reviewed

    T Nomura, Kamiya, I, MR Fahy, JH Neave, BA Joyce

    COMPOUND SEMICONDUCTORS 1995   145   115 - 120   1996 (   ISSN:0951-3248 )

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    Growth of InAs on InAs (111)A by molecular beam epitaxy has been studied using reflection high energy electron diffraction intensity oscillations. The period of the intensity corresponds to the flux of In for lower substrate temperatures and/or higher As fluxes and is independent of growth conditions. However, for higher substrate temperatures and/or lower As fluxes, the period is longer than the value expected from the In flux and strongly depends on the growth conditions. A critical growth condition, defined as the boundary between the two regions, is a strong function of the As flux and substrate temperature. The increase of the period is explained by the deficiency of As on the growing surface due to its low sticking coefficient.

  • REAL-TIME OBSERVATION OF ATOMIC ORDERING IN (001) IN0.53GA0.47AS EPITAXIAL LAYERS

    BA PHILIPS, KAMIYA, I, K HINGERL, LT FLOREZ, DE ASPNES, S MAHAJAN, JP HARBISON

    PHYSICAL REVIEW LETTERS   74 ( 18 )   3640 - 3643   1995.5 (   ISSN:0031-9007 )

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    We report the first real-time observation of atomic ordering in a semiconductor alloy during epitaxial growth. (001) In0.53Ga0.47As layers deposited below about 400°C exhibit a strong anisotropy in the broadening parameters of the E1,E11 transitions that is observable with reflectance-difference spectroscopy. This unusual optical behavior results from intraband mixing driven by triple-period ordering along both [111] and [111»] directions simultaneously. This microstructure is realizable with stoichiometry In0.556Ga0.444As virtually identical to that needed to lattice match InP. © 1995 The American Physical Society.

    DOI: 10.1103/PhysRevLett.74.3640

  • Mechanisms of layer growth during molecular beam epitaxy of semiconductor films

    B. A. Joyce, T. Shitara, M. R. Fahy, K. Sato, J. H. Neave, P. N. Fawcett, I. Kamiya, X. M. Zhang

    Materials Science and Engineering B   30   87 - 97   1995.1 (   ISSN:0921-5107 )

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    This paper reviews our present understanding of particular aspects of the surface processes involved in the growth of epitaxial semiconductor films by molecular beam epitaxy. Emphasis is placed on adatom migration and incorporation on GaAs (001) substrates during the growth of GaAs, a comparison with equivalent growth effects on (110) and (111)A oriented substrates, and the influence of mismatch and substrate orientation on growth mode and strain relaxation in the InAs/GaAs system. A brief indication of surface segregation behaviour is also included. © 1995.

    DOI: 10.1016/0921-5107(94)09003-3

  • Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering

    D. W. Kisker, G. B. Stephenson, I. Kamiya, P. H. Fuoss, D. E. Aspnes, L. Mantese, S. Brennan

    physica status solidi (a)   152   9 - 21   1995.1 (   ISSN:0031-8965 )

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    In this work, in‐situ grazing incidence X‐ray scattering is used to correlate surface structures observed during organometallic vapor phase growth of GaAs with in‐situ optical measurements using reflectance difference spectroscopy (RDS). Our observations of several reconstructions confirm that RDS signals vary among the different surfaces present under vapor phase epitaxy conditions, as also occurs under ultra‐high vacuum growth conditions. In addition, the simultaneous observation of intensity oscillations in the X‐ray scattering signal and the reflectance difference signal indicates that both of these techniques can be used to monitor layer‐by‐layer growth processes under some conditions. Copyright © 1995 WILEY‐VCH Verlag GmbH &amp; Co. KGaA

    DOI: 10.1002/pssa.2211520102

  • THE NUCLEATION AND GROWTH BY MOLECULAR-BEAM EPITAXY OF INAS ON GAAS(110) MISORIENTED SUBSTRATES

    XM ZHANG, DW PASHLEY, KAMIYA, I, JH NEAVE, BA JOYCE

    JOURNAL OF CRYSTAL GROWTH   147 ( 1-2 )   234 - 237   1995.1 (   ISSN:0022-0248 )

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    Molecular beam epitaxy (MBE) growth of GaAs buffer layer and subsequent deposition of InAs layers on GaAs (110) misoriented by 1.5 degrees towards (111) A are studied using transmission electron microscopy. The observations show that step bunching occurred during the buffer layer growth. InAs is found to nucleate and grow on the bunched step edges.

    DOI: 10.1016/0022-0248(95)00736-9

  • Metalorganic vapour phase epitaxial growth on vicinal GaAs (001) surfaces studied by reflectance anisotropy spectroscopy

    K. Ploska, M. Pristovsek, W. Richter, J. Jönsson, I. Kamiya, J. ‐T Zettler

    physica status solidi (a)   152 ( 1 )   49 - 59   1995 (   ISSN:1521-396X )

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    Structure and growth dynamics of vicinal GaAs (001) surfaces during metalorganic vapour phase epitaxy (MOVPE) are studied using reflectance anisotropy/difference spectroscopy (RAS or RDS). Spectra at different temperatures from (001)‐surfaces tilted with angles between 0° and 6° towards the [110]‐ or [110]‐axis are compared to those taken from nominally untilted (singular) surfaces. Under AsH3 stabilized conditions singular surfaces show c(4×4)‐like RAS spectra for temperatures up to around 900 K. This type of spectrum is only observed at lower temperatures for vicinal surfaces. At higher temperatures RAS spectra which are characteristic of Ga dimer formation are obtained. The temperature at which this change from an As dimer‐ to a Ga dimer‐dominated spectrum occurs, decreases with increasing misorientation angle and thus increasing number of steps. These results strongly indicate that there is an arsenic deficiency at steps resulting in formation of Ga dimers. Similarly, spectra during growth of vicinal surfaces show enhanced coverage with Ga dimers compared to those of singular surfaces. Growth kinetics, however, does not seem to be influenced by the presence of steps. The growth dynamics are studied in dependence of the misorientation by time‐resolved RAS measurements. RAS monolayer oscillations are observed only for misorientations up to 2°. The temperature, above which the oscillations disappear, decreases with increasing misorientation. This confirms that the upper temperature limit for the existence of MOVPE‐RAS growth oscillations is given by the transition from island‐ to step flow‐growth mode. In contrast to typical molecular beam epitaxy (MBE) growth large diffusion lengths need to be assumed in MOVPE but the differences between different misorientation directions turn out to be small. Copyright © 1995 WILEY‐VCH Verlag GmbH &amp
    Co. KGaA

    DOI: 10.1002/pssa.2211520105

  • The growth of InAs layers on vicinal GaAs (110) substrates by MBE Reviewed

    Zhang, X, DW Pashley, JH Neave, Kamiya, I, BA Joyce

    MICROSCOPY OF SEMICONDUCTING MATERIALS 1995   146   219 - 222   1995 (   ISSN:0951-3248 )

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    InAs layers of different layer thicknesses grown on GaAs (110) with an off cut of 1.5 degrees towards (111)A were studied by TEM. It was found that at the early stage of growth, InAs preferentially deposited along the step edges forming elongated strips along [110] direction on the surface. The cross-sections showed that as the layer thickness increased, the width of InAs strips expanded on both the upper and lower terraces, although predominantly the latter. The complete coverage of the GaAs surface occurred when the InAs strips coalesced laterally.

  • Reflection high-energy electron diffraction intensity oscillations during growth of (Al,Ga)As on GaAs(111)A

    K. Sato, M. R. Fahy, I. Kamiya, J. H. Neave, B. A. Joyce

    Journal of Crystal Growth   150   77 - 80   1995 (   ISSN:0022-0248 )

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    We have made a reflection high-energy diffraction (RHEED) intensity oscillation study of the growth of (Al,Ga)As on GaAs and (Al,Ga)As (111)A surfaces. The RHEED intensity oscillations during growth of (Al,Ga)As are dependent on both growth temperature and As4:Ga flux ratio. In addition, the oscillation period decreases as the Al fraction in the (Al,Ga)As is increased. Changes in the oscillation period during growth of the first few monolayers of both GaAs on (Al,Ga)As and (Al,Ga)As on GaAs may indicate the intermixing of Al and Ga near the heterointerface. © 1995, All rights reserved.

    DOI: 10.1016/0022-0248(95)80184-E

  • Reflection high-energy electron diffraction intensity oscillations during growth of (Al,Ga)As on GaAs(111)A

    K. Sato, M. R. Fahy, I. Kamiya, J. H. Neave, B. A. Joyce

    Journal of Crystal Growth   150   77 - 80   1995 (   ISSN:0022-0248 )

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    We have made a reflection high-energy diffraction (RHEED) intensity oscillation study of the growth of (Al,Ga)As on GaAs and (Al,Ga)As (111)A surfaces. The RHEED intensity oscillations during growth of (Al,Ga)As are dependent on both growth temperature and As4:Ga flux ratio. In addition, the oscillation period decreases as the Al fraction in the (Al,Ga)As is increased. Changes in the oscillation period during growth of the first few monolayers of both GaAs on (Al,Ga)As and (Al,Ga)As on GaAs may indicate the intermixing of Al and Ga near the heterointerface. © 1995, All rights reserved.

    DOI: 10.1016/0022-0248(95)80184-E

  • REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) INTENSITY OSCILLATIONS - GROWTH MODES AND GROWTH-RATES - A CRITIQUE Reviewed International coauthorship

    BA JOYCE, XM ZHANG, JH NEAVE, PN FAWCETT, MR FAHY, K SATO, KAMIYA, I

    SCANNING MICROSCOPY   8 ( 4 )   913 - 924   1994 (   ISSN:0891-7035 )

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    The origin of and diffraction effects associated with reflection high energy electron diffraction (RHEED) intensity oscillations which occur during layer-by-layer growth of epitaxial thin films of III-V compounds by molecular beam epitaxy (MBE) are explained. It is shown that on (001) oriented substrates the period of the oscillations is in general a direct measure of the film growth rate which corresponds to the group III element flux. There are, however, exceptions to this simple concept including growth under group III rich-conditions, vicinal plane growth and growth from pulsed beams; each is considered.
    On non-(001) low index orientations, the RHEED oscillation period only provides a measure of the growth rate over a very limited range of conditions. The fundamental reason appears to be the more restricted reactivity between the group III and V elements, so the oscillations are induced by the group V element, not the group III, which is quite different from (001) surfaces, at least for conventional growth conditions.
    Finally, growth modes and strain relaxation differences between (001) and (110)-based growth of InAs on GaAs are illustrated. It is shown that there is no real relationship between strain and growth mode and it is suggested that adatom mobility is the essential parameter which determines growth mode.
    In more general terms, it appears that kinetic factors rather than equilibrium considerations are responsible for the growth mode. Models based on purely equilibrium concepts are therefore unlikely to have general validity.

  • OPTICAL MONITORING OF GROWTH SURFACES - REFLECTANCE-DIFFERENCE SPECTROSCOPY Reviewed International coauthorship

    KAMIYA, I

    SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS   620 - 623   1994 (   ISSN:1092-8669 )

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    Due to the recent development of optical probes, monitoring of surface structures during organometallic chemical vapor deposition (OMCVD) has now become possible. Reflectance-difference spectroscopy (RDS) revealed that the (001)GaAs surface under OMCVD conditions reconstructs into structures similar or identical to those that occur in ultrahigh vacuum as encountered during molecular beam epitaxy (MBE). Here, I review recent real-time studies on the OMCVD and MBE growth using RDS and complementary techniques such as grazing-incidence x-ray scattering.

  • Relationship among reflectance-difference spectroscopy, surface photoabsorption, and spectroellipsometry

    K. Hingerl, D. E. Aspnes, I. Kamiya, L. T. Florez

    Applied Physics Letters   63   885 - 887   1993.12 (   ISSN:0003-6951 )

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    From the reflectance expressions for a thin biaxial layer on an isotropic substrate we relate reflectance-difference spectroscopy (RDS), surface photoabsorption (SPA), and spectroellipsometry. Using these results and our recently acquired RD database, we determine surface reconstructions present during flow-modulated organometallic chemical vapor growth of epitaxial GaAs from SPA data that were published by others.

    DOI: 10.1063/1.109890

  • STRUCTURE OF (001) GAAS-SURFACES DURING EPITAXIAL-GROWTH BY ORGANOMETALLIC CHEMICAL-VAPOR-DEPOSITION Reviewed International coauthorship

    KAMIYA, I, H TANAKA, DE ASPNES, M KOZA, R BHAT

    APPLIED PHYSICS LETTERS   63 ( 23 )   3206 - 3208   1993.12 (   ISSN:0003-6951 )

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    Under typical atmospheric pressure (AP) organometallic chemical vapor deposition (OMCVD) growth conditions with trimethylgallium (TMG) and arsine sources, reflectance-difference (RD) spectra show that the (001) GaAs surface is in the d(4 X 4)-like state. With sufficiently high TMG and low AsH3 exposures, we observe RD spectra similar to those obtained during atomic layer epitaxy (ALE) at lower temperatures.

    DOI: 10.1063/1.110200

  • OBSERVATION OF COUPLED LO PHONON-INTERSUBBAND PLASMON MODES IN GASB INAS QUANTUM-WELLS BY RESONANT RAMAN-SCATTERING

    YB LI, TSOUKALA, V, RA STRADLING, RL WILLIAMS, SJ CHUNG, KAMIYA, I, AG NORMAN

    SEMICONDUCTOR SCIENCE AND TECHNOLOGY   8 ( 12 )   2205 - 2209   1993.12 (   ISSN:0268-1242   eISSN:1361-6641 )

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    Two new peaks are observed in resonant Raman scattering from GaSb/InAs quantum wells grown on (001) GaAs by MBE. These two lines are assigned to the coupled LO phonon intersubband plasmon modes originating from the InAs wells. The lower-frequency branch of the coupled system (L- mode) lies between the Lo and the TO frequencies of InAs, and the line intensity depends strongly on the two-dimensional carrier concentration and the laser excitation energies (resonant near the E1 gap of InAs). The L+ line is weak and relatively broad. Its frequency increases with increasing carrier concentration in the InAs wells and is not observed when the carrier concentration is low.

