Updated on 2026/04/13

写真a

 
Subhash Chand YADAV
 
Organization
Graduate School of Engineering Department of Advanced Science and Technology Electronics and Information Engineering Semiconductor Laboratory Post Doctoral Fellow   
Degree
PhD ( 2023.7   Indian Institute of Technology (IIT) Indore, India )
Contact information
メールアドレス

Main research papers

Research History

  • Toyota Technological Institute   Semiconductor Lab.   Post-doctoral research fellow

    2023.1

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    Country:Japan

  • Nagaur Mahavidyalaya, Nagaur (MDS University Ajmer)   Department of Physics   Assistant professor

    2017.3 - 2018.3

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    Country:India

Education

  • Indian Institute of Technology (IIT) Indore, India   Materials Science Engineering

    2018.12 - 2023.7

Research theme

  • High efficiency crystalline Silicon solar cells

    大下 祥雄, YADAV Subhash Chand

    1994

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     太陽電池の更なる普及を進めるためには、現在の結晶Si太陽電池の更なる高品質化が極めて重要であり、そのための新しい基盤技術の開発を行っている。また、従来のpn接合を用いない新規高効率太陽電池であるキャリア選択型太陽電池に関して、デバイス構造、シリコン結晶、電極材料、パッシベーション材料に関する研究を進めている。

    Outcome:

    2023
    キャリア選択型太陽電池の高効率化を目的に、半導体と絶縁膜界面および界面近傍の半導体中に存在する結晶欠陥の濃度・捕獲断面積・エネルギー準位に加え再結合特性を定量的に得られる新たな欠陥特性評価方法を確立した。一方、本太陽電池とペロブスカイト太陽電池とを積層した次世代高効率太陽電池に関して、ボトムセルに適した太陽電池構造の研究を進めてきた。

    2022
    多結晶Si中の粒界特性と熱処理前後の金属不純物分布・電気特性の関係をEBIC測定結果をもとに検討し、粒界構造とそこでの少数キャリアの再結合速度、さらにはそれらに与える熱処理温度の関係が明らかになってきている。
    キャリア選択型太陽電池におけるプロセス誘起欠陥の評価解析を進めている。

Papers

  • Influence of carbon atoms in single crystal Si on electron trap generation due to UV light irradiation during RPD process Reviewed

    Subhash Chand Yadav, Keita Kimura, Tomohiko Hara, Yoshio Ohshita

    AIP Advances   16   035021   2026.3

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    Publishing type:Research paper (scientific journal)  

    DOI: https://doi.org/10.1063/5.0319604

Presentations

  • Identifying Thermally Activated Defects Behind Carrier Lifetime Loss in FZ-Silicon via DLTS International conference

    Subhash Chand Yadav, Kohaku Abe, Tomohiko Hara, Hyunju Lee, Yoshio Ohshita

    36th International Photovoltaic Science and Engineering Conference (PVSEC-36)  ( Chulalongkorn University, Bangkok, Thailand )   2025.11 

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    Event date: 2025.11

    Presentation type:Poster presentation  

  • Deep Level Transient Spectroscopy: Probing PECVD-Induced Defects in Silicon Solar Cells International conference

    Subhash Chand Yadav, Tomohiko Hara, Hyunju Lee and Yoshio Ohshita

    PVinMotion 2025  ( ANA Holiday Inn Resort MIYAZAKI, Japan )   2025.3 

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    Event date: 2025.3

    Presentation type:Poster presentation  

  • Investigating the Impact of UV Light During PECVD on Defect Formation and Electrical Performance in Silicon Solar Cells Using C-V Analysis International conference

    Subhash Chand Yadav, Hyunju Lee*, Tomohiko Hara*, Yoshio Ohshita

    35th International Photovoltaic Science and Engineering Conference (PVSEC-35)  ( Plaza Verde, Numazu, Shizuoka, Japan )   2024.11 

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    Event date: 2024.11

    Presentation type:Poster presentation  

  • Three Dimensional DLTS Analysis on Defects in Si Crystal Induced by a-Si Deposition International conference

    Yoshio Ohshita, Subhash Chand Yadav, Tomohiko Hara*

    41st European Photovoltaic Solar Energy Conference (EUPVSEC2024)  ( Austria Center Vienna, Vienna, Austria )   2024.9 

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    Event date: 2024.9

    Presentation type:Poster presentation  

  • Investigating PECVD-Induced Defects in Silicon Bulk Using Deep Level Transient Spectroscopy International conference

    Subhash Chand Yadav, Tomohiko Hara*, Hyunju Lee*, Yoshio Ohshita

    31st Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes  ( Beaver Run Resort, Breckenridge, Colorado, USA )   2024.7 

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    Event date: 2024.7

    Presentation type:Poster presentation