    DOI: 10.1088/0268-1242/8/12/029

  • SURFACE RECONSTRUCTION OF GAAS (001) DURING OMCVD GROWTH Reviewed

    KAMIYA, I, DE ASPNES, H TANAKA, LT FLOREZ, MA KOZA, R BHAT, JP HARBISON

    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES   344 ( 1673 )   443 - 452   1993.9 (   ISSN:0962-8428 )

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    Surface reconstruction of GaAs (001) during organometallic chemical vapour deposition (OMCVD) growth has been investigated with reflectance-difference spectroscopy (RDS). RD spectra reveal that surface reconstructions similar or identical to (4 x 2), (2 x 4), and c(4 x 4) that occur on surface prepared by molecular beam epitaxy (MBE) in ultrahigh vacuum (UHV) occur even in atmospheric pressure OMCVD growth environments. Based on the RDS database we established on static surfaces in UHV, we studied the structure of surfaces under both static and dynamic conditions in non-UHV ambients. We find, in contrast to previous models, that the surfaces under various non-UHV conditions exhibit dimer formation. In addition, OMCVD growth and atomic layer epitaxy (ALE) typically occur under disordered c(4 x 4)[d(4 x 4)]-like conditions where the surface is terminated by multilayers of As. When trimethylgallium (TMG) and arsine (AsH3) are supplied simultaneously, the surface structure varies as a function of the supply rates of TMG and AsH3, and the substrate temperature.

  • REAL-TIME OPTICAL DIAGNOSTICS FOR MEASURING AND CONTROLLING EPITAXIAL-GROWTH

    DE ASPNES, KAMIYA, I, H TANAKA, R BHAT, LT FLOREZ, JP HARBISON, WE QUINN, M TAMARGO, S GREGORY, MAA PUDENZI, SA SCHWARZ, MJSP BRASIL, RE NAHORY

    THIN SOLID FILMS   225 ( 1-2 )   26 - 31   1993.3 (   ISSN:0040-6090 )

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    We summarize recent applications of two real-time optical diagnostic techniques, reflectance difference spectroscopy (RDS) and spectroellipsometry (SE), to epitaxial growth on GaAs and atomic layer epitaxy (ALE) in particular. Using RDS, we obtain the first real-time spectroscopic data of the evolution of the (001) GaAs surface to cyclic and non-cycle exposures of atmospheric pressure H-2, H-2 and trimethylgallium, and H-2 and arsine, which simulate growth by ALE. None of our observations is consistent with any previously proposed simple model, emphasizing the necessity of real-time measurements for the analysis of complex surface reactions. Using SE we have constructed a closed-loop system for controlling the compositions of AlxGa1-x As layers grown by chemical beam epitaxy. We have produced various graded-compositional structures, including parabolic quantum wells 200 angstrom wide where the composition was controlled by analysis of the running outermost 3 angstrom (about 1 monolayer) of depositing material.

    DOI: 10.1016/0040-6090(93)90121-5

  • REFLECTANCE-DIFFERENCE SPECTROSCOPY OF (001) GAAS-SURFACES IN ULTRAHIGH-VACUUM Reviewed

    KAMIYA, I, DE ASPNES, LT FLOREZ, JP HARBISON

    PHYSICAL REVIEW B   46 ( 24 )   15894 - 15904   1992.12 (   ISSN:2469-9950   eISSN:2469-9969 )

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    Reflectance-difference spectroscopy (RDS) is employed to study in situ the (4 X 2), (1 X 6), (4 x 6), (3 X 1), (2 X 4)-alpha, (2 X 4)-beta, (2 X 4)-gamma, c (4 X 4), and d (4 X 4) reconstructions of (001) GRAS surfaces prepared in ultrahigh vacuum (UHV) by molecular-beam epitaxy and simultaneously characterized by reflection high-energy electron diffraction (RHEED). Reproducibility of the data is excellent. With the aid of previous theoretical calculations, we interpret characteristic spectral features at 1.9, 2.6, and 4.2 eV in terms of electronic excitations involving surface dimers of Ga, As, and As, respectively. Because RD couples to local electronic structure rather than to long-range order, RD spectra not only determine surface reconstructions but also provide details not accessible by RHEED, such as the existence of As dimers in the (1 X 6), (4 X 6), and (3 X 1) reconstructions and of the fractional coverage within a given reconstruction. Our data show that the (3 X 1), (1 X 6), and (4 X 6) reconstructions are at least partly determined by kinetics, since they can only be obtained by following specific heating or cooling procedures under very low AS4 flux. More generally, it is possible to employ this optical technique to determine surface atomic and electronic structure. Because RD spectra can be obtained with the surface in any transparent ambient, the database that we have established here provides a new approach for elucidating surface reconstructions of (001) GaAs and hence the dynamics of surface reactions in non-UHV environments.

  • DIMER FORMATION ON (001) GAAS UNDER ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITION GROWTH-CONDITIONS Reviewed

    KAMIYA, I, DE ASPNES, H TANAKA, LT FLOREZ, JP HARBISON, R BHAT

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   10 ( 4 )   1716 - 1719   1992.7 (   ISSN:1071-1023 )

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    We report the first evidence of dimer formation on semiconductor surfaces under atmospheric Pressure (AP) conditions. We successfully employ reflectance-difference spectroscopy to link structures of well-defined (001) GaAs surfaces prepared in ultrahigh vacuum (UHV) by molecular-beam epitaxy with structures of (001) GaAs surfaces prepared in AP by organometallic chemical vapor deposition (OMCVD). These measurements reveal that surface reconstructions also occur under AP-OMCVD conditions, forming structures similar, possibly identical, to the (4 X 2), (2 X 4), c(4 X 4), and disordered c(4 X 4), that occur in UHV. Our results provide a justification for applying the results of UHV studies of these surfaces to non-UHV environments and yield new insights on the mechanisms and kinetics of non-UHV growth.

  • ATOMIC LAYER EPITAXY ON (001) GAAS - REAL-TIME SPECTROSCOPY Reviewed

    DE ASPNES, KAMIYA, I, H TANAKA, R BHAT

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   10 ( 4 )   1725 - 1729   1992.7 (   ISSN:1071-1023 )

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    Using reflectance-difference spectroscopy, we perform the first real-time spectroscopic investigation of the evolution of the (001) GaAs surface to cyclic and noncyclic exposures to atmospheric pressure H-2, H-2 and trimethylgallium, and H-2 and AsH3 that simulate growth by atomic layer epitaxy. None of our observations are consistent with any previously proposed simple model. The results emphasize the necessity of real-time measurements for the analysis of complex surface reactions.

  • OPTICALLY MONITORING AND CONTROLLING EPITAXIAL-GROWTH

    DE ASPNES, R BHAT, C CANEAU, E COLAS, LT FLOREZ, S GREGORY, JP HARBISON, KAMIYA, I, VG KERAMIDAS, MA KOZA, MAA PUDENZI, WE QUINN, SA SCHWARZ, MC TAMARGO, H TANAKA

    JOURNAL OF CRYSTAL GROWTH   120 ( 1-4 )   71 - 77   1992.5 (   ISSN:0022-0248 )

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    We provide a perspective on current capabilities for optically monitoring and controlling epitaxial growth, and discuss examples taken from recent work at Bellcore.

    DOI: 10.1016/0022-0248(92)90366-Q

  • Dynamic Monitoring of the Growth Modes of Ag on the Si(111) Surface Reviewed

    M. Katayama, M. J. Ramstad, I. Kamiya, M. Aono

    第14巻,148-151/,   1992.4

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  • INSITU DETERMINATION OF FREE-CARRIER CONCENTRATIONS BY REFLECTANCE DIFFERENCE SPECTROSCOPY

    H TANAKA, E COLAS, KAMIYA, I, DE ASPNES, R BHAT

    APPLIED PHYSICS LETTERS   59 ( 26 )   3443 - 3445   1991.12 (   ISSN:0003-6951 )

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    We determine types and concentrations of free carriers in GaAs layers under organometallic chemical vapor deposition growth conditions from the linear electro-optic structure observed near 3 eV in reflectance-difference spectroscopy. The sensitivity is about 10(17) cm-3 at 400-degrees-C and 10(18) cm-3 at 600-degrees-C, sufficient to measure common doping levels at or near growth temperatures. We observed the transition between n- and p-type doping during atomic layer epitaxy of a carbon-doped p-type layer on an n-type substrate at 470-degrees-C.

    DOI: 10.1063/1.105672

  • OPTICAL SPECTROSCOPY OF (001) GAAS AND ALAS UNDER MOLECULAR-BEAM EPITAXY GROWTH-CONDITIONS

    M WASSERMEIER, KAMIYA, I, DE ASPNES, LT FLOREZ, JP HARBISON, PM PETROFF

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   9 ( 4 )   2263 - 2267   1991.7 (   ISSN:1071-1023 )

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    Reflectance-difference (RD) studies were performed on variously reconstructed (001) GaAs and AlAs surfaces. The spectra of the (2 X 4) and (4 X 2) reconstructions on (001) GaAs show prominent features due to electronic transitions between lone-pair orbitals and dimer states, as previously identified by theoretical calculations. The spectra of the c(4 X 4) reconstructions on (001) GaAs and AlAs show similar features that we also interpret in terms of surface dimer excitations. These dimer features provide a capability of obtaining real-time, in situ information of dynamics on polar surfaces.

    DOI: 10.1116/1.585731

  • ATOM-PROBE STUDY OF THE INITIAL-STAGE OF SELECTIVE OXIDATION OF NI FROM THE CU-NI ALLOY SYSTEM

    K HONO, T IWATA, M NAKAMURA, HW PICKERING, KAMIYA, I, T SAKURAI

    SURFACE SCIENCE   245 ( 1-2 )   132 - 149   1991.4 (   ISSN:0039-6028 )

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    The initial oxidation stages of Ni and Ni-Cu alloys have been studied using the atom-probe field ion microscope (AP-FIM). Oxide layers were formed in situ in the FIM chamber on the clean metal surfaces at 1 x 10(-4) Torr (10(-2) Pa) O2 at 870, 970 or 1070 K for less than 1 min. The atom-probe analysis on the {111} and {100} surfaces of these oxidized alloys showed that only NiO formed on all of the alloys for this relatively low oxygen partial pressure, although incipient Cu2O formation could not be ruled out in a few samples of the Cu-rich alloys. The concentration of oxygen in the NiO fluctuated layer-by-layer in the &lt;111&gt; direction as expected for its NaCl-type structure. Ne field ion images and atom-probe analyses of the oxidized samples revealed a sharp NiO/metal interface for pure Ni and for the Cu-rich alloys, and a diffuse interface extending over a few atomic layers for the Ni-rich alloys. The NiO and Ni were cube/cube oriented.

    DOI: 10.1016/0039-6028(91)90474-7

  • REAL-TIME OPTICAL DIAGNOSTICS FOR MEASURING AND CONTROLLING EPITAXIAL-GROWTH Reviewed

    DE ASPNES, R BHAT, E COLAS, LT FLOREZ, S GREGORY, JP HARBISON, KAMIYA, I, WE QUINN, SA SCHWARZ, H TANAKA, M WASSERMEIER

    ATOMIC LAYER GROWTH AND PROCESSING   222   63 - 73   1991

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  • Real-Time Monitoring of the Nucleation and Growth of Ag Crystallites on Si(111) Reviewed

    M. Katayama, M. J. Ramstad, I. Kamiya, E. Nomura, M. Aono

    第12巻,137-140/,   1990.4

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  • FIELD ION-SCANNING TUNNELING MICROSCOPY OF ALKALI-METAL ADSORPTION ON THE SI(100) SURFACE

    T HASHIZUME, Y HASEGAWA, KAMIYA, I, T IDE, SUMITA, I, S HYODO, T SAKURAI, H TOCHIHARA, M KUBOTA, Y MURATA

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   8 ( 1 )   233 - 237   1990.1 (   ISSN:0734-2101 )

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    We have constructed a scanning tunneling microscope (STM) equipped with a field ion microscope (FIM), by which one can monitor and shape the STM probe tip on an atomic scale in situ in the STM chamber. Taking advantage of a well-defined tip prepared by a FIM, we have greatly improved the stability and reproducibility of the performance of the STM. Li and K adsorption on the Si(001) 2x1 surface has been investigated by field ion-scanning tunneling microscopy (FI-STM). The STM images have shown that at the initial stage of adsorption, Li (K) atoms (1) adsorb on top of one of the dimer-forming Si surface atoms and (2) stabilize the asymmetric (buckled) dimerization, and (3) form linear chains, perpendicular to the substrate 2x1 dimer rows. Our observations suggest that alkali metal adsorption on the Si(001) 2x1 surface may be significantly different from the conclusions of earlier reports. © 1990, American Vacuum Society. All rights reserved.

    DOI: 10.1116/1.577073

  • ATOMIC-HYDROGEN CHEMISORPTION ON THE SI(111)7X7 SURFACE

    T SAKURAI, Y HASEGAWA, T HASHIZUME, KAMIYA, I, T IDE, SUMITA, I, HW PICKERING, S HYODO

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   8 ( 1 )   259 - 261   1990.1 (   ISSN:0734-2101 )

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    Chemisorption of atomic hydrogen on the Si (111)7x7 surface was investigated using scanning tunneling microscopy. Contrary to the recent report by Golovchenko’s group that the monohydride phase is not stable even at room temperature, resulting in the formation of the trihydride phase, our scanning tunneling microscopy (STM) experiment has shown that the monohydride phase is indeed the stable phase on the clean Si (111) 7x7 surface. © 1990, American Vacuum Society. All rights reserved.

    DOI: 10.1116/1.577080

  • CLUSTER FORMATION OF LI ON THE SI(111)7X7 SURFACE

    Y HASEGAWA, KAMIYA, I, T HASHIZUME, T SAKURAI, H TOCHIHARA, M KUBOTA, Y MURATA

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   8 ( 1 )   238 - 240   1990.1 (   ISSN:0734-2101 )

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    Using a field ion-scanning tunneling microscope (FI-STM), the adsorption process of Li on the Si(111) 7 X 7 surface has been studied. At the initial stage, trimers are formed preferentially in the faulted half of the 7 X 7 unit cell. At higher coverages, these trimers coalesce to form six-atom and nine-atom clusters across the interface between the faulted and unfaulted halves. It is suggested, based on the careful study of the adsorption sites, that the Si adatoms of the dimer-adatom-stacking fault (DAS) model may be removed upon the Li adsorption. © 1990, American Vacuum Society. All rights reserved.

    DOI: 10.1116/1.577074

  • NEW VERSATILE ROOM-TEMPERATURE FIELD-ION SCANNING TUNNELING MICROSCOPY

    T SAKURAI, T HASHIZUME, Y HASEGAWA, KAMIYA, I, N SANO, K YOKOYAMA, H TANAKA, SUMITA, I, S HYODO

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   8 ( 1 )   324 - 326   1990.1 (   ISSN:0734-2101 )

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    We have designed and developed a series of room-temperature field ion scanning tunneling microscopes (RT FI-STMs). The great advantages of the RT FI-STM are (1) almost simultaneous use of both the STM mode and FIM mode is possible without wasting machine time and thermal drift; (2) inspection and manipulation of a STM tip in situ in the STM system can be performed and, thus, each tip can be used over several months, maintaining a desired atomic resolution; and (3) a well-characterized tip ensures a very high (—100%) success rate in STM imaging with a known resolution. Several examples are given. © 1990, American Vacuum Society. All rights reserved.

    DOI: 10.1116/1.577098

  • FIELD ION-SCANNING TUNNELING MICROSCOPY

    T SAKURAI, T HASHIZUME, KAMIYA, I, Y HASEGAWA, N SANO, HW PICKERING, A SAKAI

    PROGRESS IN SURFACE SCIENCE   33 ( 1 )   3 - 89   1990 (   ISSN:0079-6816 )

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    A scanning tunneling microscope combined with a field ion microscope, which we call &quot;FI-STM&quot; has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument. © 1990.

    DOI: 10.1016/0079-6816(90)90012-9

  • Adsorption of Li (K) on the Si(001)-(2×1) surface: Scanning-tunneling-microscopy study

    Yukio Hasegawa, I. Kamiya, T. Hashizume, T. Sakurai, H. Tochihara, M. Kubota, Y. Murata

    Physical Review B   41 ( 14 )   9688 - 9691   1990 (   ISSN:0163-1829 )

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    Li and K adsorption on the Si(001)-(2×1) surface have been investigated by use of scanning tunneling microscopy (STM). We found that, at the initial stage of adsorption, Li (K) atoms (1) adsorb on top of one of the dimer-forming Si atoms to form covalentlike directional bonds with Si atoms and tend to stabilize asymmetric (buckled) dimerization, and (2) form linear chains, perpendicular to the substrate dimer rows. Our STM results are significantly different from the conclusions of earlier reports. © 1990 The American Physical Society.

    DOI: 10.1103/PhysRevB.41.9688

  • DEVELOPMENT OF THE FIELD-ION SCANNING TUNNELING MICROSCOPE AND ITS APPLICATIONS Reviewed

    KAMIYA, I, T SAKURAI

    JOURNAL DE PHYSIQUE   50 ( C8 )   C8491 - C8495   1989.11 (   ISSN:0302-0738 )

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  • SCANNING TUNNELING MICROSCOPY STUDY OF ALKALI-METAL ADSORPTION ON THE SI(001) 2X1 SURFACE Reviewed

    Y HASEGAWA, T HASHIZUME, KAMIYA, I, T IDE, SUMITA, I, S HYODO, T SAKURAI, H TOCHIHARA, M KUBOTA, Y MURATA

    JOURNAL DE PHYSIQUE   50 ( C8 )   C8229 - C8234   1989.11 (   ISSN:0302-0738 )

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  • CONSTRUCTION OF R T FI-STMS AND ITS APPLICATIONS Reviewed

    T HASHIZUME, Y HASEGAWA, KAMIYA, I, N SANO, K YOKOYAMA, H TANAKA, SUMITA, I, M TAKAO, S HYODO, T SAKURAI

    JOURNAL DE PHYSIQUE   50 ( C8 )   C8513 - C8517   1989.11 (   ISSN:0302-0738 )

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  • SCANNING TUNNELING MICROSCOPE EQUIPPED WITH A FIELD-ION MICROSCOPE

    T SAKURAI, T HASHIZUME, KAMIYA, I, Y HASEGAWA, T IDE, M MIYAO, SUMITA, I, A SAKAI, S HYODO

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   7 ( 3 )   1684 - 1688   1989.5 (   ISSN:0734-2101 )

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    DOI: 10.1116/1.576070

  • OXYGEN SEGREGATION AND OXIDATION ON A COPPER SURFACE

    K HONO, HW PICKERING, T HASHIZUME, KAMIYA, I, T SAKURAI

    SURFACE SCIENCE   213 ( 1 )   90 - 102   1989.4 (   ISSN:0039-6028 )

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    The atom-probe field ion microscope was employed to study oxygen adsorption and oxidation on surfaces of two grades of copper: low-grade tough-pitch copper (99.9%) and high purity copper (99.999%). The source of the oxygen is the Cu2O inclusions which were present in the low-grade tough-pitch copper. The 99.9% grade copper was annealed in ultra-high vacuum (UHV). During heating the Cu2O inclusions dissolve and the oxygen content of the matrix increases. Surface enrichment of oxygen and oxide formation on the surface were found depending on the annealing conditions. No indication of oxidation and oxygen enrichment was found in the high purity copper (99.999%) under the same UHV conditions. © 1989.

    DOI: 10.1016/0039-6028(89)90253-7

  • COMBINED FIELD-ION AND SCANNING TUNNELING MICROSCOPE Reviewed

    T SAKURAI, T HASHIZUME, KAMIYA, I, Y HASEGAWA, J MATSUI, S TAKAHASHI, E KONO, M OGAWA

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS   6 ( 3 )   803 - 804   1988.5 (   ISSN:0734-2101 )

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    DOI: 10.1116/1.575128

  • Preferential Sputtering in Dilute Cu-Ni Alloys Reviewed International coauthorship

    I. Kamiya, T. M. Buck, T. Sakurai, C. H. Patterson

    Nucl. Inst. & Meth. B   3 ( 1-4 )   479 - 481   1988 (   ISSN:0168-583X )

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    DOI: 10.1016/0168-583X(88)90611-8

  • Summary Abstract: Combined field ion and scanning tunneling microscope

    T. Sakurai, T. Hashizume, I. Kamiya, Y. Hasegawa, S. Takahashi, J. Matsui, E. Kono, M. Ogawa

    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films   6 ( 3 )   803 - 804   1988 (   ISSN:1520-8559 )

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    DOI: 10.1116/1.575128

  • COMBINED FIELD-ION AND SCANNING TUNNELING MICROSCOPE Reviewed

    T SAKURAI, T HASHIZUME, KAMIYA, I, Y HASEGAWA, A SAKAI, A KOBAYASHI, J MATSUI, S TAKAHASHI, E KONO, H WATANABE

    JOURNAL DE PHYSIQUE   48 ( C-6 )   79 - 84   1987.11 (   ISSN:0302-0738 )

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  • CHEMISORPTION INDUCED SURFACE SEGREGATION IN CU-NI ALLOYS Reviewed International coauthorship

    KAMIYA, I, T HASHIZUME, A SAKAI, T SAKURAI, HW PICKERING

    JOURNAL DE PHYSIQUE   47 ( C-7 )   195 - 199   1986.11 (   ISSN:0302-0738 )

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MISC

  • 半導体素子及びその製造方法

    神谷格、モハンマディ・ハニフ

    特願   2023 ( 005146 )   2023.1

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  • Density Control of InAs Quantum Dots by Submonolayer Growth

    平墳直, ROCA Ronel C., 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   83rd   2022 (   ISSN:2758-4704 )

  • The Influence of As Flux on GaAs Capping of InAs Quantum Dots on GaAs (001)

    若原夏希, ROCA Ronel C., 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   83rd   2022 (   ISSN:2758-4704 )

  • Control of quantum structures by the thickness of GaAs spacer layer during stacked submonolayer growth

    奥泉陽斗, ROCA Ronel Christian I., 神谷格

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   69th   2022 (   ISSN:2436-7613 )

  • Initial process of GaAs capping on InAs quantum dots on GaAs (001)

    若原夏希, ROCA Ronel C., 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   82nd   2021 (   ISSN:2758-4704 )

  • 積層InAs量子ドットの歪制御による発光特性の変化

    鈴木幹人, 下村憲一, 神谷格

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   65th   2018 (   ISSN:2436-7613 )

  • InAs/GaAsサブモノレイヤー結晶成長の機構と制御

    水野皓登, ZHANG Yuwei, 神谷格

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   65th   2018 (   ISSN:2436-7613 )

  • コアシェル型酸化亜鉛ナノ粒子の作製と評価

    後藤直輝, 奥山竜太, 山田郁彦, 神谷格

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   65th   2018 (   ISSN:2436-7613 )

  • サブモノレイヤーInAs層を介した光アップコンバージョン

    水野皓登, ZHANG Yuwei, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   79th   2018 (   ISSN:2758-4704 )

  • 変調中間層による歪制御積層InAs量子ドット形状の変化

    鈴木幹人, 下村憲一, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   79th   2018 (   ISSN:2758-4704 )

  • 短パルスレーザを用いた高効率深紫外LED実現の為のp‐AlGaNのドーパント高活性化,並びに低抵抗電極の形成法の開発

    神谷格

    天田財団助成研究成果報告書   30   174‐176   2017.12

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  • 光制御下における結晶p型Si/ITO界面の断面仕事関数測定

    山田郁彦, 神岡武文, 大下祥雄, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   78th   2017 (   ISSN:2758-4704 )

  • KFMを用いたInAs量子ドット表面近傍のバンド解析

    小林知弘, 高林紘, 下村憲一, ZHANG Yuwei, 山田郁彦, 神谷格

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   64th   2017 (   ISSN:2436-7613 )

  • MgドープGaNのレーザー誘起による活性化とその局所制御

    松本滉大, 黒瀬範子, 下野貴史, 岩田直高, 山田郁彦, 神谷格, 青柳克信

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   78th   2017 (   ISSN:2758-4704 )

  • 太陽電池評価に適した光照射が可能なAFM/KFM装置の開発

    山田郁彦, 神岡武文, 大下祥雄, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   77th   2016 (   ISSN:2758-4704 )

  • SiドープによるInAs量子ドットの仕事関数変化

    小林知弘, 高林紘, 下村憲一, ZHANG Yuwei, 山田郁彦, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   77th   2016 (   ISSN:2758-4704 )

  • 結晶Si太陽電池の断面仕事関数測定に適した観察面研磨手法の検討

    山田郁彦, 神岡武文, 大下祥雄, 神谷格, 須田耕平, 中村京太郎, 小椋厚志

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   76th   2015 (   ISSN:2758-4704 )

  • フェムト秒光電流分光によるInAs量子構造のキャリアアップコンバージョン過程と電子・正孔寿命の決定

    山田泰裕, TEX David M., TEX David M., 神谷格, 金光義彦, 金光義彦

    日本物理学会講演概要集   69 ( 2 )   2014 (   ISSN:1342-8349 )

  • GaAs(001)上のInAs量子ドットの1.55μm以上での発光

    下村憲一, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   75th   2014 (   ISSN:2758-4704 )

  • GaAs基板の傾斜方向がInGaAs膜中緩和過程に与える影響-X線回折その場観察-

    小寺大介, 佐々木拓生, 高橋正光, 鈴木秀俊, 小島信晃, 大下祥雄, 神谷格, 山口真史

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   75th   2014 (   ISSN:2758-4704 )

  • InAs量子構造を利用した中間バンド型太陽電池におけるフェムト秒時間分解光伝導測定

    山田泰裕, TEX David M., TEX David M., 神谷格, 金光義彦, 金光義彦

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   61st   2014

  • ケルビンプローブ顕微鏡を用いたSiヘテロ接合(SHJ)太陽電池における表面構造界面の局所的仕事関数測定

    山田郁彦, 神岡武文, 立花福久, 中村京太郎, 大下祥雄, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   75th   2014 (   ISSN:2758-4704 )

  • フェムト秒励起光伝導相関法によるInAs量子構造の光キャリアダイナミクス

    山田泰裕, TEX David M., TEX David M., 神谷格, 金光義彦, 金光義彦

    日本物理学会講演概要集   68 ( 2 )   2013 (   ISSN:1342-8349 )

  • KFMを用いたSi-電極界面のナノスケールにおける仕事関数測定

    山田郁彦, 吉田学, 徳久英雄, 青木真理, 伊東宇一, 住田勲勇, 関根重信, 神谷格, 大下祥雄

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   74th   2013 (   ISSN:2758-4704 )

  • XRDによるInAs量子ドット上のキャップ層成長のその場観察

    下村憲一, 鈴木秀俊, 佐々木拓生, 高橋正光, 大下祥雄, 神谷格

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   74th   2013 (   ISSN:2758-4704 )

  • その場X線回折の三次元逆格子空間マップを用いた格子不整合InGaAs/GaAs(001)の歪緩和非対称性観測

    佐々木拓生, 鈴木秀俊, 崔炳久, 高橋正光, 藤川誠司, 新船幸二, 神谷格, 大下祥雄, 山口真史

    応用物理学関係連合講演会講演予稿集(CD-ROM)   57th   ROMBUNNO.18P-TW-1   2010.3

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  • REAL-TIME STUDY OF STRAIN RELAXATION IN LATTICE-MISMATCHED INGAAS/GAAS BY X-RAY DIFFRACTION

    SASAKI TAKUO, SUZUKI HIDETOSHI, SAI AKIHISA, LEE JONG-HAN, TAKAHASI MASAMITU, FUJIKAWA SEIJI, ARAFUNE KOJI, KAMIYA ITARU, OHSHITA YOSHIO, YAMAGUCHI MASAFUMI

    Conf Rec IEEE Photovoltaic Spec Conf   34th Vol.3   2017 - 2020   2009.12 (   ISSN:0160-8371 )

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    Language:English  

    In situ real-time x-ray diffraction measurements during In 0.12Ga0.88As/GaAs(001) epitaxial growth are performed for the first time to understand the strain relaxation mechanisms in a lattice-mismatched system. The reciprocal space maps of 004 diffractions are obtained, and allow us to evaluate the evolution of residual strain and crystal quality simultaneously as a function of layer thickness. In the time evolution, we have classified five thickness ranges, and deduced the dominant dislocation behavior in each phase. ©2009 IEEE.

    DOI: 10.1109/PVSC.2009.5411191

  • その場X線回折の三次元逆格子空間マップを用いたInGaAs/GaAsの歪緩和非対称性観測

    佐々木拓生, 鈴木秀俊, SAI A, 高橋正光, 藤川誠司, 新船幸二, 神谷格, 大下祥雄, 山口真史

    応用物理学会学術講演会講演予稿集   70th ( 1 )   317   2009.9

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  • リアルタイムX線回折による格子不整合InGaAs/GaAsの歪緩和過程

    佐々木拓生, 鈴木秀俊, LEE J.H, SAI A, 高橋正光, 藤川誠司, 新船幸二, 神谷格, 大下祥雄, 山口真史

    応用物理学関係連合講演会講演予稿集   56th ( 1 )   372   2009.3

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  • Annealing effects on lattice defects in lattice mismatched InGaAS on gaas

    T. Sasaki, K. Arafune, A. Sai, Y. Ohshita, I. Kamiya, M. Yamaguchi

    Conference Record of the IEEE Photovoltaic Specialists Conference   2008.12 (   ISSN:0160-8371 )

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    Thermal annealing effects on lattice relaxations and defects were investigated in lattice-mismtached InGaAs layers on GaAs substrates. In the psudomorpic thin InGaAs layers, the lattice relaxation occurred by the annealing. In the partially relaxed thick InGaAs layers, the lattice relaxation was enhanced and the distribution of dislocation was changed. We found that the 2-step growth method was effective to reduce the residual strain and dislocation density in lattice mismatched InGaAs layers. © 2008 IEEE.

    DOI: 10.1109/PVSC.2008.4922903

  • 格子不整合系InGaAs/GaAsの低欠陥密度化とキャリア再結合評価

    佐々木拓生, 新船幸二, SAI A, 大下祥雄, 神谷格, 山口真史

    応用物理学関係連合講演会講演予稿集   55th ( 3 )   1510   2008.3

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  • 半導体量子構造の化学的作製

    神谷 格

    未来材料   6 ( 1 )   12 - 18   2006.1 (   ISSN:1346-0986 )

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  • ナノ粒子と周辺技術の発展

    神谷 格

    技術と経済   ( 457 )   44 - 52   2005.3 (   ISSN:0285-9912 )

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  • Nanoparticle-based Composites

    KAMIYA Itaru

    J. Jpn. Soc. Colour Mater.   77 ( 9 )   410 - 416   2004.9 (   ISSN:0010-180X )

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    Language:Japanese   Publisher:Japan Society of Colour Material  

    DOI: 10.4011/shikizai1937.77.410

  • 解説 ナノ粒子コンポジットの作製と物性 (特集 ナノテクで変わる高分子材料)

    神谷 格

    工業材料   51 ( 6 )   23 - 26   2003.6 (   ISSN:0452-2834 )

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  • 10.コロイド化学による半導体ナノ粒子の合成と機能化

    神谷 格

    金属   73 ( 11 )   1048 - 1051   2003 (   ISSN:0368-6337 )

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    Language:Japanese   Publisher:アグネ技術センター  

  • 特別寄稿 ナノテクノロジーと産学連携 (特集 ナノテクの世界)

    神谷 格

    技術と経済   ( 428 )   28 - 33   2002.10 (   ISSN:0285-9912 )

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  • コロイド化学による半導体ナノ粒子の合成と機能化 (特集1 粉体技術とナノテクノロジーの接点)

    神谷 格, 浅見 晴洋

    化学装置   44 ( 5 )   41 - 45   2002.5 (   ISSN:0368-4849 )

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  • Surface Science at Atmospheric Pressure-Crystal Growth of GaAs by OMCVD.

    KAMIYA Itaru

    J. Surf. Sci. Soc. Jpn.   15 ( 9 )   598 - 603   1994 (   ISSN:0388-5321 )

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    Language:Japanese   Publisher:The Surface Science Society of Japan  

    DOI: 10.1380/jsssj.15.598

  • 24a-PS-37 Real-Time Monitoring of Atomic Adsorption onto Si(111)√<3>×√<3>-Ag Surface with CAICISS

    Katayama M., Nomura E., Kato M., Kamiya I., Aono M.

    1991 ( 2 )   457 - 457   1991.3

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    Language:Japanese   Publisher:The Physical Society of Japan (JPS)  

  • 4a-PS-38 Diffusion and Nucleation in the Epitaxial Growth of Ag on Si(111)

    Ramstad M., Katayama M., Kamiya M., Nomura E., Aono M.

    1990 ( 2 )   452 - 452   1990.9

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  • Separation of Scattered Ions and Neutrals with an Acceleration Tube in CAICISS

    Katayama M., Kamiya I., Hayashi S., Soejima H., Marui T., Nomura E., Aono M.

    45 ( 2 )   409 - 409   1990.3

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  • Real-Time Monitoring of Epitaxial Growth of Ag crystallites on Si(111)

    Ramstad M. J., Katayama M., Kamiya I., Nomura E., Aono M.

    45 ( 2 )   401 - 401   1990.3

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Books

  • ナノ粒子分散系の科学と技術

    神谷 格, 他19名*(第21章「ナノ粒子の作製と電子材料への応用」)

    シーエムシー出版  2006.12  ( ISBN:978-4-8823-1664-0

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    Book type:Scholarly book

  • ナノマテリアルハンドブック ; 上巻 基礎編

    神谷 格(第5章 ナノ半導体 第6節 3.化学合成による半導体ナノ粒子,pp.411-416)

    エヌ・ティー・エス  2005.2  ( ISBN:978-4-8604-3078-8

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    Book type:Scholarly book

  • ナノ粒子・ナノペースト : 分野別

    神谷 格(第2章 ナノ粒子製造技術 第1節 半導体ナノ粒子の製造技術,pp.27-40)

    情報機構  2004.11  ( ISBN:4-901677-31-4

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  • ナノ粒子・マイクロ粒子の最先端技術

    神谷 格(第2編 微粒子・粉体の応用展開 第5章 ナノテクノロジーと微粒子 第1節 半導体ナノ粒子,pp.259-269)

    シーエムシー出版  2004.10  ( ISBN:978-4-8823-1471-4

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    Book type:Scholarly book

Presentations

  • Metal Oxide Capping of InAs Surface Quantum Dots by Atomic Layer Deposition: An Alternative Approach to Molecular Beam Epitaxy Capping Invited International conference

    Hanif Mohammadi, Ronel Christian Roca, Naotaka Iwata, and Itaru Kamiya

    23rd International Conference on Molecular Beam Epitaxy  2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • Unveiling the role of trimethylaluminum in passivating InAs surface quantum dots International conference

    Hanif Mohammadi, Ronel Christian Intal ROCA, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata, Itaru Kamiya

    International Conference on Solid State Devices and Materials (SSDM 2023)  ( Nagoya Congress Center )   2023.9 

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    Event date: 2023.9

    Presentation type:Oral presentation (general)  

  • サブモノレイヤー積層法における埋め込み量子ドット密度調節による量子構造成長制御

    奥泉 陽斗、ロカ ロネル、神谷 格

    2025年春季第72回応用物理学関係連合講演会  ( 東京理科大学野田キャンパス )   2025.3 

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    Event date: 2025.3

    Presentation type:Oral presentation (general)  

  • Control of Structural and Optical Properties of InAs/GaAs Submonolayer Nanostructures by GaAs Spacer Thickness Invited International conference

    Ronel Christian Roca and Itaru Kamiya

    SPIE Photonic West 2025  ( Moscone Center, San Francisco, USA )   2025.1 

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    Event date: 2025.1

    Presentation type:Poster presentation  

  • Carrier dynamics in 2D and 3D SML nanostructures by power-dependent PL Invited

    Ronel Intal Roca, Itaru Kamiya

    2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • サブモノレイヤー積層法における、下地層変調による量子ディスクの作製

    奥泉 陽斗、ロカ ロネル、神谷 格

    第85回応用物理学会秋季学術講演会  ( 朱鷺メッセ )   2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • Control of Structural and Optical Properties of InAs/GaAs Submonolayer Nanostructures by GaAs Spacer Thickness Invited International conference

    Ronel Christian Roca and Itaru Kamiya

    23rd International Conference on Molecular Beam Epitaxy  2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • Wavefunction Manipulation of InAs Surface Quantum Dots via Growth Parameter Adjustment: A Promising Approach for Enhanced Sensing Invited International conference

    Hanif Mohammadi, Ronel Christian Roca, and Itaru Kamiya

    23rd International Conference on Molecular Beam Epitaxy  2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • Size control of quantum discs by stacked submonolayer growth with InAs quantum dot seed Layer Invited International conference

    Haruto Okuizumi, Ronel Christian I. Roca, and Itaru Kamiya

    23rd International Conference on Molecular Beam Epitaxy  2024.9 

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    Event date: 2024.9

    Presentation type:Poster presentation  

  • InAs Surface Quantum Dot Passivation with Self-Clean-Up: Diethylzinc vs. Trimethylaluminum for Atomic Layer Deposition International conference

    Hanif Mohammadi, Ronel Christian Roca, Hyunju Lee, Yoshio Ohshita, Naotaka Iwata, and Itaru Kamiya

    23rd International Conference on Molecular Beam Epitaxy  2024.9 

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    Event date: 2024.9

    Presentation type:Oral presentation (general)  

  • Low Density 3D InAs/GaAs Submonolayer Nanostructures for Quantum Information Applications International conference

    Ronel Christian Roca and Itaru Kamiya

    Compound Semiconductor Week 2024  ( Lund University, Sweden )   2024.6 

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    Event date: 2024.6

    Presentation type:Poster presentation  

  • サブモノレイヤー積層法による量子ディスクの作製 Invited

    奥泉 陽斗、Ronel Christin Intal ROCA、神谷 格

    2024年春季第71回応用物理学関係連合講演会  ( 東京都市大学 )   2024.3 

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    Event date: 2024.3

    Presentation type:Oral presentation (general)  

  • Fine tuning InAs quantum dot growth parameters for high areal coverage and density

    2024年春季第71回応用物理学関係連合講演会  ( 東京都市大学 )   2024.3 

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    Event date: 2024.3

    Presentation type:Oral presentation (general)  

  • Spin optics in SML InAs/GaAs nanostrucutres by circularly-polarized PL

    Ronel Christin Intal ROCA, Itaru Kamiya

    71st JSAP Spring Meeting  2024.3 

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    Event date: 2024.3

    Presentation type:Poster presentation  

  • ArF excimer laser activation of Mg-doped GaN small area mesa device International conference

    Maria Emma C. Villamina, Ronel Christian Intal ROCA, Itaru Kamiya and Naotaka Iwata

    SPIE Photonic West 2024  ( Moscone Center, San Francisco, USA )   2024.1 

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    Event date: 2024.1 - 2024.2

    Presentation type:Oral presentation (general)  

  • Optical spin injection and detection in submonolayer InAs/GaAs nanostructures International conference

    Ronel Christian I. Roca and Itaru Kamiya

    SPIE Photonic West 2024  ( Moscone Center, San Francisco, USA )   2024.1 

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    Event date: 2024.1 - 2024.2

    Presentation type:Oral presentation (general)  

  • Effect of Low As Flux Annealing to the 2D-3D Transition of SML Nanostructures

    Ronel Christin Intal ROKA, Itaru Kamiya

    84th JSAP Autumn Meeting  2023.9 

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    Event date: 2023.9

    Presentation type:Poster presentation  

  • Photoluminescence Evolution of Submonolayer Nanostructures at the 2D-3D Transition International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    The 70th JSAP Spring Meeting 2023  ( 東北大学 )   2023.3  JSAP

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  • Diethylzinc passivation of InAs surface quantum dots International conference

    Hanif Mohammadi*, Ronel Christian Intal ROCA, Hyunju Lee*, 岩田 直高, 大下 祥雄, 神谷 格

    2023年春季第70回応用物理学関係連合講演会  ( 上智大学 )   2023.3  応用物理学会

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    ALDにおいて、ジエチル亜鉛を用いたInAs量子ドットのパッシベーション効果に関する報告。

  • Control of the 3D SML Nanostructure Density by Topmost InAs Cycle Amount International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    International Conference on Solid State Devices and Materials (SSDM) 2022  ( 名古屋 )   2022.9 

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  • InAs量子ドット/GaAs(001) 上GaAsキャッピングのAs fluxの影響 International conference

    若原夏希*, Ronel Christian Intal ROCA, 神谷 格

    2022年第83回応用物理学会秋季学術講演会  ( 東北大学川内北キャンパス(オンライン) )   2022.9  応用物理学会

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    MBEによるGaAs(001)上のInAs量子ドットの GaAs によるキャッピング中のAs流量等の影響に関する報告。

  • Control of the 3D Submonolayer (SML) Nanostructure Density by GaAs Spacer Thickness International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    The 83rd JSAP Autumn Meeting 2022  ( 東北大学 )   2022.9  JSAP

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  • サブモノレイヤー成長法によるInAs量子ドットの密度制御 International conference

    平墳直*, Ronel Christian Intal ROCA, 神谷 格

    2022年第83回応用物理学会秋季学術講演会  ( 東北大学川内北キャンパス(オンライン) )   2022.9  応用物理学会

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    MBEによるサブモノレイヤー積層法を用いたInAs/GaAsの成長における積層変調を用いた量子ドット密度の制御に関する報告。

  • PL enhancement of InAs surface quantum dots by ex situ DEZ/ZnO passivation capping International conference

    Hanif Mohammadi*, Ronel Christian Intal ROCA, Yuwei Zhang*, Hyunju Lee*, 岩田 直高, 大下 祥雄, 神谷 格

    2022年第83回応用物理学会秋季学術講演会  ( 東北大学川内北キャンパス(オンライン) )   2022.9  応用物理学会

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    ALD法によるDEZを用いたInAs量子ドットのパッシベーション被覆によるPL発光強度の増強に関する報告。

  • サブモノレイヤー成長法におけるGaAs膜厚による量子構造制御 International conference

    奥泉陽斗*, Ronel Christian Intal ROCA, 神谷 格

    春季第69回応用物理学関係連合講演会  ( 青山学院大学相模原キャンパス(Zoom) )   2022.3  応用物理学会

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    MBE で InAs/GaAs 交互積層するサブモノレイヤー成長法を用いて量子構造を作製する際の、GaAs 層の膜厚による構造制御の結果を報告した。

  • Luminescence of 10-stack Submonolayer InAs Nanostructures at the 2D-3D Transition International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    69th JSAP Spring Meeting 2022  ( オンライン )   2022.3  JSAP

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  • Photoluminescence enhancement of InAs surface quantum dots by Al2O3 passivation International conference

    Hanif Mohammadi*, Ronel Christian Intal ROCA, Yuwei Zhang*, Hyunji Lee*, 大下 祥雄, 岩田 直高, 神谷 格

    春季第69回応用物理学関係連合講演会  ( 青山学院大学相模原キャンパス )   2022.3  応用物理学会

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    Photoluminescence enhancement of InAs surface quantum dots by Al2O3 passivation using atomic layer deposition was reported.

  • Post-Growth Annealing of Stacked Submonolayer (SML) InAs Nanostructures International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    82nd JSAP Autumn Meeting 2021  ( Online Virtual (Nagoya, Japan) )   2021.9  JSAP

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  • GaAs(001)上InAs量子ドットのGaAsキャップ成長初期過程 International conference

    若原夏希*, Ronel Christian Intal ROCA, 神谷 格

    第82回応用物理学会秋季学術講演会  ( 名城大学(Zoom) )   2021.9  応用物理学会

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    GaAs(001)上にMBEで成長されるInAs量子ドットについて、GaAsで被覆する際の初期過程で相互拡散や歪による形状変化と電子物性を検討した結果を報告した。

  • Long wavelength PL of InAs surface quantum dots enhanced by underlying reservoirs International conference

    Hanif Mohammadi*, Ronel Christian Intal ROCA, 神谷 格

    第82回応用物理学会秋季学術講演会  ( 名城大学(Zoom) )   2021.9  応用物理学会

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    Presentation type:Oral presentation (general)  

    The influence of underlying quantum dots (QDs) on InAs surface quantum dots (SQDs) on their photoluminescence (PL) properties were discussed. The insertion of underlying QDs resulted in enhancement of the PL intensity, and the wavelength was shown to be controlled by the spacer layer thickness.

  • Effect of the Number of Stacks on the 2D to 3D Transition of Stacked Submonolayer (SML) InAs Nanostructures International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    21st International Conference on MBE (ICMBE) 2021  ( Virtual (Puerto Vallarta, Mexico) )   2021.9 

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  • Control of the 2D to 3D Transition of Stacked Submonolayer (SML) InAs Nanostructures by As2 Flux International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    Compound Semiconductor Week 2021  ( Online Virtual (Stockholm, Sweden) )   2021.5 

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  • Control of Density of 3D Stacked Submonolayer (SML) InAs Nanostructures by As2 Flux International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    JSAP Spring Meeting 2021  ( Online Virtual )   2021.3  JSAP

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    Stacked submonolayer (SML) growth of InAs nanostructures by MBE has been gaining interest recently for various optoelectronic applications. In contrast to the well-known Stranski-Krastanov (SK) growth of InAs nanostructures, stacked SML growth involves the cycled deposition of SML-thick InAs and few ML-thick GaAs. We have recently reported evidence of the 2D to 3D transition in SML InAs nanostructures. This transition leads to the existence of two distinct kinds of stacked SML nanostructures: 2D islands and 3D structures. Compared to the analogous transition in SK growth, the properties of the stacked SML transition is not yet well investigated. Hence, this study aims to elucidate the controllability of the density of 3D structures by As2 flux. It will be demonstrated that a wide control of 3D structure density (10^8 ~ 10^10 cm^-2) is possible simply by adjusting the As2 flux in stacked SML growth.

  • Controlled activation of Mg dopant by laser irradiation for p-GaN formation International conference

    Ryuji Kamiya*, Takahito Ichinose*, ジャン ユーウェイ, Noriko Kurose National Center of Neurology and Psychiatry**, 神谷 格, Yoshinobu Aoyagi Ritsumeikan University**, 岩田 直高

    the 13th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2021)  ( Online )   2021.3 

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    ポスター 10P-14

  • InAs nanostructures on GaAs (Plenary) Invited International conference

    Itaru Kamiya

    38th Samahang Pisika ng Pilipines (SPP) Physics Conference  ( Online )   2020.10  Physics Society of the Philippines

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  • Correlation between Structure and Luminescence of InAs Submonolayer (SML) Nanostructures International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    International Conference on Solid State Devices and Materials (SSDM) 2020  ( Online Virtual )   2020.9  JSAP

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    The correlation between the structural and photo-luminescence (PL) properties of InAs submonolayer (SML) nanostructures at the 2D to 3D transition is in-vestigated. Significant changes in the topography of uncapped InAs nanostructures assembled by SML growth have been observed, indicating the transition from 2D to 3D growth regime. The influence of these structural changes to the luminescence properties of the nanostructure are investigated by PL measure-ments.

  • Controlled Growth and Properties of InAs Nanostructures Invited International conference

    Itaru Kamiya, Ronel Christian Intal ROCA

    International Conference on Solid State Devices and Materials  ( Online )   2020.9 

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  • AFM Study of the 2D to 3D Transition in InAs Submonolayer Structures International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    JSAP Autumn Meeting 2020  ( Online Virtual )   2020.9  JSAP

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    The submonolayer (SML) growth mode has been attracting attention as an alternative to the well-known Stranski-Krastanov (SK) growth mode as a method of assembling InAs nanostructures, e.g. quantum dots (QDs), on GaAs by MBE. While the 2D to 3D transition in SK-growth has been well investigated with a critical thickness of ~1.7 ML, different conditions are employed for SML-growth. Here, atomic force microscopy (AFM) is utilized to study the topographical changes at the 2D to 3D transition in InAs SML nanostructures.

  • A Study on Submonolayer InAs Quantum Well Islands for Upconversion Applications International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    JSAP Spring Meeting 2020  ( Sophia University )   2020.3  JSAP

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    Deemed

  • 電析条件によるCu/ZnS の光学特性および電気化学特性の制御 International conference

    松田直大 大阪府立大学**, 岡本尚樹 大阪府立大学**, 齊藤丈靖 大阪府立大学**, 神谷 格

    表面技術協会 第141回講演大会  ( 首都大学東京(見做し開催) )   2020.3  表面技術協会

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    Cu/ZnS 薄膜を電析で作製し、その光学特性と電気化学特性で評価を行っている。 電析条件による違いについて報告。

  • Novel InAs SK/SML/SK quantum dot structures and steps toward new broadband IR detectors International conference

    モハンマディ ハニフ **, Ronel Christian Intal ROCA, Itaru Kamiya

    JSAP Spring Meeting 2020  ( 上智大学(見做し開催) )   2020.3  応用物理学会

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    GaAs(001)上に、SML法とSK法でIn(Ga)As量子ドットを作製し、成長条件の適正化により、幅広い波長範囲を持った近赤外蛍光体の実現を目指している経過を報告。

  • Size Optimmization of InAs Quantum Well Islands for Photon Upconversion Applications International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    JSAP Autumn Meeting 2019  ( Hokkaido University )   2019.9  JSAP

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  • Pregrowth Treatment Induced below-bandgap states in GaAs International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    International Conference on Solid State Devices and Materials  ( Nagoya University, Nagoya, Japan )   2019.9  AIP

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    Below-bandgap states induced by pre-epitaxial growth treatments in GaAs have been investigated by photoluminescence (PL). Various electronic states giving rise to near-infrared (NIR) PL peaks are generated through processes such as annealing or buffer growth that are standard for epitaxial growth of InAlGaAs structures on (001) GaAs substrates. These states often overlap with those from InGaAs structures, not only complicating the interpretation by also altering the electronic properties of the devices. The present work provides guides for distinguishing the desired electronic states from the pregrowth treatment-induced defect states.

  • Below-bandgap photoluminescence from GaAs International conference

    Ronel Christian Intal ROCA, Itaru Kamiya

    Compound Semiconductor Week 2019  ( Kusagano International Forum, Nara, Japan )   2019.5  IEEE

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    Below-bandgap photoluminescence (PL) from GaAs has been investigated. We find that various electronic states giving rise to near-infrared (NIR) PL peaks can be generated through processes that are standard for epitaxial growth of InAlGaAs structures on (001) GaAs substrates. The PL signals from these states overlap with those from InAs quantum dots, wetting layers, and InGaAs structures, complicating the design of devices for telecommunications or intermediate band solar cells. The present result provides guides for distinguishing the desired electronic states from the thermal treatment-induced defect states.

  • Below-Bandgap Photoluminescence Emission from SI GaAs substrates subjected to pre-MBE-growth annealing International conference

    Ronel Christian Intal ROCA, 神谷 格

    2019年 第66回応用物理学会春季学術講演会 (JSAP Spring Meeting 2019)  ( 東京工業大学大岡山キャンパス )   2019.3  応用物理学会 (JSAP)

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    We report the observation of below-GaAs-bandgap photoluminescence (PL) emission from GaAs substrates subjected to thermal annealing during the standard pre-MBE-growth processes. Using below-bandgap excitation as well as backside PL measurements, defects deep within the substrates were probed. A broad PL emission peak at 1000 nm appear after pre-bake annealing at 300° and further defects at 905 and 1150 nm appear after oxide desorption annealing at 600°. These findings confirm the presence of optically-active defects in pre-MBE-growth annealed GaAs substrates.

  • InAsサブモノレイヤー構造における光アップコンバージョン過程 International conference

    水野皓登*, ユウ ウェイ チャン*, 神谷 格

    春季第66回応用物理学関係連合講演会  ( 東京工業大学 )   2019.3  応用物理学会

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    MBEサブモノレイヤー法で成長したInAs量子構造を介した光アップコンバージョンの機構の検討。

  • 変調中間層による歪制御積層InAs量子ドットの光学特性制御 International conference

    鈴木幹人*, 神谷 格

    春季第66回応用物理学関係連合講演会  ( 東京工業大学 )   2019.3  応用物理学会

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    MBE成長において、変調中間層の導入によるInAs量子ドットの発光特性の変化とその機構について。

  • ZnO/Zn1-xMgxOナノ粒子の作製 International conference

    後藤直輝*, 神谷 格

    春季第66回応用物理学関係連合講演会  ( 東京工業大学 )   2019.3  応用物理学会

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    ZnO/ZnMgO コアシェル粒子の合成法と形状制御についての検討。

  • Laser-induced local activation of Mg-doped GaN and AlGaN for high power vertical devices Invited International conference

    Noriko Kurose Ritsumeikan Univ.*, Naotaka Iwata, Itaru Kamiya

    SPIE Photonics West 2019  ( San Francisco, California, USA )   2019.2  SPIE

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  • Cross-Sectional Workfunction Measurements on Solar Cell Structures under Light-Controlled Conditions International conference

    Fumihiko Yamada, Tekefumi Kamioka**, Yoshio Ohshita, Itaru Kamiya

    35th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2018)  ( SQUARE, Brussels, Belgium )   2018.9  WIP

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  • A new laser induced local material engineering to convert from n-type to p-type nitride semiconductor to fabricate high power vertical AlGaN/GaN devices on Si substrate International conference

    Yoshinobu Aoyagi 立命館大学*, Noriko Kurose 立命館大学*, 松本滉太 電子デバイス*, 岩田 直高, 神谷 格

    22nd Advanced Materials 2018  ( 東京 )   2018.9 

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    レーザーを用いた GaN のドーピング活性化法を用いた縦型素子作製について

  • サブモノレイヤー InAs層を介した光アップコンバージョン International conference

    水野皓登*, ユウ ウェイ チャン*, 神谷 格

    第79回応用物理学会秋季学術講演会  ( 名古屋国際会議場 )   2018.9  応用物理学会

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    MBEサブモノレイヤー法で作製したInAs量子構造を介しての光アップコンバージョンの報告。

  • 変調中間層による歪制御積層 InAs 量子ドット形状の変化 International conference

    鈴木幹人*, 神谷 格

    第79回応用物理学会秋季学術講演会  ( 名古屋国際会議場 )   2018.9  応用物理学会

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    MBE成長によるInAs量子ドットの中間層変調による形状の変化をAFMを中心に検討した。

  • Near-surface InAs/GaAs interfaces studied by KFM/AFM, XRD, and PL Invited International conference

    Itaru Kamiya

    14th International Conference on Beam Injection Assessment of Microstructures (BIAMS 2018)  ( Koreana Hotel, Seoul, Korea )   2018.6 

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  • Band profiling of p-Si/ITO interface by Kelvin probe force microscopy under light controlled conditions International conference

    Fumihiko Yamada, Takefumi Kamioka**, Yoshio Ohshita, Itaru Kamiya

    World Conference on Photovoltaic Energy Conversion (WCPEC-7)   ( Hilton Waikoloa Village, Hawaii, USA )   2018.6  IEEE

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  • コアシェル型酸化亜鉛ナノ粒子の作製と評価 International conference

    後藤直輝*, 奥山竜太 **, 山田 郁彦, 神谷 格

    第65回応用物理学会春季学術講演会  ( 早稲田大学 )   2018.3  応用物理学会

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    ZnOをコアとしたコアシェルナノ粒子の作製の実験的検討。

  • InAs/GaAs サブモノレイヤー結晶成長の機構と制御 International conference

    水野皓登*, ユウエイ チャン, 神谷 格

    第65回応用物理学会春季学術講演会  ( 早稲田大学 )   2018.3  応用物理学会

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    InAs量子井戸島構造のサブモノレイヤー結晶成長の手法と制御に関する実験的検討。

  • MgドープGaNへのレーザー照射による局所活性化と結晶性のその場観測 International conference

    松本滉太*, 黒瀬範子 **, 山田 郁彦, 神谷 格, 青柳克信 **, 岩田 直高

    IEEE Metro Area Workshop in Nagoya  ( 中京大学 / Chukyo University )   2017.10  IEEE 名古屋支部 / IEEE Nagoya Section

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  • Development of an AFM/KFM System Capable of Cross-Sectional Workfunction Measuring of Solar Cell Structures under Light Illumination International conference

    山田 郁彦, 神岡 武文, 大下 祥雄, 神谷 格

    33rd European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2017)  ( RAI Convention & Exhibition Centre, Amsterdam, The Netherlands )   2017.9  WIP

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  • Near-surface band structures of semiconductor nanostructures investigated by Kelvin probe force microscopy (KFM) Invited International conference

    Itaru Kamiya

    6th International Workshop on Epitaxial Growth and Fundamental Properties of Semiconductor Nanostructures  ( Teatro di Como, Como )   2017.9  International Workshop on Epitaxial Growth and Fundamental Properties of Semiconductor Nanostructure

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  • Epitaxial Growth and Characterization of InAs-based Structures on GaAs Invited International conference

    Itaru Kamiya

    Waterloo Institute of Nanotechnology Seminar  ( University of Waterloo )   2017.9  Waterloo Institute of Nanotechnology

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  • MgドープGaNのレーザー誘起による活性化とその局所制御 International conference

    松本滉大*, 黒瀬範子 **, 下野貴史*, 岩田 直高, 山田 郁彦, 神谷 格, 青柳克信 **

    第78回秋季応用物理学会学術講演会  ( 福岡国際会議場・国際センター・福岡サンパレス )   2017.9  応用物理学会

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  • 光制御下における結晶p型Si/ITO界面の断面仕事関数測定 International conference

    山田 郁彦, 神岡 武文, 大下 祥雄, 神谷 格

    第78回応用物理学会秋季学術講演会  ( 福岡国会会議場 福岡県福岡市 )   2017.9  応用物理学会

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  • Photon upconversion in InAs QDs and QWIs modeled by 8-band k・p theory International conference

    ユウエイ チャン, 神谷 格

    第78回応用物理学会秋季学術講演会  ( 福岡国際会議場 )   2017.9  応用物理学会

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    InAs 量子ドット、量子島構造による光アップコンバージョンに関する理論考察。

  • Surfaces and Interfaces of Quantum Structures Prepared by Colloidal Synthesis and Epitaxial Growth Invited International conference

    神谷 格

    長春工科大学講演会  ( 長春工科大学 )   2017.7  長春工科大学

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  • Near-surface band alignment of InAs quantum dots on GaAs(001) studied by Kelvin probe force micrscopy (KFM) International conference

    小林知弘*, 山田 郁彦, 高林紘*, 下村憲一*, ユウエイ チャン, 水野皓登*, 神谷 格

    Compound Semiconductor Week  ( dbb forum Berlin )   2017.5  Compound Semiconductor Week

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    KFM を用いた InAs 量子ドットの電子状態解析。

  • Epitaxial growth of various InAs nanostructures by different growth methods International conference

    ユウエイ チャン, Itaru Kamiya

    Japan Society of Applied Physics Spring Meeting  ( 横浜 )   2017.3 

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  • 平坦なp-n接合断面における局所仕事関数測定 International conference

    山田 郁彦, 神岡 武文, 水野皓登*, 大下 祥雄, 神谷 格

    第64回応用物理学会春季学術講演会  ( パシフィコ横浜 )   2017.3  応用物理学会

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  • KFMを用いたInAs量子ドット表面近傍のバンド解析 International conference

    小林知弘*, 高林紘*, 下村憲一*, 神谷 格, ユウエイ チャン, 山田 郁彦

    2017年春季第64回応用物理学関係連合講演会  ( パシフィコ横浜 )   2017.3  応用物理学会

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    GaAs(001)上にMBE成長されたInAs量子ドットとその近傍の表面ポテンシャルへの歪の与える効果の解析。

  • Photon upconversion using InAs-based quantum structures and the control of intermediate states Invited International conference

    神谷 格, David M. Tex 京都大学化研*, ユウエイ チャン, 井原章之 京都大学化研*, 金光義彦 京都大学化研*

    SPIE Photonic West  ( Moscone Center, San Francisco, CA, USA )   2017.1  SPIE

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  • Nanoscopic Analysis of Semiconductor Heterointerfaces by Kelvin Probe Force Microscopy (KFM) International conference

    Itaru Kamiya, Fumihiko Yamada, Tomohiro Kobayashi 量子界面物性*, Ko Takabayashi 量子界面物性*, Kenichi Shimomura 量子界面物性*, ユウエイ チャン

    Pacific Rim Symposium on Surfaces, Coatings & Interfaces (PACSURF 2016)  ( Hapuna Beach Prince Hotel, Kohala Coast, HI, U.S.A. )   2016.12  American Vacuum Society

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    Kelvin probe force microscopy has been employed to study the interfaces of Si heterostructure solar cell structures. The depth profile near the electrode-Si interface has been investigated.

  • Development of an AFM/KFM System Capable of Local Workfunction Mapping of Solar Cells under Light Illumination International conference

    Fumihiko Yamada, Takefumi Kamioka, Kyotaro Nakamura Meiji Univ.*, Yoshio Ohshita, Itaru Kamiya

    The 26th International Photovoltaic Science and Engineering Conference (PVSEC-26)  ( Marina Bay Sands (Sands Expo and Convention Centre), Singapore )   2016.10  Solar Energy Research Institute of Singapore (SERIS)

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  • The influence of substrate orientation on strain relaxation mechanisms of InGaAs layer grown on vicinal GaAs substrates measured by in situ X-ray diffraction International conference

    Hidetoshi Suzuki 宮崎大学*, Takuo Sasaki 量子科学技術研究開発機構*, Masamitu Takahasi 量子科学技術研究開発機構*, Itaru Kamiya, 大下 祥雄, 小島 信晃, Atsuhiko Fukuyama 宮崎大学*, Tetsuo Ikari 宮崎大学*, 山口 真史

    26th International Photovoltaic Science and Engineering Conference and Exhibition (PVSEC-26)  ( Marina Bay Sands Expo and Convention Centre (MBS) )   2016.10 

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    InGaAs layers on vicinal GaAs substrates have been grown by MBE. The processes have been studied in situ using X-ray diffraction at SPring-8. The influence and the mechanisms of the influence of miscut is discussed.

  • Simulation of RHEED Intensity Transients during MBE Growth of InAs Quantum Dots on GaAs(001) International conference

    Kenichi Shimomura 量子界面物性*, Itaru Kamiya

    32nd North American Molecular Beam Epitaxy Conference (NAMBE 2016)  ( Gideon Putnam Hotel, Saratoga Springs, NY, U.S.A. )   2016.9  American Vacuum Society

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    The RHEED intensity transients during MBE growth of InAs quantum dots on GaAs(001) has been simulated. The results agree with our former observations, and hence provides insights into the possible mechanisms of dot formation processes.

  • Ring-like workfunction dip around In(Ga)As quantum dots International conference

    Tomohiro Kobayashi 量子界面物性*, Ko Takabayashi 量子界面物性*, Kenichi Shimomura 量子界面物性*, Itaru Kamiya, ユウエイ チャン, Fumihiko Yamada

    32nd North American Molecular Beam Epitaxy Conference (NAMBE 2016)  ( Gideon Putnam Hotel, Saratoga Springs, NY, U.S.A. )   2016.9  American Vacuum Society

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    The surface potential of In(Ga)As quantum dots grown on GaAs(001) has been studied by KFM. We observe potential dip at the peripheral of the dots forming a ring-like structure.

  • 太陽電池評価に適した光照射が可能なAFM/KFM装置の開発 International conference

    山田 郁彦, 神岡 武文, 大下 祥雄, 神谷 格

    第77回応用物理学会秋季学術講演会  ( 朱鷺メッセ:新潟コンベンションセンター )   2016.9  応用物理学会

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  • SiドープによるInAs量子ドットの仕事関数変化 International conference

    小林知弘*, 高林紘*, 下村憲一*, 神谷 格, ユウエイ チャン, 山田 郁彦

    2016年第77回応用物理学会秋季学術講演会  ( 朱鷺メッセ(新潟) )   2016.9  応用物理学会

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    GaAs(001)上にMBE成長されたInAs量子ドットとその周辺の表面ポテンシャルに関する、下地層のSiドープによる変化の解析。

  • Up-converted photoluminescence in InAs quantum dot based structures International conference

    ユウエイ チャン, Itaru Kamiya

    19th International Conference on Molecular Beam Epitaxy  ( France )   2016.9 

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  • Achieving long wavelength emission from self-assembled InAs quantum dots by MBE through strain control International conference

    Kenichi Shimomura 量子界面物性*, Hidetoshi Suzuki 宮崎大学*, Takuo Sasaki 量子科学技術研究開発機構*, Masamitu Takahasi 量子科学技術研究開発機構*, Itaru Kamiya, Yoshio Ohshita

    33rd International Conference on the Physics of Semiconductors (ICPS2016)  ( Beijing International Convention Center, Beijing, China )   2016.8 

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    Over 1.7 micron light emission from InAs quantum dots on GaAs(001) has been realized by the clever design of the device structure that controls the strain induced.

  • Realization of Conductive AlN Epitaxial Layer on Si Substrate using Spontaneously Formed Nano-Size Via-Holes for Vertical AlGaN High Power FET International conference

    Noriko Kurose 立命館大学*, Kota Ozeki 立命館大学*, Tsutomu Araki 立命館大学*, Itaru Kamiya, 岩田 直高, Yoshinobu Aoyagi 立命館大学*

    The 43rd International Symposium on Compound Semiconductors (ISCS)  ( Toyama Japan )   2016.6 

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    Conductive AlN layer grown on a Si substrate using MOCVD has been realized by the spontaneously formed nano-size via-holes. The layer has been applied for the preparation of vertical AlGaN FETs.

  • In situ XRD observation of strain in InAs quantum dots and InGaAs capping layers during MBE growth on GaAs(001) International conference

    Itaru Kamiya, Kenichi Shimomura*, Hidetoshi Suzuki 宮崎大学*, Takuo Sasaki 量子科学技術研究開発機構*, Masamitu Takahasi 量子科学技術研究開発機構*, Yoshio Ohshita

    The 9th International Conference on Quantum Dots (QD2016)  ( Ramada Plaza Jeju Hotel, Jeju, Korea )   2016.5 

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    In situ measurements on the growth of InAs quantum dots (QDs) and cap layers during molecular beam epitaxy (MBE) are performed using a combined MBE - X-ray diffraction (XRD) system at SPring-8. The evolution of strain induced both in the QDs and cap layers during capping is followed by XRD intensity transients. From the XRD intensities that arise from different lattice constants, we compare the evolution of the strain induced in the QDs and cap layers. Prominent differences are observed between those obtained during InGaAs and GaAs capping, and also when modulated cap structures are grown.

  • Up-converted photoluminescence in InAs QD-based structures with confined state International conference

    ユウエイ チャン, Itaru Kamiya

    jsap  ( Tokyo Institute of Technology, Japan )   2016.3 

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  • 太陽電池構造断面試料作製時のダメージが仕事関数測定に与える影響 International conference

    山田 郁彦, 神岡 武文, 大下 祥雄, 神谷 格

    第63回応用物理学関係連合講演会  ( 東京工業大学 )   2016.3  応用物理学会

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  • 表面In(Ga)As量子ドット仕事関数の歪依存性 International conference

    小林知弘*, 高林紘*, 下村憲一*, ユウエイ チャン, 山田 郁彦, 神谷 格

    jsap  ( Tokyo Institute of Technology, Japan )   2016.3 

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  • (Invited) Real time study of strain relaxation in lattice mismatched InGaAs/GaAs for future tandem III-V solar cells Invited International conference

    Yoshio Ohshita, Hidetoshi Suzuki*, Itaru Kamiya, Kazuma Ikeda , Takuo Sasaki*, Masamitu Takahasi*

    EMN Meeting on Photovoltaics 2016  ( Eaton Hotel, Hong Kong, China )   2016.1 

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  • Epitaxial Growth of InAs-based Quantum Structures on GaAs Invited International conference

    Itaru Kamiya

    Collaborative Conference on Crystal Growth (3CG 2015)  ( Eaton Hotel Kowloong, Hong Kong, China )   2015.12 

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  • nm-scale Workfunction Measurements of the Interface between Si and Surface Layers on a Crystalline Si Solar Cell using Kelvin Probe Force Microscopy Invited International conference

    山田 郁彦, 神岡 武文, Kyotaro Nakamura Meiji Univ.*, 大下 祥雄, 神谷 格

    Energy Materials and Nanotechnology on Vacuum Electronics  ( Las Vegas, NV USA )   2015.11 

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  • Strain Control of InAs Quantum Dots on GaAs(001) by Molecular Beam Epitaxy International conference

    下村憲一 量子界面物性*, 神谷 格

    31st North American Molecular Beam Epitaxy Conference (NAMBE 2015)  ( Iberostar Paraíso Beach Hotel, Riviera Maya, Mexíco )   2015.10  AVS

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    MBE成長されるInAs量子ドットに加わる歪の制御について。

  • 結晶Si太陽電池の断面仕事関数測定に適した観察研磨手法の検討 International conference

    山田 郁彦, 高林紘 量子界面物性*, 神岡 武文, 大下 祥雄, 神谷 格, 須田耕平 明治大学*, 中村京太郎 明治大学*, 小椋厚志 明治大学*

    第76回応用物理学会秋季学術講演会  ( 名古屋国際会議場 )   2015.9  応用物理学会

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  • 20. Growth of InAs-based Quantum Structures and their Electronic Properties Controlled by Strain Invited International conference

    Itaru Kamiya

    SemiconNano 2015  ( Lakeshore Hotel, Hsinchu, Taiwan )   2015.9 

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  • Carrier dynamics of  > 1.55 m PL from InAs quantum dots on GaAs(001) International conference

    下村憲一 量子界面物性*, 神谷 格

    Compound Semiconductor Week (CSW 2015)  ( UCSB, Santa Barbara, CA, USA )   2015.7 

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    長波長発光するInAs量子ドット素子におけるキャリアダイナミクスについて。

  • The reduction of Cu2+ and crystal growth processes during colloidal synthesis of Cu2ZnSnS4 nanoparticles International conference

    森下一喜 量子界面物性*, 須藤裕之 量子界面物性*, 神谷 格

    42nd IEEE Photovoltaics Specialists Conference  ( Hyatt Regency Hotel, New Orleans, LA, USA )   2015.6  IEEE

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    Cu2ZnSnS4 ナノ粒子の合成機構について。

  • GaAs(001)上のInAs量子ドットの1.55m以上での発光(2) International conference

    下村憲一 量子界面物性*, 神谷 格

    2015年春季第62回応用物理学関係連合講演会  ( 東海大学湘南キャンパス )   2015.3  応用物理学会

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  • Cu2ZnSnS4ナノ粒子の液相合成におけるCu2+還元過程 International conference

    森下一喜 量子界面物性*, 須藤裕之 量子界面物性*, 神谷 格

    2015年春季第62回応用物理学関係連合講演会  ( 東海大学湘南キャンパス )   2015.3  応用物理学会

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  • Siヘテロ接合(SHJ)太陽電池における ケルビンプローブ顕微鏡を用いた 仕事関数測定の定量性検討 International conference

    山田 郁彦, 高林紘*, 神岡 武文, 立花 福久, 中村京太郎*, 大下 祥雄, 神谷 格

    第62回応用物理学会春季学術講演会  ( 東海大学 )   2015.3  応用物理学会

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  • Tuning the emission wavelength from self-assmbled InAs quantum dots on GaAs(001) to over 1.55 m by controlling the cap and barrier layers International conference

    K. Shimomura 量子界面物性*, Itaru Kamiya

    42nd Conference on Physics and Chemistry of Surfaces and Interfaces  ( Snowbird Ski & Resort, Snowbird, UT, USA. )   2015.1  American Vacuum Society

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  • XRD transients during capping of different sized InAs quantum dots on GaAs(001) International conference

    K. Shimomura 量子界面物性*, H. Suzuki Miyazaki Univ*, T. Sasaki JAEA*, M. Takahasi JAEA*, Y. Ohshita 半導体*, Itaru Kamiya

    42nd Conference on Physics and Chemistry of Surfaces and Interfaces  ( Snowbird Ski & Resort, Snowbird, UT, USA. )   2015.1  American Vacuum Society

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  • In situ XRD observation during modulated InGaAs capping of InAs quantum dots on GaAs(001) by MBE International conference

    K. Shimomura 量子界面物性*, H. Suzuki Miyazaki Univ*, T. Sasaki JAEA*, M. Takahasi JAEA*, Y. Ohshita*, Itaru Kamiya

    2014 Fall Mat. Res. Soc. Symposium  ( Hynes Convention Center, Boston, MA, U.S.A. )   2014.12  MRS

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  • Strain relaxation process of lattice-mismatched InGaAs/offcut GaAs International conference

    D. Kodera*, T. Nishi*, Kazuma Ikeda , T. Sasaki, M. Takahasi*, H. Suzuki*, H. Nakamura*, Yoshio Ohshita, Nobuaki Kojima, Itaru Kamiya, 山口 真史

    Korea-Japan Top University League Workshop on Photovoltaics 2014(Top-PV2014)  ( Hotel Marix, Miyazaki, Japan )   2014.11  Uuiv. Miyazaki, TTI, Tokyo Tech, Korea Univ., KAIST

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  • Influence of trapping processes on photocurrent generation efficiencies in quantum-dot intermediate-band solar cells International conference

    D. M. Tex Kyoto Univ*, T. Ihara Kyoto Univ*, Itaru Kamiya, Y. Kanemitsu Kyoto Univ*

    The 6th World Conference on Photovoltaic Energy Conversion (WCPEC-6)  ( Kyoto International Conference Center, Japan )   2014.11  IEEE

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  • Local workfunction mapping of interface on heterojunction Si solar cell using KFM International conference

    山田 郁彦, 神岡 武文, 立花 福久, 中村京太郎*, 大下 祥雄, 神谷 格

    The 6th World Conference on Photovoltaic Energy Conversion  ( Kyoto )   2014.11 

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  • In Situ X-Ray Diffraction Study of Strain Relaxation Process of Lattice-Mismatched InGaAs/GaAs International conference

    D. Kodera*, T. Nishi*, Kazuma Ikeda , T. Sasaki, M. Takahasi*, H. Suzuki*, H. Nakamura*, Yoshio Ohshita, 小Nobuaki Kojima, Itaru Kamiya, 山口 真史

    The 6th World Conference on Photovoltaic Energy Conversion (WCPEC-6)  ( Kyoto International Conference Center, Kyoto, Japan )   2014.11  WCPEC-6 Organizing Committee

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  • 19. Understanding and Controlling Epitaxial Growth of Lattice Mismatched Materials Using InGaAs on GaAs Invited International conference

    Itaru Kamiya

    Collaborative Conference on Crystal Growth  ( Holiday Inn Resort, Phuket, Thailand )   2014.11 

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  • ケルビンプローブ顕微鏡を用いた Siヘテロ接合(SHJ)太陽電池における 表面構造界面の局所的仕事関数測定 International conference

    山田 郁彦, 神岡 武文, 立花 福久, 中村京太郎*, 大下 祥雄, 神谷 格

    第75回応用物理学会秋季学術講演会  ( 北海道大学 )   2014.9  応用物理学会

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  • GaAs 基板の傾斜方向が InGaAs 膜中緩和過程に与える影響 -X線回折その場観察- International conference

    小寺大介*, 佐々木拓生*, 高橋正光*, 鈴木秀俊*, 小島 信晃, 大下 祥雄, 神谷 格, 山口 真史

    2014年第75回応用物理学会秋季学術講演会  ( 北海道大学札幌キャンパス )   2014.9  公益社団法人 応用物理学会

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  • GaAs(001)上のInAs量子ドットの1.55m以上での発光 International conference

    下村憲一 量子界面物性*, 神谷 格

    2014年第75回応用物理学会秋季学術講演会  ( 北海道大学札幌キャンパス )   2014.9  応用物理学会

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  • Novel vertical AlGaN deep ultra violet photo-detector on n+Si substrate using spontaneous via holes growth technique International conference

    Kota Ozeki Ritsumeikan University*, Noriko Kurose Ritsumeikan University*, 岩田 直高, Kentaro Shibano Ritsumeikan University*, Tsutomu Araki Ritsumeikan University*, Itaru Kamiya, Yoshinobu Aoyagi Ritsumeikan University*

    The 2014 International Conference on Solid State Devices and Materials  ( Tsukuba International Congress Center )   2014.9  THE JAPAN SOCIETY OF APPLIED PHYSICS

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    Vertical AlGaN deep ultra violet (DUV) photo-detector has been successfully fabricated on n+Si substrate using spontaneous via holes growth technique. The spontaneous via holes make the insulating AlN buffer layer to be conductive, which is indispensable to grow AlGaN epitaxial layer, and makes possible the direct current flow from p electrode to n+Si substrate without any trench etching to form n-contact. This vertical device is easily enlarged to realize large area solar-blind photo-detector which is necessary for many applications for sensing contamination of water, biological material and so on under the sunshine.

  • フェムト秒励起光電流分光によるInAs量子構造の光キャリアアップコンバージョン過程と電子・正孔寿命の決定 International conference

    山田泰裕 京都大学*, David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    日本物理学会2014年秋季大会  ( 中部大学春日井キャンパス )   2014.9  日本物理学会

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  • In situ X-ray diffraction study of strain relaxation process of lattice-mismatched InGaAs/GaAs International conference

    Daisuke Kodera*, Toshiaki Nishi*, Kazuma Ikeda , Takuo Sasaki, Masamitu Takahasi*, Hidetoshi Suzuki*, Hiroya Nakamura*, Yoshio Ohshita, Nobuaki Kojima, Itaru Kamiya, Masafumi Yamaguchi

    The 15th International Union of Materials Research Societies (IUMRS)-International Conference in Asia (IUMRS-ICA 2014)  ( Fukuoka University, Japan )   2014.8  MRS-J in collaboration with The Japan Society of Applied Physics (JSAP) Kyushu Chapter

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  • In situ X-ray diffraction study of strain relaxation process of lattice-mismatched InGaAs/GaAs International conference

    Daisuke Kodera*, Toshiaki Nishi*, Kazuma Ikeda , Takuo Sasaki, Masamitu Takahasi*, Hidetoshi Suzuki*, Hiroya Nakamura*, Yoshio Ohshita, Nobuaki Kojima, Itaru Kamiya, Masafumi Yamaguchi

    The 15th International Union of Materials Research Societies (IUMRS)-International Conference in Asia (IUMRS-ICA 2014)  ( Fukuoka University, Japan )   2014.8  MRS-J in collaboration with The Japan Society of Applied Physics (JSAP) Kyushu Chapter

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  • nm-scaled workfunction mapping of the interfaces of silicon heterojunction (SHJ) solar cell using Kelvin probe force microscopy International conference

    山田 郁彦, 神岡 武文, 立花 福久, 中村京太郎*, 大下 祥雄, 神谷 格

    40th IEEE photovoltaic specialists conference  ( Denver,Colorado )   2014.7 

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  • Identification of trap states for two-step two-photon-absorption processes in InAs quantum structures for intermediate-band solar cells International conference

    David M. Tex Kyoto Univ*, Itaru Kamiya, Yoshihiko Kanemitsu Kyoto Univ*

    40th IEEE Photovoltaics Specialists Conference  ( Colorado Convention Center, Denver, CO, U.S.A. )   2014.6  IEEE

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  • In situ observation of strain relaxation during growth interruption in lattice-mismatched III-V heteroepitaxy International conference

    Yoshio Ohshita, T. Nishi*, D. Kodera*, Kazuma Ikeda , K. Shimomura*, H. Suzuki*, T. Sasaki*, Itaru Kamiya, M. Takahasi*

    E-MRS 2014 SPRING MEETING  ( Congress Center, Lille, France )   2014.5  European Materials Research Society

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  • In situ XRD observation during various capping of InAs quantum dots by MBE International conference

    K. Shimomura 量子界面物性*, H. Suzuki Miyazaki Univ*, T. Sasaki JAEA*, M. Takahasi JAEA*, Y. Ohshita 半導体*, Itaru Kamiya

    8th International Conference on Quantum Dots  ( Palazzo dei Congressi, Pisa, Italy )   2014.5 

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  • Two-beam photocurrent mapping to determine the limiting factor of the two-step two-photon-absorption processes in InAs quantum dots International conference

    David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2014年春季第61回応用物理学関係連合講演会  ( 青山学院大学相模原キャンパス )   2014.3  応用物理学会

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  • InAs/AlGaAs量子構造からなる中間バンド型太陽電池の顕微光電流イメージング International conference

    井原章之 京都大学*, David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2014年春季第61回応用物理学関係連合講演会  ( 青山学院大学相模原キャンパス )   2014.3  応用物理学会

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  • InAs量子構造を利用した中間バンド型太陽電池におけるフェムト秒時間分解光伝導測定 International conference

    山田泰裕 京都大学*, David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2014年春季第61回応用物理学関係連合講演会  ( 青山学院大学相模原キャンパス )   2014.3  応用物理学会

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  • InAs量子ドット上の変調キャップ層成長中のXRDによるその場観察 International conference

    下村憲一*, 鈴木秀俊*, 佐々木拓生*, 高橋正光*, 大下 祥雄, 神谷 格

    第61回応用物理学会春季学術講演会(2014春季)  ( 青山学院大学相模原キャンパス )   2014.3  公益社団法人 応用物理学会

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  • 次世代太陽電池への新たな量子構造の提案 – 量子井戸島 – Invited International conference

    神谷 格

    宮崎大学平成25年度IR推進機構・第35回太陽光発電プロジェクト合同講演会  ( 宮崎大学 )   2014.3  宮崎大学IR推進機構・太陽光発電プロジェクト

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  • Femtosecond photocurrent dynamics in InAs quantum structures for intermediate-band solar cells International conference

    山田泰裕 京都大学*, David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2013 Fall Materials Research Society Symposium  ( Boston )   2013.12  Materials Research Society

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  • Spectroscopic Imaging of Efficient Photocurrent Generation Sites in InAs Intermediate Band Quantum Structures: Improved Design of Upconversion Layers Containing Nanodisks and Quantum Dots International conference

    David M. Tex 京都大学*, 井原章之 京都大学*, 神谷 格, 金光義彦 京都大学*

    2013 Fall Materials Research Society Symposium  ( Boston )   2013.12  Materials Research Society

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  • nm-scaled workfunction mapping of interface between crystalline Si and metal paste electrode using KFM International conference

    Fumihiko Yamada, Manabu Yoshida AIST*, Hideo Tokuhisa AIST*, Mari Aoki*, Uichi Itoh AIST*, Isao Sumita*, Shigenobu Sekine Napra Co., Ltd,*, Itaru Kamiya, Yoshio Ohshita

    7th International Workshop on Crystalline Silicon Solar Cells  ( 福岡 九州大学 )   2013.10 

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  • In situ X-ray diffraction study on capping of InAs quantum dots on GaAs(001) International conference

    下村憲一 量子界面物性*, 鈴木秀俊 宮崎大学*, 佐々木拓生 日本原子力研究開発機構*, 高橋正光 日本原子力研究開発機構*, 大下祥雄 半導体研究室*, 神谷 格

    30th North American Molecular Beam Epitaxy Conference  ( Banff )   2013.10  American Vacuum Society

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  • Workfunction mapping of interface between crystalline Si and metal paste electrode using KFM International conference

    Fumihiko Yamada, Manabu Yoshida AIST*, Mari Aoki*, Hideo Tokuhisa ASIT*, Uichi Itoh AIST*, Isao Sumita*, Shigenobu Sekine Napra Co., Ltd,*, Itaru Kamiya, Yoshio Ohshita

    EU PVSEC 2014 29th European PV Solar Energy Conference and Exhibition  ( Paris )   2013.10 

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  • フェムト秒励起光伝導相関法によるInAs量子構造の光キャリアダイナミクス International conference

    山田泰裕 京都大学*, David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    日本物理学会2013年秋季大会  ( 徳島大学常三島キャンパス )   2013.9  日本物理学会

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  • Synthesis of CuInS2 nanocrystals and their luminescence International conference

    小舘北斗 量子界面物性*, 須藤裕之 量子界面物性*, 神谷 格

    2013 Japan Society of Applied Physics – Materials Research Society Joint Symposia  ( 同志社大学京田辺キャンパス )   2013.9  Materials Research Society, 応用物理学会

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  • KFMを用いたSi-電極界面のナノスケールにおける仕事関数測定 International conference

    山田 郁彦, 吉田学 産総研*, 青木真理 半導体*, 伊東宇一 産総研*, 住田勲勇 半導体*, 関根重信 (有)ナプラ*, 神谷 格, 大下 祥雄

    第74回応用物理学会秋季学術講演会  ( 京都 同志社大学 )   2013.9  公益社団法人 応用物理学会

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  • XRDによるInAs量子ドット上のキャップ層成長のその場観察 International conference

    下村憲一 量子界面物性*, 鈴木秀俊 宮崎大学*, 佐々木拓生 日本原子力研究開発機構*, 高橋正光 日本原子力研究開発機構*, 大下祥雄 半導体研*, 神谷 格

    2013年第74回応用物理学会秋季学術講演会  ( 同志社大学京田辺キャンパス )   2013.9  応用物理学会

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  • Temperature dependence of highly efficient photocurrent generation in shallow InAs quantum structures International conference

    David M. Tex 京都大学*, 井原章之 京都大学*, 神谷 格, 金光義彦 京都大学*

    2013 Japan Society of Applied Physics – Materials Research Society Joint Symposia  ( 同志社大学京田辺キャンパス )   2013.9  Materials Research Society, 応用物理学会

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  • Controlling shapes of InAs two-dimensional structures on AlGaAs International conference

    高林絋 量子界面物性*, David M. Tex 京都大学*, 下村憲一 量子界面物性*, 山田郁彦 量子界面物性*, 神谷 格

    2013 Japan Society of Applied Physics – Materials Research Society Joint Symposia  ( 同志社大学京田辺キャンパス )   2013.9  Materials Research Society, 応用物理学会

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  • InAs Quantum Well Islands – a Novel Structure For Photon Up-conversion From the Near IR To the Visible International conference

    神谷 格, David M.Tex*, 下村憲一*, 山田 郁彦, 高林鉱*, 金光義彦*

    39th IEEE Photovoltaics Specialists Conference  ( Tampa )   2013.6  IEEE

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  • Design concept for efficient intermediate band solar cells based on multicarrier Auger processes International conference

    David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    European Materials Research Society 2013 Spring Meeting  ( Strasbourg )   2013.5  European Materials Research Society

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  • The Thickness of InGaAs Capping Layer Dependence on the PL Emission Wavelength of InAs Quantum Dots International conference

    下村憲一 量子界面物性*, 神谷 格

    The 40th International Symposium on Compound Semiconductors  ( 神戸 )   2013.5 

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  • Workfunction mapping of Si-metal paste interface on an atomic scale using KFM International conference

    Fumihiko Yamada, Manabu Yoshida AIST*, Mari Aoki*, Hideo Tokuhisa AIST*, Uichi Itoh AIST*, Isao Sumita*, Shigenobu Sekine Napra Co., Ltd,*, Itaru Kamiya, Yoshio Ohshita

    4th Workshop on Metallization for Crystalline Silicon Solar Cells  ( Constance, Germany )   2013.5 

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  • AFMを用いたSi-金属ペースト電極(銀及び銅)界面のポテンシャル測定 International conference

    山田 郁彦, 吉田 学*, 青木真理*, 伊東宇一*, 住田 勲勇, 神谷 格, 大下 祥雄

    第60回応用物理学会春季学術講演会(2013春季)  ( 神奈川工科大学 )   2013.3  公益社団法人 応用物理学会

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  • InGaAsキャップ層の膜厚制御によInAs量子ドット発光波長の変化 International conference

    下村憲一 量子界面物性*, 神谷 格

    2013年春季第60回応用物理学関係連合講演会  ( 神奈川工科大学 )   2013.3  応用物理学会

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  • Relative strength of upconversion through Auger, thermal and two-step two-photon absorption processes in InAs quantum structures International conference

    David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2013年春季第60回応用物理学関係連合講演会  ( 神奈川工科大学 )   2013.3  応用物理学会

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  • Efficient Upconversion in InAs/AlGaAs Quantum Well Islands for Intermediate State Solar Cells Invited International conference

    David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    4th International Workshop on Quantum Nanostructure Solar Cells  ( 神戸大学 )   2012.12  神戸大学

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  • Quantum Dots and Quantum Well Islands for Energy Conversion Invited International conference

    神谷 格

    2012 Energy Materials Nanotechnology  ( Las Vegas )   2012.11 

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  • Evolution of lattice tilting in MBE-grown InGaAs layers on GaAs(001) substrates International conference

    Takuo Sasaki, Kazuma Ikeda , H. Suzuki*, M. Takahasi*, M. Inagaki*, K. Shimomura*, W. Hu, M. Kozu*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    The 17th International Conference on Molecular Beam Epitaxy (MBE2012)  ( Nara Prefectural New Public Hall, Nara, Japan )   2012.9  The Japan Society of Applied Physics

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  • キャップ層による歪制御における量子ドットサイズの依存性 International conference

    下村憲一 量子界面物性*, David M. Tex 京都大学*, 神谷 格

    2012年秋季第73回応用物理学会学術講演会  ( 愛媛大学 )   2012.9  応用物理学会

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  • Upconverted photocurrent for efficient intermediate state solar cells through Auger processes in InAs quantum structures International conference

    David M. Tex 京都大学*, 神谷 格, 金光義彦 京都大学*

    2012年秋季第73回応用物理学会学術講演会  ( 愛媛大学 )   2012.9  応用物理学会

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  • Photon upconversion through spatial overlap of excitons in InAs quantum well islands International conference

    David M. Tex 量子界面物性*, 神谷 格

    2012年春季第59回応用物理学関係連合講演会  ( 早稲田大学 )   2012.3  応用物理学会

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  • EFMを用いた半導体表面上酸化物ナノ構造の厚み分布測定の検討 International conference

    山田 郁彦, 神谷 格

    2012年春季第59回応用物理学関係連合講演会  ( 早稲田大学 )   2012.3  日本応用物理学会

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  • GaAs上 InAs量子ドット形成におけるRHEED強度変化のAs流量依存性 International conference

    下村憲一 量子界面物性*, 白坂健生 量子界面物性*, David M. Tex 量子界面物性*, 神谷 格

    2012年春季第59回応用物理学関係連合講演会  ( 早稲田大学 )   2012.3  応用物理学会

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  • Thickness measurement of oxide nanostructures buried in a semiconductor surface International conference

    Fumihiko Yamada, Itaru Kamiya

    19th International Colloquium on Scanning Probe Microscopy  ( 北海道 )   2011.12  日本応用物理学会 薄膜・表面物理分科会

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  • 遷移金属をドープしたチタン酸ストロンチウムの光励起過程 International conference

    山方 啓, 大川真弘*, 犬飼 学, 神谷 格

    表面界面スペクトロスコピー2012  ( マホロバ・ツインズ三浦 )   2011.12 

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  • Kinetics of strain relaxation in lattice-mismatched III-V heteroepitaxy International conference

    Takuo Sasaki, Kenichi Shimomura*, Hidetoshi Suzuki*, Masamitu Takahasi*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    2011 International Conference on Solid State Devices and Materials (SSDM 2011)  ( Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan )   2011.9  The Japan Society of Applied Physics

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  • 遷移金属をドープしたSrTiO3のキャリアダイナミクス International conference

    山方 啓, 大川真弘 量子界面物性*, 神谷 格

    第108回触媒討論会  ( 北見工業大学 )   2011.9 

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  • SrTiO3の構造とキャリアダイナミクス International conference

    大川真弘 量子界面物性*, 山方 啓, 神谷 格

    第108回触媒討論会  ( 北見工業大学 )   2011.9 

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  • InAs量子構造による赤外から可視光へのアップコンバーションのInAs膜厚依存性 (Thickness dependence of InAs quantum structures for upconversion of infrared to the visible regime) International conference

    David M. Tex 量子界面物性*, 神谷 格

    2011年秋季第72回応用物理学会学術講演会  ( 山形大学 )   2011.9  応用物理学会

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  • GaAs表面上に生成した酸化物ナノ構造のEFMを用いた厚み分析手法の検討 International conference

    山田 郁彦, 神谷 格

    2011年秋季第72回応用物理学会学術講演会  ( 山形大学 )   2011.8  日本応用物理学会

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  • InAs量子ドット形成におけるRHEEDパターンの観察 International conference

    下村憲一 量子界面物性*, 白坂健生 量子界面物性*, David M. Tex 量子界面物性*, 神谷 格

    2011年秋季第72回応用物理学会学術講演会  ( 山形大学 )   2011.8  応用物理学会

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  • RHEED Transient During InAs Quantum Dot Growth by MBE International conference

    Kenichi Shimomura*, Takeo Shirasaka*, David M. Tex*, Fumihiko Yamada, Itaru Kamiya

    The 28th North American Molecular Beam Epitaxy Conference  ( UCSD, La Jolla, CA, USA )   2011.8 

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  • Shallow Defect States in GaAs Responsible for GaAs Bandgap Upconversion Induced by Electron Diffraction Beam During MBE Growth International conference

    David M. Tex 量子界面物性*, Itaru Kamiya

    The 28th North American Molecular Beam Epitaxy Conference  ( University of California San Diego )   2011.8  American Vacuum Society

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  • AFMを用いたGaAs表面上酸化物ナノ粒子の厚み分布解析 International conference

    山田 郁彦, 神谷 格

    2011年春季 第58回 応用物理学関係連合講演会  ( 神奈川県厚木市 )   2011.3  日本応用物理学会

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  • InAs量子ドット形成におけるRHEED強度変化の観察 International conference

    下村憲一*, 白坂健生*, David M. Tex*, 神谷 格

    2011年春季第58回応用物理学関係連合講演会  ( 神奈川工科大学 )   2011.3  応用物理学会

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  • Droplet epitaxyによるInナノ電極の形成とその導電性 International conference

    賀数広海*, 神谷 格

    2011年春季第58回応用物理学関係連合講演会  ( 神奈川工科大学 )   2011.3  応用物理学会

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  • 水溶液法によるPbSナノ粒子の合成 International conference

    荒川 修一, 松尾菜実子 量子界面物性*, 呂 威, 神谷 格

    日本セラミックス協会2011年年会  ( 浜松市中区・静岡大学 )   2011.3  日本セラミックス協会

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  • The thickness measurement of buried surface structures in GaAs surface International conference

    Fumihiko Yamada, Itaru Kamiya

    38th Conference on the Physics and Chemistry of Surfaces and Interfaces  ( San Diego, CA, USA )   2011.1  American Vacuum Society

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  • Influence of As4 flux on the formation mechanisms of InAs quantum dots on GaAs(001) during MBE growth International conference

    Takeo Shirasaka*, Kenichi Shimomura*, David M. Tex*, Itaru Kamiya

    38th Conference on Physics and Chemistry of Surfaces and Interfaces  ( San Diego, CA, USA )   2011.1  American Vacuum Society

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  • Analysis of InAs quantum dot growth by RHEED International conference

    Kenichi Shimomura*, Takeo Shirasaka*, David M. Tex*, Itaru Kamiya

    38th Conference on Physics and Chemistry of Surfaces and Interfaces  ( San Diego, CA, USA )   2011.1  American Vacuum Society

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  • Luminescence of self-assembled PbS quantum dots on GaAs and quartz substrates International conference

    Wei Lu*, Itaru Kamiya

    Asian Conference on Nanoscience and Nanotechnology (AsiaNANO 2010)  ( 未来館、東京 )   2010.11 

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  • The Size Measurement of Nanoparticles buried in GaAs Surface International conference

    Fumihiko Yamada, Itaru Kamiya

    AsiaNANO2010  ( 東京都 お台場 )   2010.11 

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  • Kinetics of strain relaxation in lattice-mismatched InxGa1-xAs/GaAs heteroepitaxy International conference

    Takuo Sasaki, Hidetoshi Suzuki*, Masamitsu Takahashi*, Seiji Fujikawa*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    2010 International Conference on Solid State Devices and Materials(SSDM2010)  ( University of Tokyo (Japan) )   2010.9  The Japan Society of Applied Physics

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  • GaAs(001)上InAs量子ドット核形成に対するMBE成長時のAs4流量の影響 International conference

    白坂健生*, 下村憲一*, 神谷 格

    2010年秋季第71回応用物理学会学術講演会  ( 長崎大学 )   2010.9  応用物理学会

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  • 石英やGaAs基板上に作製したPbS量子ドット薄膜の蛍光計測 International conference

    呂 威, 山田 郁彦, 神谷 格

    2010年秋季第71回応用物理学会学術講演会  ( 長崎大学 )   2010.9  応用物理学会

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  • キャップ層のドナー濃度によるIII-V半導体表面フェルミレベルピニングの制御 International conference

    賀数広海*, 山田 郁彦, David Tex*, 田中 一郎*, 神谷 格

    2010年秋季第71回応用物理学会学術講演会  ( 長崎大学 )   2010.9  応用物理学会

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  • 湿潤プロセスで生成したGaAs表面上酸化ガリウム粒子のキャパシタンス測定 International conference

    山田 郁彦, 神谷 格

    2010年第71回 応用物理学会学術講演会  ( 長崎県長崎市 )   2010.9  日本応用物理学会

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  • Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy International conference

    Takuo Sasaki, Hidetoshi Suzuki*, Akihisa Sai*, Masamitu Takahasi*, Seiji Fujikawa*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    16th International Conference on Molecular Beam Epitaxy (MBE2010)  ( bcc Berlin Congress Center (Germany) )   2010.8 

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  • Influence of Reflection High-Energy Electron Diffraction Beam on Anti-Stokes Photoluminescence International conference

    David M. Tex*, Itaru Kamiya

    16th International Conference on Molecular Beam Epitaxy  ( Berlin Congress Centre, Germany )   2010.8 

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  • Influence of In and As fluxes on growth of self-assembled InAs quantum dots on GaAs(001) International conference

    Itaru Kamiya, Takeo Shirasaka*, Kenichi Shimomura*, David M. Tex*

    16th International Conference on Molecular Beam Epitaxy  ( Berlin Congress Centre, Germany )   2010.8 

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  • Indium composition effect on strain relaxation process in (001) InGaAs/Ga International conference

    Akihisa Sai*, Takuo Sasaki, Hidetoshi Suzuki*, Itaru Kamiya, Yoshio Ohshita, Masafumi Yamaguchi

    Korea-Japan Top University League Workshop on Photovoltaics 2010 (Top-PV2010)  ( KAIST (Daejeon, Korea) )   2010.8  Department of Electrical Engineering KAIST, Center for Inorganic Photovoltaic Materials KAIST, TIT, PVREC TIT, Semiconductor Lab. TTI

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  • 埋もれた・埋もれていない半導体界面の構造と電子物性 Invited International conference

    神谷 格

    埋もれた界面のX線・中性子解析に関するワークショップ2010  ( 名古屋大学 )   2010.7  埋もれた界面のX線・中性子解析に関するワークショップ2010

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  • 埋もれた・埋もれていない半導体界面の構造と電子物性 International conference

    神谷 格

    埋もれた界面のX線・中性子解析に関するワークショップ2010  ( 名古屋大学 )   2010.7  埋もれた界面のX線・中性子解析に関するワークショップ

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  • InGaAsN/GaAsにおける歪緩和過程のIn組成依存性 International conference

    崔炳久*, 佐々 木拓生, 鈴木秀俊*, 神谷 格, 大下 祥雄, 山口 真史

    第7回次世代の太陽光発電システムシンポジウム  ( 北九州国際会議場 )   2010.7  日本学術振興会 産学協力研究委員会 第175委員会

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  • Self-assembled colloidal PbS quantum dots on GaAs substrates International conference

    Wei Lu*, Itaru Kamiya

    6th International Conference on Quantum Dots (QD2010)  ( Nottingham, U.K. )   2010.4 

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  • Life time measurement on upconversion from GaAs band gap International conference

    David M. Tex*, 神谷 格

    2011年春季第58回応用物理学関係連合講演会  ( 神奈川工科大学 )   2010.3  応用物理学会

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Awards

  • 2017年春季学術講演会 Poster Award

    2017.3   応用物理学会  

    山田 郁彦, 神岡 武文, 水野皓登 量子界面物性*, 大下 祥雄, 神谷 格

  • Young Scientist Presentation Award

    2009.10   Japan Society of Applied Physics   Observation of asymmetric strain relaxation in InGaAs/GaAs by in situ XRD 3D reciprocal lattice map

    SASAKI Takuo, SUZUKI Hidetoshi, SAI Akihisa, TAKAHASI Masamitu, FUJIKAWA Seiji, ARAFUNE Kohji, KAMIYA Itaru, OHSHITA Yoshio, YAMAGUCHI Masafumi

  • Best Poster Award

    2008.5   The IEEE (Institute of Electrical and Electronics Engineers)   33rd IEEE Photovoltaic Specialist Conferenceで発表された論文(ポスター)"Annealing Effects on Lattice Defects in Lattice Mismatched InGaAs on GaAs"が優秀だったため。

    Takuo Sasaki, Koji Arafune*, Akihisa Sai*, Yoshio Ohshita, Itaru Kamiya, Masafumi Yamaguchi

  • Young Scientist Presentation Award

    1997.10   Japan Society of Applied Physics   Tunneling Spectroscopy of InAs capped GaAs under laser irradiation

    TAKAHASHI Takuji, KAMIYA Itaru, SAKAKI Hiroyuki

Grant-in-Aid for Scientific Research

Other research activities

  • 半導体素子及びその製造方法

    2024.1

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  • 半導体素子及びその製造方法

    2023.1

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Subject in charge(Off-campus)

  • 「Modern Japan(英語科目)」

    2017 Institution:東京工業大学

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    Country:Japan

    分担講義

  • 「総合科目」

    2017 Institution:愛知大学

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    Country:Japan

    分担講義

  • 「技術と環境」

    2017 Institution:南山大学

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    Country:Japan

    分担講義

Social Activities

  • バスケットボール指導員

    天白区  2014.4 - 2020.3

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    Type:Other